A Preparation Method for Atomically Clean Sapphire Surfaces and High Resolution Topographic Method for Their Imaging by Non-Contact Atomic Force Microscopy

Authors
Publication date
1 January 2015
Publisher
'Japan Institute of Metals'
Doi

    Abstract

    Abstract is not available.

      Similar works

      Full text

      thumbnail-image

      Available Versions

      Crossref

      redirect
      Last time updated on 10/11/2020