Total Dose Effects on Single Event Transients in Linear Bipolar Systems

Single Event Transients (SETs) originating in linear bipolar integrated circuits are known to undermine the reliability of electronic systems operating in the radiation environment of space. Ionizing particle radiation produces a variety of SETs in linear bipolar circuits. The extent to which these SETs threaten system reliability depends on both their shapes (amplitude and width) and their threshold energies. In general, SETs with large amplitudes and widths are the most likely to propagate from a bipolar circuit's output through a subsystem. The danger these SET pose is that, if they become latched in a follow-on circuit, they could cause an erroneous system response. Long-term exposure of linear bipolar circuits to particle radiation produces total ionizing dose (TID) and/or displacement damage dose (DDD) effects that are characterized by a gradual degradation in some of the circuit's electrical parameters. For example, an operational amplifier's gain-bandwidth product is reduced by exposure to ionizing radiation, and it is this reduction that contributes to the distortion of the SET shapes. In this paper, we compare SETs produced in a pristine LM124 operational amplifier with those produced in one exposed to ionizing radiation for three different operating configurations - voltage follower (VF), inverter with gain (IWG), and non-inverter with gain (NIWG). Each configuration produces a unique set of transient shapes that change following exposure to ionizing radiation. An important finding is that the changes depend on operating configuration; some SETs decrease in amplitude, some remain relatively unchanged, some become narrower and some become broader

Total Dose Effects on Error Rates in Linear Bipolar Systems

The shapes of single event transients in linear bipolar circuits are distorted by exposure to total ionizing dose radiation. Some transients become broader and others become narrower. Such distortions may affect SET system error rates in a radiation environment. If the transients are broadened by TID, the error rate could increase during the course of a mission, a possibility that has implications for hardness assurance

The Effects of Low Dose-Rate Ionizing Radiation on the Shapes of Transients in the LM124 Operational Amplifier

Shapes of single event transients (SETs) in a linear bipolar circuit (LM124) change with exposure to total ionizing dose (TID) radiation. SETs shape changes are a direct consequence of TID-induced degradation of bipolar transistor gain. A reduction in transistor gain causes a reduction in the drive current of the current sources in the circuit, and it is the lower drive current that most affects the shapes of large amplitude SETs

Étude de l'effet de débit de dose (une nouvelle approche de la fiabilité des technologies bipolaires pour l'environnement radiatif spatial)

MONTPELLIER-BU Sciences (341722106) / SudocSudocFranceF

Systèmes à fibres optiques pour infrastructures nucléaires (du durcissement aux radiations à l'application)

MONTPELLIER-BU Sciences (341722106) / SudocSudocFranceF

Mise au point et évaluation d'un système fibré de dosimétrie en ligne utilisant des matériaux phosphorescents stimulables optiquement (application à la mesure de dose en radiothérapie et au monitoring de faisceaux)

TOULOUSE3-BU Sciences (315552104) / SudocSudocFranceF

Characterization and development of radiation monitoring sensors for the high energy physics experiments of the CERN LHC accelerator

MONTPELLIER-BU Sciences (341722106) / SudocSudocFranceF

Etude des effets de dose et débit de dose sur des amplificateurs à technologies bipolaires. Mise en application sur le satellite Robusta.

L'agressivité de l'environnement radiatif spatial constitue une cause majeure de défaillance des composants et systèmes embarqués sur les satellites. Les transistors bipolaires sont sensibles au rayonnement ionisant et peuvent présenter un effet de débit de dose (ELDRS). Une plus forte dégradation est alors observée à faible débit de dose. Les normes actuelles de test ne permettent pas de prendre en compte entièrement cette sensibilité au débit. La nouvelle méthode de test dite des Débits commutés prend en compte cet effet d'ELDRS. Une charge utile développée sur le satellite Robusta et présentée ici va permettre une première validation de la méthode. Des amplificateurs classiques (VFA) dont la sensibilité en dose bien connue et induit des effets circuit, c'est-à-dire une dégradation non monotone des paramètres liés à des phénomènes antagonistes, seront embarqués sur le satellite robusta et serviront à la validation de la méthode. La charge utile du satellite est composée de LM124 et LM139. Le choix du faible débit et des différentes commutations appliquées s'est appuyé sur l'analyse radiation de la mission. Cette méthode a permis de tester les composants à faible débit de dose dans un temps moitié moindre qu'un test faible débit. Les résultats produits pourront par la suite, après mise en orbite de Robusta, être comparés à des données faible débit obtenues en vol.Une seconde étude sur des amplificateurs à convoyeur de courant (CFA), jusque là très peu étudiés, a démontré la sensibilité à la dose de ce type d'amplificateur et mis en évidence de nouveaux effets circuits. Cette étude a été réalisée au moyen de trois types d'irradiations différentes et s'appuie sur une analyse circuit. Les irradiations et l'étude circuit menées ont montré que l'amplitude des dégradations des différents paramètres étudiés est aléatoire et dépend de la symétrie plus ou moins parfaite du circuit : une différence de process entre deux transistors va induire une dégradation plus ou moins importante des paramètres. Ces premiers travaux serviront de base à différentes études, et notamment à l'étude des effets de synergie dose/SET ou de synergie dose/CEM sur les CFA.The aggressive space radiation environment constitutes a major cause of failure for components and systems on board the satellites. Bipolar transistors are know to be sensitive to ionizing radiation and may present dose rate effect (ELDRS). A greater degradation is observed at low dose rate. Current standards test methods can not fully take into account this sensitivity to the dose rate. The new Dose rate Switching test methodology takes into account this ELDRS effect. A Payload developed on the Robusta satellite and presented here will allow a first validation of the method. Classical amplifier (VFA) whose dose rate sensibility is well known and induce circuit effects, that means a non monotonous degradation of parameters related to antagonist phenomena, will be loaded on board Robusta satellite and used to validated the method. The satellite Payload is composed of LM124 and LM139. The low dose rate choice and the different switching applied relied on mission radiation analysis. This method allowed to reproduce the dose induced degradation of the components in half the time it takes at low dose rate. The results produced can then, after Robusta is launched, be compared to low dose rate data obtained in flight. A second study on current conveyor amplifier (CFA), so far very little studied, demonstrated the sensitivity to ionizing dose of this type of amplifier and identified new effects circuits. This study was conducted using three different types of irradiation and based on a circuit analysis. Irradiations and circuit analysis have shown that the amplitude of the degradation measured on the different parameters studied is erratic and depends on the perfect symmetry of the circuit: a slight discrepancy in the process between two transistors will induce a more or less significant symmetry in the parameters degradation. This early work will be a base for various studies, including the study of synergy dose/SET or synergy dose/EMC on CFA.MONTPELLIER-BU Sciences (341722106) / SudocSudocFranceF

Origin of High Total Dose Sensitivity on the OP400 Bipolar Operational Amplifier

International audienc

Packaging effects on RadFET sensors for high energy physics experiments

RadFETs in customized chip carrier packages are installed in the LHC Experiments as radiation monitors. The package influence on the dose measurement in the complex LHC radiation environment is evaluated using Geant4 simulations and experimental data