Fast Structure Determination of Electrode Surfaces for Investigating Electrochemical Dynamics Using Wavelength-Dispersive X‑ray Crystal Truncation Rod Measurements

Determining the atomic structure across electrolyte–electrode interfaces with a sufficient temporal resolution is crucial to understanding how electrochemical reactions proceed. Surface X-ray diffraction is a well-established method for determining interface structures at the atomic scale. However, existing measurement methods are often incapable of quantifying time-dependent structural changes during electrochemical processes because acquiring a diffraction rod profile sufficient for structure determination usually takes a longer time than the rate of the structural changes. This report demonstrates that the wavelength-dispersive method, which can acquire a range of the diffraction rod profile at once, is capable of the time-resolved analysis of electrochemical dynamics on a time scale of seconds and less, using electrochemical reactions on Pt(111) electrode surface as examples. In the case of the electrochemical oxidation of methanol, the quantitative analysis of the transient vertical displacement of the Pt(111) surface atomic layer gives evidence for a structural relaxation of the CO poisoning layer during its oxidative stripping. Present limitations and future prospects of the method are also discussed