17 research outputs found
Imaging columns of the light elements carbon, nitrogen and oxygen with sub Ã…ngstrom resolution
Recommended from our members
HREM AT ORTHOGONAL PROJECTIONS OF GAAS ISLANDS ON SILICON
HREM studies typically examine only one projection of a structure and information in the electron beam direction is lost. In most cases, the structure in this direction is uniform and already known, but in others a second projection needs to be observed. This could involve preparing a second specimen sectioned at right angles to the first, or as described here, tilting a specimen through /plus minus/45/degree/ and observing the same volume in orthogonal projections. The specimen used here was of GaAs islands on silicon, examined in the Atomic Resolution Microscope at LBL. 5 refs., 2 figs
Recommended from our members
HIGH RESOLUTION ELECTRON MICROSCOPY OF INTERFACES IN TOPOTAXIAL AND EPITAXIAL REACTIONS
Recommended from our members
Simulated Image Maps for Use in Experimental High-Resolution Microscopy
Recommended from our members
FURTHER EVIDENCE FOR THE PRESENCE OF C = 38.2 A[ANGSTROM] PHASE IN A BI-CA-SR-CU-O SUPERCONDUCTOR
Recommended from our members
SAMPLE PREPARATION OF YBa2Cu3O7- FOR HIGH RESOLUTION ELECTRON MICROSCOPY
Recommended from our members