Real-Reward Testing for Probabilistic Processes (Extended Abstract)

We introduce a notion of real-valued reward testing for probabilistic processes by extending the traditional nonnegative-reward testing with negative rewards. In this richer testing framework, the may and must preorders turn out to be inverses. We show that for convergent processes with finitely many states and transitions, but not in the presence of divergence, the real-reward must-testing preorder coincides with the nonnegative-reward must-testing preorder. To prove this coincidence we characterise the usual resolution-based testing in terms of the weak transitions of processes, without having to involve policies, adversaries, schedulers, resolutions, or similar structures that are external to the process under investigation. This requires establishing the continuity of our function for calculating testing outcomes.Comment: In Proceedings QAPL 2011, arXiv:1107.074

Characterising Probabilistic Processes Logically

In this paper we work on (bi)simulation semantics of processes that exhibit both nondeterministic and probabilistic behaviour. We propose a probabilistic extension of the modal mu-calculus and show how to derive characteristic formulae for various simulation-like preorders over finite-state processes without divergence. In addition, we show that even without the fixpoint operators this probabilistic mu-calculus can be used to characterise these behavioural relations in the sense that two states are equivalent if and only if they satisfy the same set of formulae.Comment: 18 page

Signal processing in high speed OTDM networks

This paper presents the design and experimental results of an optical packet-switching testbed capable of performing message routing with single wavelength TDM packet bit rates as high as 100 Gb/s

Error control for reliable digital data transmission and storage systems

A problem in designing semiconductor memories is to provide some measure of error control without requiring excessive coding overhead or decoding time. In LSI and VLSI technology, memories are often organized on a multiple bit (or byte) per chip basis. For example, some 256K-bit DRAM's are organized in 32Kx8 bit-bytes. Byte oriented codes such as Reed Solomon (RS) codes can provide efficient low overhead error control for such memories. However, the standard iterative algorithm for decoding RS codes is too slow for these applications. In this paper we present some special decoding techniques for extended single-and-double-error-correcting RS codes which are capable of high speed operation. These techniques are designed to find the error locations and the error values directly from the syndrome without having to use the iterative alorithm to find the error locator polynomial. Two codes are considered: (1) a d sub min = 4 single-byte-error-correcting (SBEC), double-byte-error-detecting (DBED) RS code; and (2) a d sub min = 6 double-byte-error-correcting (DBEC), triple-byte-error-detecting (TBED) RS code

Bosonization and entanglement spectrum for one-dimensional polar bosons on disordered lattices

The extended Bose-Hubbard model subjected to a disordered potential is predicted to display a rich phase diagram. In the case of uniform random disorder one finds two insulating quantum phases -- the Mott-insulator and the Haldane insulator -- in addition to a superfluid and a Bose glass phase. In the case of a quasiperiodic potential further phases are found, eg the incommensurate density wave, adiabatically connected to the Haldane insulator. For the case of weak random disorder we determine the phase boundaries using a perturbative bosonization approach. We then calculate the entanglement spectrum for both types of disorder, showing that it provides a good indication of the various phases.Comment: Submitted to NJ