50 research outputs found

    Performance Comparison of Graphene Nanoribbon FETs with Schottky Contacts and Doped Reservoirs

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    We present an atomistic 3D simulation study of the performance of graphene nanoribbon (GNR) Schottky barrier (SB) FETs and transistors with doped reservoirs (MOSFETs) by means of the self-consistent solution of the Poisson and Schrodinger equations within the non-equilibrium Green's function (NEGF) formalism. Ideal MOSFETs show slightly better electrical performance, for both digital and THz applications. The impact of non-idealities on device performance has been investigated, taking into account the presence of single vacancy, edge roughness and ionized impurities along the channel. In general, MOSFETs show more robust characteristics than SBFETs. Edge roughness and single vacancy defect largely affect performance of both device types.Comment: to appear in IEEE Trans. on Electron Device

    Study 2c

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    Study 1A

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    Shifts in facial impression structures across group boundaries

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