10 research outputs found
Detection of nonmagnetic metal thin film using magnetic force microscopy
Magnetic force microscopy (MFM) allows detection of stray magnetic fields
around magnetic materials and the two-dimensional visualization of these
fields. This paper presents a theoretical analysis of the oscillations of an
MFM tip above a thin film of nonmagnetic metal. The results show good agreement
with experimental data obtained by varying the tip height. The phenomenon
analyzed here can be applied as a "metal detector" at the nanometer scale and
for contactless measurement of sheet resistivity. The detection sensitivity is
obtained as a function of oscillation frequency, thus allowing determination of
the best frequency for phase-shift measurement. The shift in resonance
frequency due to the presence of a nonmagnetic metal is also discussed.Comment: 4 pages, 5 figure
A Preparation Method for Atomically Clean Sapphire Surfaces and High Resolution Topographic Method for Their Imaging by Non-Contact Atomic Force Microscopy
Measurement of the Lateral Charge Distribution in Silicon Generated by High-Energy Ion Incidence
The lateral distribution of the charge generated in silicon by a 15 MeV oxygen-ion incidence was experimentally measured. The lateral radius of the charge region generated because of this 15 MeV oxygen-ion incidence was 300-400 nm, which is much wider than that calculated using the well-known Katz theory. In addition, the measured peak concentration of the generated charge around the ion incident point was two orders of magnitude lower than that calculated using the Katz theory
Measurement of the Lateral Charge Distribution in Silicon Generated by High-Energy Ion Incidence
Relationship between soft error rate in SOI-SRAM and amount of generated charge by high energy ion probes
Field Emission from Atomically Thin Edges of Reduced Graphene Oxide
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