New approaches for coherent and incoherent implementation of x-ray phase contrast imaging

Two new x-ray imaging modalities exploiting the phase delay electromagnetic waves experience when travelling through matter are introduced in this work. The first, called beam tracking, allows the measurement of three different physical properties of an object: absorption, refraction and ultra-small-angle scattering. This is achieved by tracking the variations induced to a reference beam by a sample through a multi-Gaussian interpolation. Beam tracking can be implemented with both monochromatic, coherent radiation (available at e.g. synchrotron facilities) and polychromatic, incoherent radiation produced by standard laboratory sources. The nature of the three extracted signals allows the implementation of beam tracking in computed tomography, resulting in the three-dimensional reconstruction of the real and imaginary part of the sample refractive index, alongside its local scattering power. The second proposed method, called one dimensional ptychography, exploits the coherent properties of synchrotron radiation to retrieve the sample complex refractive index. The peculiar feature of this method is the strongly asymmetric beam used to illuminate the sample. Unlike standard ptychographic techniques, this enables scanning the sample in one direction only, which can lead to a possible reduction in exposure time when large field of views are covered. At the same time, ptychographic, sub-pixel resolution can be obtained only in the scan direction, while pixel-limited resolution is obtained in the orthogonal one. Prior to the introduction of these methods, the theoretical foundations are laid down, and the development of a fast and effective simulation software allowing their implementation is described

Virtual edge illumination and one dimensional beam tracking for absorption, refraction, and scattering retrieval

We propose two different approaches to retrieve x-ray absorption, refraction, and scattering signals using a one dimensional scan and a high resolution detector. The first method can be easily implemented in existing procedures developed for edge illumination to retrieve absorption and refraction signals, giving comparable image quality while reducing exposure time and delivered dose. The second method tracks the variations of the beam intensity profile on the detector through a multi-Gaussian interpolation, allowing the additional retrieval of the scattering signal

Asymmetric masks for laboratory-based X-ray phase-contrast imaging with edge illumination

We report on an asymmetric mask concept that enables X-ray phase contrast imaging without requiring any movement in the system during data acquisition. The method is compatible with laboratory equipment, namely a commercial detector and a rotating anode tube. The only motion required is that of the object under investigation which is scanned through the imaging system. Two proof-of-principle optical elements were designed, fabricated and experimentally tested. Quantitative measurements on samples of known shape and composition were compared to theory with good agreement. The method is capable of measuring the attenuation, refraction and (ultra-small-angle) X-ray scattering, does not have coherence requirements and naturally adapts to all those situations in which the X-ray image is obtained by scanning a sample through the imaging system

An experimental approach to optimising refraction sensitivity for lab-based edge illumination phase contrast set-ups

Refraction sensitivity can be optimised for differential x-ray phase contrast (XPC) imaging methods by modifying the set-up. Often, modifications involve changing source/detector parameters, propagation distances, or the design of optical components, i.e. parameters that are not readily changed without non-trivial time investment, replacing components, or performing high-precision recalibrations. The edge illumination (EI) XPC method provides a method of optimising the refraction sensitivity, by exploiting micrometric translations of its periodic masks, that bypasses the constraints listed above. These translations can be performed on-the-fly and allow optimising the refraction signal for specific applications without making significant changes to the set-up. The method can prove advantageous for lab-based systems that make use of larger sources but with limited available set-up space. In this paper, we study how refraction sensitivity varies as a function of illuminated pixel fraction (IPF) under two commonly encountered experimental conditions: (1) at approximately constant detected counts, and (2) at equal exposure time. We compare the standard deviation in the background of reconstructed refraction images at different IPFs and find that refraction sensitivity is optimal at 25% IPF under both conditions. Finally, we demonstrate that refraction sensitivity affects the visibility of weakly refracting features on an insect leg. The results suggest that IPFs lower than 50% can actually be preferable, especially in the case where the statistics is kept constant, and provide experimental validation that phase sensitivity in EI is not fixed once the system parameters are defined

Optimization of sensitivity, dose and spatial resolution in edge illumination X-ray phase-contrast imaging

Edge illumination (EI) X-ray phase-contrast imaging has great potential for applications in a wide range of research, industrial and clinical fields. The optimization of the EI experimental setup for a given application is therefore essential, in order to take full advantage of the capabilities of the technique. In this work, we analyze the dependence of the angular sensitivity, spatial resolution and dose delivered to the sample upon the various experimental parameters, and describe possible strategies to optimize them. The obtained results will be important for the design of future EI experimental setups, in particular enabling their tailoring to specific applications

