2,312 research outputs found
Calculation of Generalized Polynomial-Chaos Basis Functions and Gauss Quadrature Rules in Hierarchical Uncertainty Quantification
Stochastic spectral methods are efficient techniques for uncertainty
quantification. Recently they have shown excellent performance in the
statistical analysis of integrated circuits. In stochastic spectral methods,
one needs to determine a set of orthonormal polynomials and a proper numerical
quadrature rule. The former are used as the basis functions in a generalized
polynomial chaos expansion. The latter is used to compute the integrals
involved in stochastic spectral methods. Obtaining such information requires
knowing the density function of the random input {\it a-priori}. However,
individual system components are often described by surrogate models rather
than density functions. In order to apply stochastic spectral methods in
hierarchical uncertainty quantification, we first propose to construct
physically consistent closed-form density functions by two monotone
interpolation schemes. Then, by exploiting the special forms of the obtained
density functions, we determine the generalized polynomial-chaos basis
functions and the Gauss quadrature rules that are required by a stochastic
spectral simulator. The effectiveness of our proposed algorithm is verified by
both synthetic and practical circuit examples.Comment: Published by IEEE Trans CAD in May 201
Model order reduction of fully parameterized systems by recursive least square optimization
This paper presents an approach for the model order reduction of fully parameterized linear dynamic systems. In a fully parameterized system, not only the state matrices, but also can the input/output matrices be parameterized. The algorithm presented in this paper is based on neither conventional moment-matching nor balanced-truncation ideas. Instead, it uses âoptimal (block) vectorsâ to construct the projection matrix, such that the system errors in the whole parameter space are minimized. This minimization problem is formulated as a recursive least square (RLS) optimization and then solved at a low cost. Our algorithm is tested by a set of multi-port multi-parameter cases with both intermediate and large parameter variations. The numerical results show that high accuracy is guaranteed, and that very compact models can be obtained for multi-parameter models due to the fact that the ROM size is independent of the number of parameters in our approach
Stochastic Testing Simulator for Integrated Circuits and MEMS: Hierarchical and Sparse Techniques
Process variations are a major concern in today's chip design since they can
significantly degrade chip performance. To predict such degradation, existing
circuit and MEMS simulators rely on Monte Carlo algorithms, which are typically
too slow. Therefore, novel fast stochastic simulators are highly desired. This
paper first reviews our recently developed stochastic testing simulator that
can achieve speedup factors of hundreds to thousands over Monte Carlo. Then, we
develop a fast hierarchical stochastic spectral simulator to simulate a complex
circuit or system consisting of several blocks. We further present a fast
simulation approach based on anchored ANOVA (analysis of variance) for some
design problems with many process variations. This approach can reduce the
simulation cost and can identify which variation sources have strong impacts on
the circuit's performance. The simulation results of some circuit and MEMS
examples are reported to show the effectiveness of our simulatorComment: Accepted to IEEE Custom Integrated Circuits Conference in June 2014.
arXiv admin note: text overlap with arXiv:1407.302
Uncertainty quantification for integrated circuits: Stochastic spectral methods
Due to significant manufacturing process variations, the performance of integrated circuits (ICs) has become increasingly uncertain. Such uncertainties must be carefully quantified with efficient stochastic circuit simulators. This paper discusses the recent advances of stochastic spectral circuit simulators based on generalized polynomial chaos (gPC). Such techniques can handle both Gaussian and non-Gaussian random parameters, showing remarkable speedup over Monte Carlo for circuits with a small or medium number of parameters. We focus on the recently
developed stochastic testing and the application of conventional
stochastic Galerkin and stochastic collocation schemes to nonlinear
circuit problems. The uncertainty quantification algorithms for static, transient and periodic steady-state simulations are presented along with some practical simulation results. Some open problems in this field are discussed.MIT Masdar Program (196F/002/707/102f/70/9374
Production of Rhamnolipids by Pseudomonas aeruginosa HB6 (39) Isolated from Petroleum-Hydrocarbon Contaminated Environment
Stochastic Testing Method for Transistor-Level Uncertainty Quantification Based on Generalized Polynomial Chaos
Uncertainties have become a major concern in integrated circuit design. In order to avoid the huge number of repeated simulations in conventional Monte Carlo flows, this paper presents an intrusive spectral simulator for statistical circuit analysis. Our simulator employs the recently developed generalized polynomial chaos expansion to perform uncertainty quantification of nonlinear transistor circuits with both Gaussian and non-Gaussian random parameters. We modify the nonintrusive stochastic collocation (SC) method and develop an intrusive variant called stochastic testing (ST) method. Compared with the popular intrusive stochastic Galerkin (SG) method, the coupled deterministic equations resulting from our proposed ST method can be solved in a decoupled manner at each time point. At the same time, ST requires fewer samples and allows more flexible time step size controls than directly using a nonintrusive SC solver. These two properties make ST more efficient than SG and than existing SC methods, and more suitable for time-domain circuit simulation. Simulation results of several digital, analog and RF circuits are reported. Since our algorithm is based on generic mathematical models, the proposed ST algorithm can be applied to many other engineering problems
Efficient Uncertainty Quantification for the Periodic Steady State of Forced and Autonomous Circuits
This brief proposes an uncertainty quantification method for the periodic steady-state (PSS) analysis with both Gaussian and non-Gaussian variations. Our stochastic testing formulation for the PSS problem provides superior efficiency over both Monte Carlo methods and existing spectral methods. The numerical implementation of a stochastic shooting Newton solver is presented for both forced and autonomous circuits. Simulation results on some analog/RF circuits are reported to show the effectiveness of our proposed algorithms
ADEPt, a semantically-enriched pipeline for extracting adverse drug events from free-text electronic health records
Adverse drug events (ADEs) are unintended responses to medical treatment. They can greatly affect a patient's quality of life and present a substantial burden on healthcare. Although Electronic health records (EHRs) document a wealth of information relating to ADEs, they are frequently stored in the unstructured or semi-structured free-text narrative requiring Natural Language Processing (NLP) techniques to mine the relevant information. Here we present a rule-based ADE detection and classification pipeline built and tested on a large Psychiatric corpus comprising 264k patients using the de-identified EHRs of four UK-based psychiatric hospitals. The pipeline uses characteristics specific to Psychiatric EHRs to guide the annotation process, and distinguishes: a) the temporal value associated with the ADE mention (whether it is historical or present), b) the categorical value of the ADE (whether it is assertive, hypothetical, retrospective or a general discussion) and c) the implicit contextual value where the status of the ADE is deduced from surrounding indicators, rather than explicitly stated. We manually created the rulebase in collaboration with clinicians and pharmacists by studying ADE mentions in various types of clinical notes. We evaluated the open-source Adverse Drug Event annotation Pipeline (ADEPt) using 19 ADEs specific to antipsychotics and antidepressants medication. The ADEs chosen vary in severity, regularity and persistence. The average F-measure and accuracy achieved by our tool across all tested ADEs were 0.83 and 0.83 respectively. In addition to annotation power, the ADEPT pipeline presents an improvement to the state of the art context-discerning algorithm, ConText
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