7 research outputs found
Crack initiation in tapered high Si stainless steel specimens – stress threshold analyses
Material degradation foreseen in the very long term: the case of glasses and ferrous metals
Examens et etudes metallurgiques de liaisons bimetalliques du circuit primaire principal
Available at INIST (FR), Document Supply Service, under shelf-number : 26165 A, issue : a.1995 n.187 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueSIGLEFRFranc