47 research outputs found

    Thin films with high surface roughness: thickness and dielectric function analysis using spectroscopic ellipsometry

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    An optical surface roughness model is presented, which allows a reliable determination of the dielectric function of thin films with high surface roughnesses of more than 10 nm peak to valley distance by means of spectroscopic ellipsometry. Starting from histogram evaluation of atomic force microscopy (AFM) topography measurements a specific roughness layer (RL) model was developed for an organic thin film grown in vacuum which is well suited as an example. Theoretical description based on counting statistics allows generalizing the RL model developed to be used for all non-conducting materials. Finally, a direct input of root mean square (RMS) values found by AFM measurements into the proposed model is presented, which is important for complex ellipsometric evaluation models where a reduction of the amount of unknown parameters can be crucial. Exemplarily, the evaluation of a N,N’-dimethoxyethyl-3,4,9,10-perylene-tetracarboxylic-diimide (DiMethoxyethyl-PTCDI) film is presented, which exhibits a very high surface roughness, i.e. showing no homogeneous film at all

    Tip-Enhanced Raman Spectroscopy of 2D Semiconductors

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    Two-dimensional (2D) semiconductors are one of the most extensively studied modern materials showing potentials in large spectrum of applications from electronics/optoelectronics to photocatalysis and CO2 reduction. These materials possess astonishing optical, electronic, and mechanical properties, which are different from their bulk counterparts. Due to strong dielectric screening, local heterogeneities such as edges, grain boundaries, defects, strain, doping, chemical bonding, and molecular orientation dictate their physical properties to a great extent. Therefore, there is a growing demand of probing such heterogeneities and their effects on the physical properties of 2D semiconductors on site in a label-free and non-destructive way. Tip-enhanced Raman spectroscopy (TERS), which combines the merits of both scanning probe microscopy and Raman spectroscopy, has experienced tremendous progress since its introduction in the early 2000s and is capable of local spectroscopic investigation with (sub-) nanometer spatial resolution. Introducing this technique to 2D semiconductors not only enables us to understand the effects of local heterogeneities, it can also provide new insights opening the door for novel quantum mechanical applications. This book chapter sheds light on the recent progress of local spectroscopic investigation and chemical imaging of 2D semiconductors using TERS. It also provides a basic discussion of Raman selection rules of 2D semiconductors important to understand TERS results. Finally, a brief outlook regarding the potential of TERS in the field of 2D semiconductors is provided

    The Influence of Geometry on Plasmonic Resonances in Surface- and Tip-Enhanced Raman Spectroscopy

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    Plasmonic nanostructures have attracted growing interest over the last decades due to their efficiency in improving the performance in various application fields such as catalysis, photovoltaics, (opto-)electronic devices, and biomedicine. The behavior of a specific metal plasmonic system depends on many factors such as the material, the size, the shape, and the dielectric environment. The geometry, that is, size and shape of both single plasmonic elements and patterned arrays of plasmonic nanostructures, plays an essential role, and it provides considerable freedom to tune the plasmonic properties of a single plasmonic nanostructure or any combination of nanostructures. This freedom is mainly used in the application fields of surface-enhanced Raman spectroscopy (SERS) and tip-enhanced Raman spectroscopy (TERS). In this context, the chapter encompasses how the geometry of the SERS-active plasmonic nanostructures and tips with/without metal substrates used in TERS influences the localized surface plasmon resonances of the plasmonic systems

    DNA Structures on Silicon and Diamond

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    In the design of DNA-based hybrid devices, it is essential to have knowledgeof the structural, electronic and optical properties of these biomolecular films.Spectroscopic ellipsometry is a powerful technique to probe and asses these properties.In this chapter, we review its application to biomolecular films of single DNAbases and molecules on silicon and diamond surfaces characterized in the spectralrange from the near-infrared (NIR) through the visible (Vis) and toward the vacuumultraviolet (VUV). The reported optical constants of various DNA structures are ofgreat interest, particularly in the development of biosensors

    Microfluidic setup for on-line SERS monitoring using laser induced nanoparticle spots as SERS active substrate

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    A microfluidic setup which enables on-line monitoring of residues of malachite green (MG) using surface-enhanced Raman scattering (SERS) is reported. The SERS active substrate was prepared via laser induced synthesis of silver or gold nanoparticles spot on the bottom of a 200 μm inner dimension glass capillary, by focusing the laser beam during a continuous flow of a mixture of silver nitrate or gold chloride and sodium citrate. The described microfluidic setup enables within a few minutes the monitoring of several processes: the synthesis of the SERS active spot, MG adsorption to the metal surface, detection of the analyte when saturation of the SERS signal is reached, and finally, the desorption of MG from the spot. Moreover, after MG complete desorption, the regeneration of the SERS active spot was achieved. The detection of MG was possible down to 10−7 M concentration with a good reproducibility when using silver or gold spots as SERS substrate

    “Green” Aqueous Synthesis and Advanced Spectral Characterization of Size-Selected Cu2ZnSnS4 Nanocrystal Inks

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    Structure, composition, and optical properties of colloidal mercaptoacetate-stabilized Cu2ZnSnS4 (CZTS) nanocrystal inks produced by a “green” method directly in aqueous solutions were characterized. A size-selective precipitation procedure using 2-propanol as a non-solvent allows separating a series of fractions of CZTS nanocrystals with an average size (bandgap) varying from 3 nm (1.72 eV) to 2 nm (2.04 eV). The size-selected CZTS nanocrystals revealed also phonon confinement, with the main phonon mode frequency varying by about 4 cm−1 between 2 nm and 3 nm NCs
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