Novel software techniques for automatic microwave measurements

Although many microwave measurement techniques are heavily based on special purpose software, the application of modern software techniques like object oriented programming and new programming language like C++ is seldom used. The impact of such new software solutions can drastically improve the overall design of a microwave test set. The paper presents the design and implementation of a new multiport network analyzer with particular attention to the control program architecture. The use of Object Oriented Programming techniques results in a clear and easy to maintain solution which boosts both the user interface and the overall test set organizatio

Interplane charge dynamics in a valence-bond dynamical mean-field theory of cuprate superconductors

We present calculations of the interplane charge dynamics in the normal state of cuprate superconductors within the valence-bond dynamical mean-field theory. We show that by varying the hole doping, the c-axis optical conductivity and resistivity dramatically change character, going from metallic-like at large doping to insulating-like at low-doping. We establish a clear connection between the behavior of the c-axis optical and transport properties and the destruction of coherent quasiparticles as the pseudogap opens in the antinodal region of the Brillouin zone at low doping. We show that our results are in good agreement with spectroscopic and optical experiments.Comment: 5 pages, 3 figure

Photometric and spectroscopic variations of the Be star HD 112999

Be objects are stars of B spectral type showing lines of the Balmer series in emission. The presence of these lines is attributed to the existence of an extended envelope, disk type, around them. Some stars are observed in both the Be and normal B-type spectroscopic states and they are known as transient Be stars. In this paper we show the analysis carried out on a new possible transient Be star, labelled HD 112999, using spectroscopic optical observations and photometric data.Comment: 10 pages, 5 figures, accepted for publication in IBV

On the Calderón problem for nonlocal Schrödinger equations with homogeneous, directionally antilocal principal symbols

In this article we consider direct and inverse problems for α-stable, elliptic nonlocal operators whose kernels are possibly only supported on cones and which satisfy the structural condition of directional antilocality as introduced by Y. Ishikawa in the 80s. We consider the Dirichlet problem for these operators on the respective “domain of dependence of the operator” and in several, adapted function spaces. This formulation allows one to avoid natural “gauges” which would else have to be considered in the study of the associated inverse problems. Exploiting the directional antilocality of these operators we complement the investigation of the direct problem with infinite data and single measurement uniqueness results for the associated inverse problems. Here, due to the only directional antilocality, new geometric conditions arise on the measurement domains. We discuss both the setting of symmetric and a particular class of non-symmetric nonlocal elliptic operators, and contrast the corresponding results for the direct and inverse problems. In particular for only “one-sided operators” new phenomena emerge both in the direct and inverse problems: For instance, it is possible to study the problem in data spaces involving local and nonlocal data, the unique continuation property may not hold in general and further restrictions on the measurement set for the inverse problem arise

Characterization of multilayer stack parameters from X-ray reflectivity data using the PPM program: measurements and comparison with TEM results

Future hard (10 -100 keV) X-ray telescopes (SIMBOL-X, Con-X, HEXIT-SAT, XEUS) will implement focusing optics with multilayer coatings: in view of the production of these optics we are exploring several deposition techniques for the reflective coatings. In order to evaluate the achievable optical performance X-Ray Reflectivity (XRR) measurements are performed, which are powerful tools for the in-depth characterization of multilayer properties (roughness, thickness and density distribution). An exact extraction of the stack parameters is however difficult because the XRR scans depend on them in a complex way. The PPM code, developed at ERSF in the past years, is able to derive the layer-by-layer properties of multilayer structures from semi-automatic XRR scan fittings by means of a global minimization procedure in the parameters space. In this work we will present the PPM modeling of some multilayer stacks (Pt/C and Ni/C) deposited by simple e-beam evaporation. Moreover, in order to verify the predictions of PPM, the obtained results are compared with TEM profiles taken on the same set of samples. As we will show, PPM results are in good agreement with the TEM findings. In addition, we show that the accurate fitting returns a physically correct evaluation of the variation of layers thickness through the stack, whereas the thickness trend derived from TEM profiles can be altered by the superposition of roughness profiles in the sample image