Evidence of light guiding in ion-implanted diamond

We demonstrate the feasibility of fabricating light-waveguiding microstructures in bulk single-crystal diamond by means of direct ion implantation with a scanning microbeam, resulting in the modulation of the refractive index of the ion-beam damaged crystal. Direct evidence of waveguiding through such buried microchannels is obtained with a phase-shift micro-interferometric method allowing the study of the multimodal structure of the propagating electromagnetic field. The possibility of defining optical and photonic structures by direct ion writing opens a range of new possibilities in the design of quantumoptical devices in bulk single-crystal diamond

Micro-beam and pulsed laser beam techniques for the micro-fabrication of diamond surface and bulk structures

Micro-fabrication in diamond is involved in a wide set of emerging technologies, exploiting the exceptional characteristics of diamond for application in bio-physics, photonics, radiation detection. Micro ion-beam irradiation and pulsed laser irradiation are complementary techniques, which permit the implementation of complex geometries, by modification and functionalization of surface and/or bulk material, modifying the optical, electrical and mechanical characteristics of the material. In this article we summarize the work done in Florence (Italy) concerning ion beam and pulsed laser beam micro-fabrication in diamond.Comment: 14 pages, 5 figure

Optical characterization of proton irradiated diamond

ABSTRACT Manufacturing of miniaturized photonic devices based on diamond technology is possible by implanting the pristine material with highly energetic particles. Here we report on the spectral characterization of the optical constants of proton-irradiated diamond. Absorption of the irradiated zones was estimated in the UV-vis-NIR from direct transmittance measurement using a dedicated setup with enhanced spatial resolution. The OPD data providing an estimation of the thickness of the damaged area and its depth profile, have allowed then evaluation of the extinction coefficient from the transmission measurements. Simultaneous variation of dispersive optical constants makes the modeling significantly more complicated compared to the above cited monochromatic study. Keywords: Optical constants; Diamond crystal; Ion implantation 1. INTRODUCTION Manufacturing of miniaturized photonic devices based on diamond technology is possible by implanting the pristine material with highly energetic particles. Theoretically the optical constants of irradiated material may vary from the values typical for pristine diamond to those of graphite, however only precise knowledge of the optical constants allows calculation of performance of the novel photonic micro- and nano-devices like e.g. diamond-based waveguiding structure

Refractive index variation in a free-standing diamond thin film induced by irradiation with fully transmitted high-energy protons

Ion irradiation is a widely employed tool to fabricate diamond micro- and nano-structures for applications in integrated photonics and quantum optics. In this context, it is essential to accurately assess the effect of ion-induced damage on the variation of the refractive index of the material, both to control the side effects in the fabrication process and possibly finely tune such variations. Several partially contradictory accounts have been provided on the effect of the ion irradiation on the refractive index of single crystal diamond. These discrepancies may be attributable to the fact that in all cases the ions are implanted in the bulk of the material, thus inducing a series of concurrent effects (volume expansion, stress, doping, etc.). Here we report the systematic characterization of the refractive index variations occurring in a 38 µm thin artificial diamond sample upon irradiation with high-energy (3 MeV and 5 MeV) protons. In this configuration the ions are fully transmitted through the sample, while inducing an almost uniform damage profile with depth. Therefore, our findings conclusively identify and accurately quantify the change in the material polarizability as a function of ion beam damage as the primary cause for the modification of its refractive index

Evaluation of particle-induced X-ray emission and particle-induced γ-ray emission of quartz grains for forensic trace sediment analysis.

The independent verification in a forensics context of quartz grain morphological typing by scanning electron microscopy was demonstrated using particle-induced X-ray emission (PIXE) and particle-induced γ-ray emission (PIGE). Surface texture analysis by electron microscopy and high-sensitivity trace element mapping by PIXE and PIGE are independent analytical techniques for identifying the provenance of quartz in sediment samples in forensic investigations. Trace element profiling of the quartz grain matrix separately from the quartz grain inclusions served to differentiate grains of different provenance and indeed went some way toward discriminating between different quartz grain types identified in a single sample of one known forensic provenance. These results confirm the feasibility of independently verifying the provenance of critical samples from forensic cases

Evaluation of particle-induced X-ray emission and particle-induced γ-ray emission of quartz grains for forensic trace sediment analysis.

The independent verification in a forensics context of quartz grain morphological typing by scanning electron microscopy was demonstrated using particle-induced X-ray emission (PIXE) and particle-induced γ-ray emission (PIGE). Surface texture analysis by electron microscopy and high-sensitivity trace element mapping by PIXE and PIGE are independent analytical techniques for identifying the provenance of quartz in sediment samples in forensic investigations. Trace element profiling of the quartz grain matrix separately from the quartz grain inclusions served to differentiate grains of different provenance and indeed went some way toward discriminating between different quartz grain types identified in a single sample of one known forensic provenance. These results confirm the feasibility of independently verifying the provenance of critical samples from forensic cases