Enhanced resistance of single-layer graphene to ion bombardment

We report that single-layer graphene on a SiO_2/Si substrate withstands ion bombardment up to ~7 times longer than expected when exposed to focused Ga^+ ion beam. The exposure is performed in a dual beam scanning electron microscope/focused ion beam system at 30 kV accelerating voltage and 41 pA current. Ga^+ ion flux is determined by sputtering a known volume of hydrogenated amorphous carbon film deposited via plasma-enhanced chemical vapor deposition

Comment on "Electron transport through correlated molecules computed using the time-independent Wigner function: Two critical tests"

The many electron correlated scattering (MECS) approach to quantum electronic transport was investigated in the linear response regime [I. Baldea and H. Koeppel, Phys. Rev. B. 78, 115315 (2008)]. The authors suggest, based on numerical calculations, that the manner in which the method imposes boundary conditions is unable to reproduce the well-known phenomena of conductance quantization. We introduce an analytical model and demonstrate that conductance quantization is correctly obtained using open system boundary conditions within the MECS approach.Comment: 18 pages, 4 figures. Physical Review B, to appea

Drug Points: Apparent interaction between warfarin and levonorgestrel used for emergency contraception

No abstract available

An investigation of the basic properties of irradiated polyethylene memory materials

Properties of irradiated polyethylene memory material

Cathodoluminescence of enstatite from chondritic and achondritic meteorites and its selenological implications Technical report, 1 Sep. 1967 - 1 Jul. 1968

Cathodoluminescence of enstatite from chondritic and achondritic meteorites and selenological implication

Microstructure versus Size: Mechanical Properties of Electroplated Single Crystalline Cu Nanopillars

We report results of uniaxial compression experiments on single-crystalline Cu nanopillars with nonzero initial dislocation densities produced without focused ion beam (FIB). Remarkably, we find the same power-law size-driven strengthening as FIB-fabricated face-centered cubic micropillars. TEM analysis reveals that initial dislocation density in our FIB-less pillars and those produced by FIB are on the order of 10^(14)  m^(-2) suggesting that mechanical response of nanoscale crystals is a stronger function of initial microstructure than of size regardless of fabrication method

Applications of luminescence techniques to the study of the lunar surface

Optical fluorescence spectra of rock-forming minerals for identifying mineral grains found on lunar surfac