Alien Registration- Chalefoux, Roch H. (Lewiston, Androscoggin County)

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Exploring User-Provided Connectivity

Network services often exhibit positive and negative externalities that affect users\u27 adoption decisions. One such service is user-provided connectivity or UPC. The service offers an alternative to traditional infrastructure-based communication services by allowing users to share their home base connectivity with other users, thereby increasing their access to connectivity. More users mean more connectivity alternatives, i.e., a positive externality, but also greater odds of having to share one\u27s own connectivity, i.e., a negative externality. The tug of war between positive and negative externalities together with the fact that they often depend not just on how many but also which users adopt, make it difficult to predict the service\u27s eventual success. Exploring this issue is the focus of this paper, which investigates not only when and why such services may be viable, but also explores how pricing can be used to effectively and practically realize them

Social Context and Voting over Taxes: Evidence from a Referendum in Alabama

We investigate the impact of racial diversity and segregation on white voter support for a comprehensive, progressive tax reform. We focus on a 2003 referendum held in Alabama, which if approved would have raised substantial additional revenues for public education and at the same time greatly increased the progressivity of the tax system. We use King's (1997) method of ecological inference to obtain estimates of white and black support for the referendum proposal, and we then attempt to explain the variance across counties in white voter support. We find that the degree of racial segregation, rather than the proportion of blacks in a given county, is most critical in predicting support for the referendum among whites at the county level. Working Paper 06-0

Development of a Reference Wafer for On-Wafer Testing of Extreme Impedance Devices

This paper describes the design, fabrication, and testing of an on-wafer substrate that has been developed specifically for measuring extreme impedance devices using an on-wafer probe station. Such devices include carbon nano-tubes (CNTs) and structures based on graphene which possess impedances in the κ Ω range and are generally realised on the nano-scale rather than the micro-scale that is used for conventional on-wafer measurement. These impedances are far removed from the conventional 50- reference impedance of the test equipment. The on-wafer substrate includes methods for transforming from the micro-scale towards the nano-scale and reference standards to enable calibrations for extreme impedance devices. The paper includes typical results obtained from the designed wafer