Fluorescence correlation spectroscopy in thin films at reflecting substrates as a means to study nanoscale structure and dynamics at soft-matter interfaces

Structure and dynamics at soft-matter interfaces play an important role in nature and technical applications. Optical single-molecule investigations are non-invasive and capable to reveal heterogeneities at the nanoscale. In this work we develop an autocorrelation function (ACF) approach to retrieve tracer diffusion parameters obtained from fluorescence correlation spectroscopy (FCS) experiments in thin liquid films at reflecting substrates. This approach then is used to investigate structure and dynamics in 100 nm thick 8CB liquid crystal films on silicon wafers with five different oxide thicknesses. We find a different extension of the structural reorientation of 8CB at the solid-liquid interface for thin and for thick oxide. For the thin oxides, the perylenediimide tracer diffusion dynamics in general agrees with the hydrodynamic modeling using no-slip boundary conditions with only a small deviation close to the substrate, while a considerably stronger decrease of the interfacial tracer diffusion is found for the thick oxides.Comment: 8 figure

Investigations of heterogeneous diffusion based on the probability density of scaled squared displacements observed from single molecules in ultra-thin liquid films

Diffusion processes in ultra-thin liquid films observed by video microscopy reveal a complex behavior. In contrast to homogeneous diffusion, dynamic and static heterogeneities are induced by layer transitions and compartments with differing diffusion coefficients, respectively. The objective of this research is the detection and distinction of such heterogeneities as well as an analysis of the underlying processes. Hence, a new method is proposed establishing a probability density of scaled squared displacements. This probability density allows for a simple and well-defined calculation of time-dependent diffusion coefficients and its fluctuations. Furthermore, by simulating a heterogeneous diffusion process these results are verified and compared to mean square displacement calculations. By means of the simulated probability density data, their dependency on the parameters is illustrated and further implications are pointed out

Investigations of solid liquid interfaces in ultra-thin liquid films via single particle tracking of silica particles

Single particle tracking with a wide field microscope is used to study the solid liquid interface between the viscous liquid tetrakis(2 ethylhexoxy)-silane and a silicon dioxide surface. Silicon dioxide nanoparticles (5 nm diameter) marked with the fluorescent dye rhodamine 6G are used as probes. The distributions of diffusion coefficients, obtained by mean squared displacements, reveal heterogeneities with at least two underlying diffusion components. Measurements on films with varying film thicknesses show that the slower component is independent of the film thickness, while the faster one increases with the film thickness. Additionally, we could show that the diffusion behavior of the particles cannot be sufficiently described by only two diffusion coefficients

Single molecule tracking of the molecular mobility in thinning liquid films on thermally grown SiO 2

Diffusion coefficients obtained from weighted mean square displacements along probe molecule trajectories within ultrathin liquid TEHOS films show a correlation with film thickness. By studying cumulative distributions obtained with a time resolution of 20 ms, we could show that the diffusion is heterogeneous within our liquid films which consist of a few molecular layers only. We detected two components of the diffusion process, a slower and a faster one. Thinning of the film due to evaporation caused a slowdown of the whole diffusion process. But this resulted not from a slowdown in the two contributing components itself. Instead their relative contributions changed in favor for the slow component. We conclude that there is no pronounced difference in the diffusion coefficients attributed to the molecular layers 3 to 5 vertically above the substrate, but with the loss of upper layers along with the thinning process the concentration of probe molecules in the near surface region containing only one or two molecular layers is increased