328 research outputs found
Use of extended and prepared reference objects in experimental Fourier transform X-ray holography
The use of one or more gold nanoballs as reference objects for Fourier
Transform holography (FTH) is analysed using experimental soft X-ray
diffraction from objects consisting of separated clusters of these balls. The
holograms are deconvoluted against ball reference objects to invert to images,
in combination with a Wiener filter to control noise. A resolution of ~30nm,
smaller than one ball, is obtained even if a large cluster of balls is used as
the reference, giving the best resolution yet obtained by X-ray FTH. Methods of
dealing with missing data due to a beamstop are discussed. Practical prepared
objects which satisfy the FTH condition are suggested, and methods of forming
them described.Comment: 7 pages, 2 figures, submitted to Applied Physics Letter
X-ray microscopy; an emerging technique for semiconductor microstructure characterization
The advent of third generation synchrotron radiation x-ray sources, such as the Advanced Light Source (ALS) at Berkeley have enabled the practical realization of a wide range of new techniques in which mature chemical or structural probes such as x-ray photoelectron spectroscopy (XPS) and x-ray diffraction are used in conjunction with microfocused x-ray beams. In this paper the characteristics of some of these new microscopes are described, particularly in reference to their applicability to the characterization of semiconductor microstructures
Compressive Phase Contrast Tomography
When x-rays penetrate soft matter, their phase changes more rapidly than
their amplitude. In- terference effects visible with high brightness sources
creates higher contrast, edge enhanced images. When the object is piecewise
smooth (made of big blocks of a few components), such higher con- trast
datasets have a sparse solution. We apply basis pursuit solvers to improve SNR,
remove ring artifacts, reduce the number of views and radiation dose from phase
contrast datasets collected at the Hard X-Ray Micro Tomography Beamline at the
Advanced Light Source. We report a GPU code for the most computationally
intensive task, the gridding and inverse gridding algorithm (non uniform
sampled Fourier transform).Comment: 5 pages, "Image Reconstruction from Incomplete Data VI" conference
7800, SPIE Optical Engineering + Applications 1-5 August 2010 San Diego, CA
United State
Design of an electron microscope phase plate using a focused continuous-wave laser
We propose a Zernike phase contrast electron microscope that uses an intense
laser focus to convert a phase image into a visible image. We present the
relativistic quantum theory of the phase shift caused by the
laser-electron-interaction, study resonant cavities for enhancing the laser
intensity, and discuss applications in biology, soft materials science, and
atomic and molecular physics.Comment: 5 pages, 3 figure
Coherent X-ray Diffractive Imaging; applications and limitations
The inversion of a diffraction pattern offers aberration-free
diffraction-limited 3D images without the resolution and depth-of-field
limitations of lens-based tomographic systems, the only limitation being
radiation damage. We review our experimental results, discuss the fundamental
limits of this technique and future plans.Comment: 7 pages, 8 figure
Recommended from our members
Elliptically polarizing undulator beamline 4.0.1 for magnetic spectroscopy at the Advanced Light Source
A beamline for high resolution spectroscopy with elliptically polarized X-rays is described.The working energy range is large, from 20 eV to above 1800 eV. The resolving power is on the order of 10,000 at low energies (20-200 eV) and 6000 at high energies (200-1800 eV). This is achieved using a variable deviation angle plane grating monochromator. A single grating, with one line density and a varying groove depth, is used to cover the entire energy range. The beamline has been designed to operate with either one or two x-ray beams propagating simultaneously through the monochromator and to the experimental station. Switching between polarizations at rates of 0.1 Hz and slower is accomplished in the single beam mode by alternating the output of the elliptically polarized undulator source between left and right polarization. Fast polarization switching, at rates of 100-1000 Hz, is provided in the two beam mode by mechanical chopping between two photon beams, one of which is right circularly polarized, and the other left circularly polarized
XPS and UHV AFM Analysis of the K2CsSb Photocathodes Growth
Next generation light sources, based on Energy Recovery Linac and Free Electron Laser technology will rely on photoinjector based electron sources. Successful operation of such sources requires reliable photocathodes with long operational life, uniform and high quantum efficiency, low thermal emittance and low dark current. The goal of this project is to construct a cathode which meets these requirements. Advances in photocathode research must take a combined effort. The materials have to be analyzed by means of chemical composition, surface structure and these findings have to be correlated to the quantum efficiency and performance in the injector. The presented work focuses on the chemical composition and surface structure of K2CsSb photocathodes. The XPS and AFM measurements were performed at the Center of Functional Nanomaterials at BNL. K2CsSb photocathodes were grown under UHV conditions. The components were adsorbed one at a time and after each growth step the corresponding XPS spectra was taken. During growth the quantum efficiency was recorded. As last step the sample was moved into the AFM without exposure to air to determine the surface roughnes
Recommended from our members
Preliminary optical design of a varied line-space spectrograph for the multi-channel detection of near-edge X-ray absorption fine structure (NEXAFS) spectra in the 280-550 eV energy range
The optical design of a varied line-space spectrograph for the multi-channel recording of NEXAFS spectra in a single {open_quotes}snapshot{close_quotes} is proposed. The spectrograph is to be used with a bending magnet source on beamline 7.3.2 at the Advanced Light Source (ALS). Approximately 20 volts of spectra are simultaneously imaged across a small square of material sample at each respective K absorption edge of carbon, nitrogen, and oxygen. Photoelectrons emitted from the material sample will be collected by an electron imaging microscope, the view field of which determines the sampling size. The sample also forms the exit slit of the optical system. This dispersive method of NEXAFS data acquisition is three to four orders of magnitude faster than the conventional method of taking data point-to-point using scanning of the grating. The proposed design is presented along with the design method and supporting SHADOW raytrace analysis
A grazing incidence x-ray streak camera for ultrafast, single-shot measurements
An ultrafast x-ray streak camera has been realized using a grazing incidence reflection photocathode. X-rays are incident on a gold photocathode at a grazing angle of 20° and photoemitted electrons are focused by a large aperture magnetic solenoid lens. The streak camera has high quantum efficiency, 600 fs temporal resolution, and 6 mm imaging length in the spectral direction. Its single shot capability eliminates temporal smearing due to sweep jitter, and allows recording of the ultrafast dynamics of samples that undergo nonreversible changes
- …