Single-Event Upset Analysis and Protection in High Speed Circuits

The effect of single-event transients (SETs) (at a combinational node of a design) on the system reliability is becoming a big concern for ICs manufactured using advanced technologies. An SET at a node of combinational part may cause a transient pulse at the input of a flip-flop and consequently is latched in the flip-flop and generates a soft-error. When an SET conjoined with a transition at a node along a critical path of the combinational part of a design, a transient delay fault may occur at the input of a flip-flop. On the other hand, increasing pipeline depth and using low power techniques such as multi-level power supply, and multi-threshold transistor convert almost all paths in a circuit to critical ones. Thus, studying the behavior of the SET in these kinds of circuits needs special attention. This paper studies the dynamic behavior of a circuit with massive critical paths in the presence of an SET. We also propose a novel flip-flop architecture to mitigate the effects of such SETs in combinational circuits. Furthermore, the proposed architecture can tolerant a single event upset (SEU) caused by particle strike on the internal nodes of a flip-flo

Run-Time Power Modelling in Embedded GPUs with Dynamic Voltage and Frequency Scaling

This paper investigates the application of a robust CPU-based power modelling methodology that performs an automatic search of explanatory events derived from performance counters to embedded GPUs. A 64-bit Tegra TX1 SoC is configured with DVFS enabled and multiple CUDA benchmarks are used to train and test models optimized for each frequency and voltage point. These optimized models are then compared with a simpler unified model that uses a single set of model coefficients for all frequency and voltage points of interest. To obtain this unified model, a number of experiments are conducted to extract information on idle, clock and static power to derive power usage from a single reference equation. The results show that the unified model offers competitive accuracy with an average 5\% error with four explanatory variables on the test data set and it is capable to correctly predict the impact of voltage, frequency and temperature on power consumption. This model could be used to replace direct power measurements when these are not available due to hardware limitations or worst-case analysis in emulation platforms

Energy Optimization in Commercial FPGAs with Voltage, Frequency and Logic Scaling

This paper investigates the energy reductions possible in commercially available FPGAs configured to support voltage, frequency and logic scalability combined with power gating. Voltage and frequency scaling is based on in-situ detectors that allow the device to detect valid working voltage and frequency pairs at run-time while logic scalability is achieved with partial dynamic reconfiguration. The considered devices are FPGA-processor hybrids with independent power domains fabricated in 28 nm process nodes. The test case is based on a number of operational scenarios in which the FPGA side is loaded with a motion estimation core that can be configured with a variable number of execution units. The results demonstrate that voltage scalability reduces power by up to 60 percent compared with nominal voltage operation at the same frequency. The energy analysis show that the most energy efficiency core configuration depends on the performance requirements. A low performance scenario shows that serial computation is more energy efficient than the parallel configuration while the opposite is true when the performance requirements increase. An algorithm is proposed to combine effectively adaptive voltage/logic scaling and power gating in the proposed system and application

Analysis of System-Failure Rate Caused by Soft-Errors using a UML-Based Systematic Methodology in an SoC

This paper proposes an analytical method to assess the soft-error rate (SER) in the early stages of a System-on-Chip (SoC) platform-based design methodology. The proposed method gets an executable UML (Unified Modeling Language) model of the SoC and the raw soft- error rate of different parts of the platform as its inputs. Soft-errors on the design are modeled by disturbances on the value of attributes in the classes of the UML model and disturbances on opcodes of software cores. The Dynamic behavior of each core is used to determine the propagation probability of each variable disturbance to the core outputs. Furthermore, the SER and the execution time of each core in the SoC and a Failure Modes and Effects Analysis (FMEA) that determines the severity of each failure mode in the SoC are used to compute the System-Failure Rate (SFR) of the So