A first investigation of accuracy, precision and sensitivity of phase-based x-ray dark-field imaging

In the last two decades, x-ray phase contrast imaging (XPCI) has attracted attention as a potentially significant improvement over widespread and established x-ray imaging. The key is its capability to access a new physical quantity (the ‘phase shift’), which can be complementary to x-ray absorption. One additional advantage of XPCI is its sensitivity to micro structural details through the refraction induced dark-field (DF). While DF is extensively mentioned and used for several applications, predicting the capability of an XPCI system to retrieve DF quantitatively is not straightforward. In this article, we evaluate the impact of different design options and algorithms on DF retrieval for the Edge-Illumination (EI) XPCI technique. Monte Carlo simulations, supported by experimental data, are used to measure the accuracy, precision and sensitivity of DF retrieval performed with several EI systems based on conventional x-ray sources. The introduced tools are easy to implement, and general enough to assess the DF performance of systems based on alternative (i.e. non-EI) XPCI approaches

Edge illumination X-ray phase tomography of multi-material samples using a single-image phase retrieval algorithm

In this paper we present a single-image phase retrieval algorithm for multi-material samples, developed for the edge illumination (EI) X-ray phase contrast imaging method. The theoretical derivation is provided, along with any assumptions made. The algorithm is evaluated quantitatively using both simulated and experimental results from a computed tomography (CT) scan using the EI laboratory implementation. Qualitative CT results are provided for a biological sample containing both bone and soft-tissue. Using a single EI image per projection and knowledge of the complex refractive index, the algorithm can accurately retrieve the interface between a given pair of materials. A composite CT slice can be created by splicing together multiple CT reconstructions, each retrieved for a different pair of materials

The concept of contrast transfer function for edge illumination X-ray phase-contrast imaging and its comparison with the free-space propagation technique

Previous studies on edge illumination (EI) X-ray phase-contrast imaging (XPCi) have investigated the nature and amplitude of the signal provided by this technique. However, the response of the imaging system to different object spatial frequencies was never explicitly considered and studied. This is required in order to predict the performance of a given EI setup for different classes of objects. To this scope, in the present work we derive analytical expressions for the contrast transfer function of an EI imaging system, using the approximation of near-field regime, and study its dependence upon the main experimental parameters. We then exploit these results to compare the frequency response of an EI system with respect of that of a free-space propagation XPCi one. The results achieved in this work can be useful for predicting the signals obtainable for different types of objects and also as a basis for new retrieval methods

Retrieving the signal from ultra-small-angle x-ray scattering with polychromatic radiation in speckle-tracking and beam-tracking phase-contrast imaging

We present an experimental comparison between two x-ray phase contrast imaging techniques currently under development, speckle-tracking and beam-tracking. The comparison is centred on the absorption and ultra-small-angle scattering signals retrieved with polychromatic radiation from homogeneous and inhomogeneous samples of different thicknesses. Our analysis shows that the ultra-small-angle scattering signal retrieved with speckle-tracking does not increase linearly with the thickness for the inhomogeneous sample, and is different from zero for the homogeneous sample. The results obtained from beam-tracking, instead, are in good agreement with expectation

Large field of view, fast and low dose multimodal phase-contrast imaging at high x-ray energy

X-ray phase contrast imaging (XPCI) is an innovative imaging technique which extends the contrast capabilities of ‘conventional’ absorption based x-ray systems. However, so far all XPCI implementations have suffered from one or more of the following limitations: low x-ray energies, small field of view (FOV) and long acquisition times. Those limitations relegated XPCI to a ‘research-only’ technique with an uncertain future in terms of large scale, high impact applications. We recently succeeded in designing, realizing and testing an XPCI system, which achieves significant steps toward simultaneously overcoming these limitations. Our system combines, for the first time, large FOV, high energy and fast scanning. Importantly, it is capable of providing high image quality at low x-ray doses, compatible with or even below those currently used in medical imaging. This extends the use of XPCI to areas which were unpractical or even inaccessible to previous XPCI solutions. We expect this will enable a long overdue translation into application fields such as security screening, industrial inspections and large FOV medical radiography – all with the inherent advantages of the XPCI multimodality