Determination of the copper layer thickness in spin valves by grazing incidence x-ray fluorescence

We show that at the standard laboratory wavelength of CuKα the scattering factors of Cu and Ni(-0.8)Fe(-0.2) are identical, thereby making it impossible to distinguish the boundary of the Cu spacer layer in a Cdpermalloy spin valve structure from grazing incidence x-ray reflectivity curves. Use of grazing incidence fluorescence, in conjunction with x-ray reflectivity provides sufficient information to control the Cu layer thickness. We demonstrate the technique on two spin valves with Cu spacer layers differing in thickness by a factor of 2.5

Focused-ion-beam induced interfacial intermixing of magnetic bilayers for nanoscale control of magnetic properties

Modification of the magnetic properties in a thin-film ferromagnetic/non-magnetic bilayer system by low-dose focused ion-beam (FIB) induced intermixing is demonstrated. The highly localized capability of FIB may be used to locally control magnetic behaviour at the nanoscale. The magnetic, electronic and structural properties of NiFe/Au bilayers were investigated as a function of the interfacial structure that was actively modified using focused Ga+ ion irradiation. Experimental work used MOKE, SQUID, XMCD as well as magnetoresistance measurements to determine the magnetic behavior and grazing incidence x-ray reflectivity to elucidate the interfacial structure. Interfacial intermixing, induced by low-dose irradiation, is shown to lead to complex changes in the magnetic behavior that are associated with monotonic structural evolution of the interface. This behavior may be explained by changes in the local atomic environment within the interface region resulting in a combination of processes including the loss of moment on Ni and Fe, an induced moment on Au and modifications to the spin-orbit coupling between Au and NiFe

Determination of the Thickness of Al2O3 Barriers in Magnetic Tunnel Junctions

Copyright © 2002 American Institute of PhysicsThe barrier thickness in magnetic spin-dependent tunnel junctions with Al2O3 barriers has been measured using grazing incidence x-ray reflectivity and by fitting the tunneling current to the Simmons model. We have studied the effect of glow discharge oxidation time on the barrier structure, revealing a substantial increase in Al2O3 thickness with oxidation. The greater thickness of barrier measured using grazing incidence x-ray reflectivity compared with that obtained by fitting current density–voltage to the Simmons electron tunneling model suggests that electron tunneling is localized to specific regions across the barrier, where the thickness is reduced by fluctuations due to nonconformal roughness

The spin polarization of Mn atoms in paramagnetic CuMn alloys induced by a Co layer

Copyright © 2009 American Institute of PhysicsUsing the surface, interface, and element specificity of x-ray resonant magnetic scattering in combination with x-ray magnetic circular dichroism, we have spatially resolved the polarization, and hence the spin accumulation in Mn high susceptibility material in close proximity to a ferromagnetic layer. The magnetic polarization of Mn and Cu 3d electrons in paramagnetic CuMn layers is detected in a Co/Cu x /CuMn structure for varying copper layer thicknesses x . The size of the Mn and Cu L2–3-edge dichroism shows a decrease in the polarization for increasing copper thickness indicating the dominant interfacial nature of the Cu and Mn spin polarization. The Mn polarization appears to be much higher than that of Cu

Non-uniform Gd distribution and magnetization profiles within GdCoFe alloy thin films

Rare earth (RE):transition metal (TM) ferrimagnetic alloys continue to attract significant attention for spintronics. This work focuses on the elemental distribution of RE and TM elements throughout the thickness of nominally uniform films and the resulting spatial variations of the magnetization within these layers. Samples of CoFe alloyed with Gd were studied using secondary ion mass spectroscopy, polarized neutron reflectometry, and x-ray resonant magnetic reflectivity. The samples were grown by magnetron co-sputtering to control the RE:TM alloy ratio of the ferrimagnetic layer, which was combined with W and Pt layers as either under or over-layers to create sample structures such as W/Gdx(Co70Fe30)100-x/Pt, wherex x=0,8, and 23 at. %. Results show that uniformly deposited thin-films have a significant variation in the distribution of the TM and RE through the film thickness, and this leads to a spatial distribution in the net magnetization profile and a non-uniform Gd magnetization profile within the layer. These findings have implications for the application RE:TM alloys in spintronics as they may impact the perpendicular magnetic anisotropy, the ferrimagnetic compensation temperature, and interfacial spin transport

X-ray scattering from magnetic metallic multilayers

SIGLEAvailable from British Library Document Supply Centre-DSC:DXN022151 / BLDSC - British Library Document Supply CentreGBUnited Kingdo

Determination of the thickness of Al₂O₃ barriers in magnetic tunnel junctions

The barrier thickness in magnetic spin-dependent tunnel junctions with Al2O3 barriers has been measured using grazing incidence x-ray reflectivity and by fitting the tunneling current to the Simmons model. We have studied the effect of glow discharge oxidation time on the barrier structure, revealing a substantial increase in Al2O3 thickness with oxidation. The greater thickness of barrier measured using grazing incidence x-ray reflectivity compared with that obtained by fitting current density-voltage to the Simmons electron tunneling model suggests that electron tunneling is localized to specific regions across the barrier, where the thickness is reduced by fluctuations due to nonconformal roughness