Upper Bound on the Hadronic Light-by-Light Contribution to the Muon g-2

There are indications that hadronic loops in some electroweak observables are almost saturated by parton level effects. Taking this as the hypothesis for this work, we propose a genuine parton level estimate of the hadronic light-by-light contribution to the anomalous magnetic moment of the muon, a_mu (LBL,had). Our quark mass definitions and values are motivated in detail, and the simplicity of our approach allows for a transparent error estimate. For infinitely heavy quarks our treatment is exact, while for asymptotically small quark masses a_mu (LBL,had) is overestimated. Interpolating, this suggests quoting an upper bound. We obtain a_mu (LBL,had) < 1.59 10^-9 (95% CL).Comment: 4 pages; 2 references added, some changes in text; final versio

Three-dimensional real-time darkfield imaging through Fourier lightfield microscopy

We report a protocol that takes advantage of the Fourier lightfield microscopy concept for providing 3D darkfield images of volumetric samples in a single-shot. This microscope takes advantage of the Fourier lightfield configuration, in which a lens array is placed at the Fourier plane of the microscope objective, providing a direct multiplexing of the spatio-angular information of the sample. Using the proper illumination beam, the system collects the light scattered by the sample while the background light is blocked out. This produces a set of orthographic perspective images with shifted spatial-frequency components that can be recombined to produce a 3D darkfield image. Applying the adequate reconstruction algorithm high-contrast darkfield optical sections are calculated in real time. The presented method is applied for fast volumetric reconstructions of unstained 3D samples

Fourier-domain lightfield microscopy: a new paradigm in 3D microscopy

Recently, integral (also known as lightfield or plenoptic) imaging concept has been applied successfully to microscopy. The main advantage of lightfield microscopy when compared with conventional 3D imaging techniques is that it offers the possibility of capturing the 3D information of the sample after a single shot. However, integral microscopy is now facing many challenges, like improving the resolution and depth of field of the reconstructed specimens or the development and optimization of specially-adapted reconstruction algorithms. This contribution is devoted to review a new paradigm in lightfield microscopy, namely, the Fourier-domain integral microscope (FiMic), that improves the capabilities of the technique, and to present recent advances and applications of this new architecture

Optical sectioning microscopy through single-shot Lightfield protocol

Optical sectioning microscopy is usually performed by means of a scanning, multi-shot procedure in combination with non-uniform illumination. In this paper, we change the paradigm and report a method that is based in the light field concept, and that provides optical sectioning for 3D microscopy images after a single-shot capture. To do this we fi rst capture multiple orthographic perspectives of the sample by means of Fourier-domain integral microscopy (FiMic). The second stage of our protocol is the application of a novel refocusing algorithm that is able to produce optical sectioning in real time, and with no resolution worsening, in the case of sparse f luorescent samples.We provide the theoretical derivation of the algorithm, and demonstrate its utility by applying it to simulations and to experimental data

What about computational super-resolution in fluorescence Fourier light field microscopy?

Recently, Fourier light field microscopy was proposed to overcome the limitations in conventional light field microscopy by placing a micro-lens array at the aperture stop of the microscope objective instead of the image plane. In this way, a collection of orthographic views from different perspectives are directly captured. When inspecting fluorescent samples, the sensitivity and noise of the sensors are a major concern and large sensor pixels are required to cope with low-light conditions, which implies under-sampling issues. In this context, we analyze the sampling patterns in Fourier light field microscopy to understand to what extent computational super-resolution can be triggered during deconvolution in order to improve the resolution of the 3D reconstruction of the imaged data

3D deconvolution in Fourier integral microscopy

Fourier integral microscopy (FiMic), also referred to as Fourier light field microscopy (FLFM) in the literature, was recently proposed as an alternative to conventional light field microscopy (LFM). FiMic is designed to overcome the non-uniform lateral resolution limitation specific to LFM. By inserting a micro-lens array at the aperture stop of the microscope objective, the Fourier integral microscope directly captures in a single-shot a series of orthographic views of the scene from different viewpoints. We propose an algorithm for the deconvolution of FiMic data by combining the well known Maximum Likelihood Expectation (MLEM) method with total variation (TV) regularization to cope with noise amplification in conventional Richardson-Lucy deconvolution

The Lightfield microscope eyepiece

Lightfield microscopy has raised growing interest in the last few years. Its ability to get three-dimensional information about the sample in a single shot makes it suitable for many applications in which time resolution is fundamental. In this paper we present a novel device, which is capable of converting any conventional microscope into a lightfield microscope. Based on the Fourier integral microscope concept, we designed the lightfield microscope eyepiece. This is coupled to the eyepiece port, to let the user exploit all the host microscope's components (objective turret, illumination systems, translation stage, etc.) and get a 3D reconstruction of the sample. After the optical design, a proof-of-concept device was built with off-the-shelf optomechanical components. Here, its optical performances are demonstrated, which show good matching with the theoretical ones. Then, the pictures of different samples taken with the lightfield eyepiece are shown, along with the corresponding reconstructions. We demonstrated the functioning of the lightfield eyepiece and lay the foundation for the development of a commercial device that works with any microscope