Structure and texture of the quark mass matrix

Starting from a weak basis in which the up (or down) quark matrix is diagonal, we obtain an exact set of equations for the quark mass matrix elements in terms of known observables. We make a numerical analysis of the down (up) quark mass matrix. Using the data available for the quark masses and mixing angles at different energy scales, we found a numerical expression for these matrices. We suggest that it is not possible to have an specific texture from this analysis. We also examine the most general case when the complex phases are introduced in the mass matrix. We find the numerical value for these phases as a function of $\delta$, the CP-violationg phase.Comment: 7 pages, we use the macros of Elsevie

Individual variation in the antisnake behavior of California ground squirrels (Spermophilus beecheyi)

California ground squirrels (Spermophilus beecheyi) have evolved behavioral defenses against their two predators, the northern Pacific rattlesnake (Crotalus viridis oreganus) and Pacific gopher snake (Pituophis melanoleucus catenifer). Two studies were used to examine individual variation in antisnake behavior as it might be affected by selection operating on arousability, fearfulness, and aggressiveness. In Study 1 the behavioral consistency of two litters of lab-reared juveniles was examined at two age periods during encounters with a caged gopher snake and domestic cat. Close-range investigation and tail flagging appeared to be governed by short-term motivational states that were not strongly correlated across age. Age correlations revealed that individual tendencies to throw substrate were relatively consistent for the snake and even more so for the cat. In Study 2, wild-caught adults were obtained from five sites where rattlesnakes and gopher snakes were abundant and from five sites where these snakes were rare or absent. Squirrels in a seminatural laboratory setting were given balanced presentations of a caged rattlesnake and gopher snake separated by 5 days. Snakes were recognized by all squirrels as potentially dangerous, irrespective of experience, age, and selective regime. Substrate throwing also was positively correlated for the two snakes in both groups of adults, indicating that level of aggressiveness is a consistent component of temperament not specific to species of snakes. Physiological arousal was not correlated strongly for the two snakes, but it was significantly lower in squirrels from sites where snakes were abundant. This suggests some specialization to reduce anxiety that possibly enhances tactical decision making

Total-dose radiation effects data for semiconductor devices. 1985 supplement. Volume 2, part A

Steady-state, total-dose radiation test data, are provided in graphic format for use by electronic designers and other personnel using semiconductor devices in a radiation environment. The data were generated by JPL for various NASA space programs. This volume provides data on integrated circuits. The data are presented in graphic, tabular, and/or narrative format, depending on the complexity of the integrated circuit. Most tests were done using the JPL or Boeing electron accelerator (Dynamitron) which provides a steady-state 2.5 MeV electron beam. However, some radiation exposures were made with a Cobalt-60 gamma ray source, the results of which should be regarded as only an approximate measure of the radiation damage that would be incurred by an equivalent electron dose

Total-dose radiation effects data for semiconductor devices: 1985 supplement, volume 1

Steady-state, total-dose radiation test data are provided, in graphic format, for use by electronic designers and other personnel using semiconductor devices in a radiation environment. The data were generated by JPL for various NASA space programs. The document is in two volumes: Volume 1 provides data on diodes, bipolar transistors, field effect transistors, and miscellaneous semiconductor types, and Volume 2 provides total-dose radiation test data on integrated circuits. Volume 1 of this 1985 Supplement contains new total-dose radiation test data generated since the August 1, 1981 release date of the original Volume 1. Publication of Volume 2 of the 1985 Supplement will follow that of Volume 1 by approximately three months

Heavy ion induced Single Event Phenomena (SEP) data for semiconductor devices from engineering testing

The accumulation of JPL data on Single Event Phenomena (SEP), from 1979 to August 1986, is presented in full report format. It is expected that every two years a supplement report will be issued for the follow-on period. This data for 135 devices expands on the abbreviated test data presented as part of Refs. (1) and (3) by including figures of Single Event Upset (SEU) cross sections as a function of beam Linear Energy Transfer (LET) when available. It also includes some of the data complied in the JPL computer in RADATA and the SPACERAD data bank. This volume encompasses bipolar and MOS (CMOS and MHNOS) device data as two broad categories for both upsets (bit-flips) and latchup. It also includes comments on less well known phenomena, such as transient upsets and permanent damage modes