26 research outputs found
Field Emission from As-Grown and Ion-Beam-Sharpened Diamond Particles Deposited on Silicon Tips
Ion-beam bombardment/milling was used for sharpening of diamond particles deposited on ends of silicon tips. Radii curvature of diamond coating down to about 20 nm have been formed in such a way. Field emission experiments with sharpened diamond coated emitters have shown that the ion beam treatment effects a considerable shift of current-voltage characteristics of in the lower voltage region
Modification of Near-Surface Silicon Layers under Cesium Ion Bombardment
info:eu-repo/semantics/publishe