771 research outputs found

    Development of EM-CCD-based X-ray detector for synchrotron applications

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    A high speed, low noise camera system for crystallography and X-ray imaging applications is developed and successfully demonstrated. By coupling an electron-multiplying (EM)-CCD to a 3:1 fibre-optic taper and a CsI(Tl) scintillator, it was possible to detect hard X-rays. This novel approach to hard X-ray imaging takes advantage of sub-electron equivalent readout noise performance at high pixel readout frequencies of EM-CCD detectors with the increase in the imaging area that is offered through the use of a fibre-optic taper. Compared with the industry state of the art, based on CCD camera systems, a high frame rate for a full-frame readout (50 ms) and a lower readout noise (<1 electron root mean square) across a range of X-ray energies (6–18 keV) were achieved

    Image lag optimisation in a 4T CMOS image sensor for the JANUS camera on ESA's JUICE mission to Jupiter

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    The CIS115, the imager selected for the JANUS camera on ESA’s JUICE mission to Jupiter, is a Four Transistor (4T) CMOS Image Sensor (CIS) fabricated in a 0.18 µm process. 4T CIS (like the CIS115) transfer photo generated charge collected in the pinned photodiode (PPD) to the sense node (SN) through the Transfer Gate (TG). These regions are held at different potentials and charge is transferred from the potential well under PPD to the potential well under the FD through a voltage pulse applied to the TG. Incomplete transfer of this charge can result in image lag, where signal in previous frames can manifest itself in subsequent frames, often appearing as ghosted images in successive readouts. This can seriously affect image quality in scientific instruments and must be minimised. This is important in the JANUS camera, where image quality is essential to help JUICE meet its scientific objectives. This paper presents two techniques to minimise image lag within the CIS115. An analysis of the optimal voltage for the transfer gate voltage is detailed where optimisation of this TG “ON” voltage has shown to minimise image lag in both an engineering model and gamma and proton irradiated devices. Secondly, a new readout method of the CIS115 is described, where following standard image integration, the PPD is biased to the reset voltage level (VRESET) through the transfer gate to empty charge on the PPD and has shown to reduce image lag in the CIS115

    Determination of Hammett Pyridine 3-Aza and 4-Aza Replacement Constants by 1H NMR Studies of Amide Systems

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    Values for Hammett pyridine 3-aza and 4-aza replacement constants were obtained by correlation of the amide proton chemical shifts (in DMSO) of some N-(3-pyridyl)-and N-(4-pyridyl)-dichloronicotinamides, benzamides and acetamides with those of their N-(substituted phenyl) amide analogs using standard Hammett a value

    Soft X-ray radiation damage in EM-CCDs used for Resonant Inelastic X-ray Scattering

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    Advancement in synchrotron and free electron laser facilities means that X-ray beams with higher intensity than ever before are being created. The high brilliance of the X-ray beam, as well as the ability to use a range of X-ray energies, means that they can be used in a wide range of applications. One such application is Resonant Inelastic X-ray Scattering (RIXS). RIXS uses the intense and tuneable X-ray beams in order to investigate the electronic structure of materials. The photons are focused onto a sample material and the scattered X-ray beam is diffracted off a high resolution grating to disperse the X-ray energies onto a position sensitive detector. Whilst several factors affect the total system energy resolution, the performance of RIXS experiments can be limited by the spatial resolution of the detector used. Electron-Multiplying CCDs (EM-CCDs) at high gain in combination with centroiding of the photon charge cloud across several detector pixels can lead to sub-pixel spatial resolution of 2–3 μm. X-ray radiation can cause damage to CCDs through ionisation damage resulting in increases in dark current and/or a shift in flat band voltage. Understanding the effect of radiation damage on EM-CCDs is important in order to predict lifetime as well as the change in performance over time. Two CCD-97s were taken to PTB at BESSY II and irradiated with large doses of soft X-rays in order to probe the front and back surfaces of the device. The dark current was shown to decay over time with two different exponential components to it. This paper will discuss the use of EM-CCDs for readout of RIXS spectrometers, and limitations on spatial resolution, together with any limitations on instrument use which may arise from X-ray-induced radiation damage

    Characteristics of Anodic Film on Aluminium in Borate Bath

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    Improving radiation hardness in space-based Charge-Coupled Devices through the narrowing of the charge transfer channel

