272 research outputs found

    When managers believe technological ability is fixed

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    Drawing from mindset theory, we predict that managers' fixed mindset about technological ability (FM-TA) will negatively influence the developmental support they provide to their employees and, in turn, their employees' engagement in digitalisation initiatives. Further, we predict that managers' FM-TA will have a disproportionate negative influence on female employees for whom negative stereotypes about technological ability exist. We test our hypotheses with two-wave field study data collected from 88 managers and 185 employees working in a Nordic banking institution. We find that managers' FM-TA relates negatively to their employees' experienced developmental support, and, in turn, their employees' efforts to approach new technology. Furthermore, our findings indicate that this negative, indirect relationship is more pronounced for female employees (estimate = −0.116, standard error [SE] = 0.052, p = 0.026) than male employees (estimate = −0.048, SE = 0.027, p = 0.071), although the interaction term (managers' FM-TA × employee gender) was not significant at the 95 percent confidence level (estimate = −0.266, SE = 0.0141, p = 0.058). Our study provides greater insight into the human resource management issues managers might have fostering employee engagement and inclusion in the digitalised workplace.acceptedVersio

    Structural effects in UO2 thin films irradiated with U ions

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    This work presents the results of a detailed structural characterisation of irradiated and unirradiated single crystal thin films of UO2. Thin films of UO2 were produced by reactive magnetron sputtering onto (0 0 1), (1 1 0) and (1 1 1) single crystal yttria-stabilised zirconia (YSZ) substrates. Half of the samples were irradiated with 110 MeV 238U31+ ions to fluences of 5 × 1010, 5 × 1011 and 5 × 1012 ions/cm2 to induce radiation damage, with the remainder kept for reference measurements. It was observed that as-produced UO2 films adopted the crystallographic orientation of their YSZ substrates. The irradiation fluences used in this study however, were not sufficient to cause any permanent change in the crystalline nature of UO2. It has been demonstrated that the effect of epitaxial re-crystallisation of the induced radiation damage can be quantified in terms of kernel average misorientation (KAM) and different crystallographic orientations of UO2 respond differently to ion irradiation

    34. A multicenter randomized study of two regimens in paliative radiotherapy of bone metastases

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    In this study we compared two methods of radiotherapy in patients with painful bone metastases: 20 Gy in five fraction in five consecutive days vs 8 Gy in one fraction. A total of 115 patients (34 males, 81 females), median age 56 years (23–80), were randomly allocated to one of the treatment arms. In 56 pts. Primary tumor was located in the breast, in 14 pts in the lung, in ten pts in the kidney, in seven pts in the prostate, and in 28 pts in other sites. A total of 146 metastatic bone lesions were irradiated, seventy five (51%) were treated with 20 Gy and seventy one (49%) – with 8 Gy. The most frequent location of metastatic lesions was spine (36%), followed by pelvis (25%), long bones (18%), ribs (12%) and other sites (12%). Treatment techniques included single field (73%) or two parallel opposed fields (27%). Complete pain relief was achieved in 36% of the lesions irradiated with 20 Gy and in 41% of those irradiated with 8 Gy. Partial improvement was observed in 46% and 43% of lesions, respectively. The median time to reappearance of pain in both groups was 5.4 a 4.8 months and 5.0 a 5.4 months respectively. We conclude that a single exposure to 8 Gy is of the same efficacy as 20 Gy in five fractions in pain control of bone metastases and should be recommended as routine management

    Structural effects in UO<sub>2</sub> thin films irradiated with U ions

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    AbstractThis work presents the results of a detailed structural characterisation of irradiated and unirradiated single crystal thin films of UO2. Thin films of UO2 were produced by reactive magnetron sputtering onto (001), (110) and (111) single crystal yttria-stabilised zirconia (YSZ) substrates. Half of the samples were irradiated with 110MeV 238U31+ ions to fluences of 5×1010, 5×1011 and 5×1012ions/cm2 to induce radiation damage, with the remainder kept for reference measurements. It was observed that as-produced UO2 films adopted the crystallographic orientation of their YSZ substrates. The irradiation fluences used in this study however, were not sufficient to cause any permanent change in the crystalline nature of UO2. It has been demonstrated that the effect of epitaxial re-crystallisation of the induced radiation damage can be quantified in terms of kernel average misorientation (KAM) and different crystallographic orientations of UO2 respond differently to ion irradiation
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