Increasing signal-to-noise ratio in over-determined Mueller matrices

This work investigates how the signal-to-noise ratio (SNR) of an over-determined Mueller matrix can be improved by changing the method of calculation. Specifically, our investigation focused on comparing SNRs achieved using the vector methodology from the field of partial Mueller polarimetry, and the matrix methodology. We use experimentally derived measurements from an investigation into the time-varying signal produced by the Mueller matrix of an electro-optic Bismuth Silicon Oxide (BSO) crystal undergoing cyclical impact of a Helium plasma ionisation wave. Our findings show that the vector methodology is superior to the matrix methodology, with a maximum SNR of 7.54 versus 4.97. We put forth that the superiority of the vector methodology is due to its greater flexibility, which results in the Mueller matrix being calculated with better condition matrices, and higher levels of SNR in the intensity measurements used for calculation.</p

A mid-infrared Mueller ellipsometer with pseudo-achromatic optical elements

The purpose of this article is to present a new broadband Mueller ellipsometer designed to work in the mid-infrared range, from 3 to 14 microns. The Mueller ellipsometer, which can be mounted in reflection or in transmission configuration, consists of a polarization state generator (PSG), a sample holder, and a polarization state analyzer (PSA). The PSG consists in one linear polarizer and a retarder sequentially rotated to generate a set of four optimal polarization states. The retarder consists in a bi-prism made of two identical Fresnel rhombs disposed symmetrically and joined by optical contact, giving the ensemble a "V" shape. Retardation is induced by the four total internal reflections that the beam undergoes when it propagates through the bi-prism. Total internal reflection allows to generate a quasi-achromatic retardation. The PSA is identical to the PSG, but with its optical elements mounted in reverse order. After a measurement run, the instrument yields a set of sixteen independent values, which is the minimum amount of data required to calculate the Mueller matrix of the sample. The design of the Mueller ellipsometer is based on the optimization of an objective criterion that allows minimizing the propagation of errors from raw data to the Mueller matrix of the sample. The pseudo-achromatic optical elements ensure a homogeneous quality of the measurements for all wavelengths. The performance of the Mueller ellipsometer in terms of precision, and accuracy, is discussed and illustrated with a few examples

Depolarizing metrics for plant samples imaging

Optical methods, as fluorescence microscopy or hyperspectral imaging, are commonly used for plants visualization and characterization. Another powerful collection of optical techniques is the so-called polarimetry, widely used to enhance image contrast in multiple applications. In the botanical applications framework, in spite of some works have already highlighted the depolarizing print that plant structures left on input polarized beams, the potential of polarimetric methods has not been properly exploited. In fact, among the few works dealing with polarization and plants, most of them study light scattered by plants using the Degree of Polarization (DoP) indicator. Other more powerful depolarization metrics are nowadays neglected. In this context, we highlight the potential of different depolarization metrics obtained using the Mueller matrix (MM) measurement: the Depolarization Index and the Indices of Polarimetric Purity. We perform a qualitative and quantitative comparison between DoP- and MM-based images by studying a particular plant, the Hedera maroccana. We show how Mueller-based metrics are generally more suitable in terms of contrast than DoP-based measurements. The potential of polarimetric measurements in the study of plants is highlighted in this work, suggesting they can be applied to the characterization of plants, plant taxonomy, water stress in plants, and other botanical studies

Absorbing photonic crystals for thin film photovoltaics

The absorption of thin hydrogenated amorphous silicon layers can be efficiently enhanced through a controlled periodic patterning. Light is trapped through coupling with photonic Bloch modes of the periodic structures, which act as an absorbing planar photonic crystal. We theoretically demonstrate this absorption enhancement through one or two dimensional patterning, and show the experimental feasibility through large area holographic patterning. Numerical simulations show over 50% absorption enhancement over the part of the solar spectrum comprised between 380 and 750nm. It is experimentally confirmed by optical measurements performed on planar photonic crystals fabricated by laser holography and reactive ion etching.Comment: 6 pages. SPIE Photonics Europe pape

Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives

This paper discusses the fundamentals, applications, potential, limitations, and future perspectives of polarized light reflection techniques for the characterization of materials and related systems and devices at the nanoscale. These techniques include spectroscopic ellipsometry, polarimetry, and reflectance anisotropy. We give an overview of the various ellipsometry strategies for the measurement and analysis of nanometric films, metal nanoparticles and nanowires, semiconductor nanocrystals, and submicron periodic structures. We show that ellipsometry is capable of more than the determination of thickness and optical properties, and it can be exploited to gain information about process control, geometry factors, anisotropy, defects, and quantum confinement effects of nanostructures

Workshop on advanced polarimetric instrumentation: API’09

The First NanoCharM Workshop on Advanced Polarimetric Instrumentation was focused on the instrumentation developed to work with polarised light, which is the cause of a great deal of research and study in a variety of fields, such as astronomy, telecommunications, defence, medicine, electronics, material science, metrology and many more. The workshop was therefore organised around six themes: imaging, astronomy and satellites, measurement of optical activity, Mueller matrix algebra and polarimetric data analysis, diffractometry and metrology of nanostructures, as well as new developments in polarimetric instrumentation. The workshop was founded by the European project NanoCharM the aim of which is, firstly, to coordinate research activities focusing on the characterisation of materials using polarised light (polarimetry) and, secondly, to develop communication initiatives to make scientists, decision-makers in the broadest sense of the term, industrialists and students aware of the various applications of polarised light

Polarimetric studies of polyethylene terephtalate flexible substrates

Polymer sheets are currently used worldwide in a wide range of applications. The manufacturing process of these sheets involves extruding machines that stretch the material in both lateral and longitudinal directions with respect to the machine direction, thus inducing birefringence. In most cases, the film obtained is optically biaxial. Polarimetric spectroscopy (Ellipsometry and Mueller Matrix) combined with conoscopic observation are the methods of choice to study these properties. In this work we report an analysis of commercially available polyethylene terephtalate (PET) films used as substrate for food packaging as well as for embedded electronic devices such as solar cells or flexible displays. Initial observation of these films through polarizing microscope in conoscopic mode reveals first the trace of optical axis plane with respect to the film surface and second, whether the optical axis is acute or not. This preliminary study allows optimal sample positioning for further polarimetric studies. The measurements and modelling are done in both reflection and transmission mode on several spectroscopic polarimetric setups from UV to NIR. The models give as a main result, the dielectric tensor of the film as well as its orientation with respect to the laboratory reference frame

Automatic pseudo-coloring approaches to improve visual perception and contrast in polarimetric images of biological tissues

Imaging polarimetry methods have proved their suitability to enhance the image contrast between tissues and structures in organic samples, or even to reveal structures hidden in regular intensity images. These methods are nowadays used in a wide range of biological applications, as for the early diagnosis of different pathologies. To include the discriminatory potential of different polarimetric observables in a single image, a suitable strategy reported in literature consists in associating different observables to different color channels, giving rise to pseudo-colored images helping the visualization of different tissues in samples. However, previous reported polarimetric based pseudo-colored images of tissues are mostly based on simple linear combinations of polarimetric observables whose weights are set ad-hoc, and thus, far from optimal approaches. In this framework, we propose the implementation of two pseudo-colored methods. One is based on the Euclidean distances of actual values of pixels and an average value taken over a given region of interest in the considered image. The second method is based on the likelihood for each pixel to belong to a given class. Such classes being defined on the basis of a statistical model that describes the statistical distribution of values of the pixels in the considered image. The methods are experimentally validated on four different biological samples, two of animal origin and two of vegetal origin. Results provide the potential of the methods to be applied in biomedical and botanical applications