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    Charge-Coupled Devices (CCDs) have been the detector of choice for imaging and spectroscopy in space missions for several decades, such as those being used for the Euclid VIS instrument and baselined for the SMILE SXI. Despite the many positive properties of CCDs, such as the high quantum efficiency and low noise, when used in a space environment the detectors suffer damage from the often-harsh radiation environment. High energy particles can create defects in the silicon lattice which act to trap the signal electrons being transferred through the device, reducing the signal measured and effectively increasing the noise. We can reduce the impact of radiation on the devices through four key methods: increased radiation shielding, device design considerations, optimisation of operating conditions, and image correction. Here, we concentrate on device design operations, investigating the impact of narrowing the charge-transfer channel in the device with the aim of minimising the impact of traps during readout. Previous studies for the Euclid VIS instrument considered two devices, the e2v CCD204 and CCD273, the serial register of the former having a 50 ÎĽm channel and the latter having a 20 ÎĽm channel. The reduction in channel width was previously modelled to give an approximate 1.6Ă— reduction in charge storage volume, verified experimentally to have a reduction in charge transfer inefficiency of 1.7Ă—. The methods used to simulate the reduction approximated the charge cloud to a sharp-edged volume within which the probability of capture by traps was 100%. For high signals and slow readout speeds, this is a reasonable approximation. However, for low signals and higher readout speeds, the approximation falls short. Here we discuss a new method of simulating and calculating charge storage variations with device design changes, considering the absolute probability of capture across the pixel, bringing validity to all signal sizes and readout speeds. Using this method, we can optimise the device design to suffer minimum impact from radiation damage effects, here using detector development for the SMILE mission to demonstrate the process

    Proton irradiation of the CIS115 for the JUICE mission

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    The CIS115 is one of the latest CMOS Imaging Sensors designed by e2v technologies, with 1504x2000 pixels on a 7 μm pitch. Each pixel in the array is a pinned photodiode with a 4T architecture, achieving an average dark current of 22 electrons pixel-1 s-1 at 21°C measured in a front-faced device. The sensor aims for high optical sensitivity by utilising e2v’s back-thinning and processing capabilities, providing a sensitive silicon thickness approximately 9 μm to 12 μm thick with a tuned anti-reflective coating. The sensor operates in a rolling shutter mode incorporating reset level subtraction resulting in a mean pixel readout noise of 4.25 electrons rms. The full well has been measured to be 34000 electrons in a previous study, resulting in a dynamic range of up to 8000. These performance characteristics have led to the CIS115 being chosen for JANUS, the high-resolution and wide-angle optical camera on the JUpiter ICy moon Explorer (JUICE). The three year science phase of JUICE is in the harsh radiation environment of the Jovian magnetosphere, primarily studying Jupiter and its icy moons. Analysis of the expected radiation environment and shielding levels from the spacecraft and instrument design predict the End Of Life (EOL) displacement and ionising damage for the CIS115 to be equivalent to 1010 10 MeV protons cm-2 and 100 krad(Si) respectively. Dark current and image lag characterisation results following initial proton irradiations are presented, detailing the initial phase of space qualification of the CIS115. Results are compared to the pre-irradiation performance and the instrument specifications and further qualification plans are outlined

    Improving the spatial resolution of a soft X-ray Charge Coupled Device used for Resonant Inelastic X-ray Scattering

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    The Super Advanced X-ray Emission Spectrometer (SAXES) at the Advanced Resonant Scattering (ADRESS) beamline of the Swiss Light Source is a high-resolution X-ray spectrometer used as an end station for Resonant Inelastic X-ray Scattering from 400 eV to 1600 eV. Through the dispersion of photons across a CCD, the energy of scattered photons may be determined by their detected spatial position. The limiting factor of the energy resolution is currently the spatial resolution achieved with the CCD, reported at 24 ÎĽm FWHM. For this energy range the electron clouds are formed by interactions in the `field free' region of the back-illuminated CCD. These clouds diffuse in all directions whilst being attracted to the electrodes, leading to events that are made up of signals in multiple pixels. The spreading of the charge allows centroiding techniques to be used to improve the CCD spatial resolution and therefore improve the energy resolution of SAXES. The PolLux microscopy beamline at the SLS produces an X-ray beam with a diameter of 20 nm. The images produced from scanning the narrow beam across CCD pixels (13.5 x 13.5 ÎĽm2 ) can aid in the production of event recognition algorithms, allowing the matching of event profiles to photon interactions in a specific region of a pixel. Through the use of this information software analysis can be refined with the aim of improving the energy resolution
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