Application of CO2 Snow Jet Cleaning in Conjunction with Laboratory Based Total Reflection X-Ray Fluorescence

The Genesis mission was the first mission returning solar material to Earth since the Apollo program [1,2]. Unfortunately the return of the space craft on September 8, 2004 resulted in a crash landing, which shattered the samples into small fragments and exposed them to desert soil and other debris. Thus only small fragments of the original collectors are available, each having different degrees of surface contamination. Thorough surface cleaning is required to allow for subsequent analysis of solar wind material embedded within. An initial cleaning procedure was developed in coordination with Johnson Space Center which focused on removing larger sized particulates and a thin film organic contamination acquired during collection in space [3]. However, many of the samples have additional residues and more rigorous and/or innovative cleaning steps might be necessary. These cleaning steps must affect only the surface to avoid leaching and re-distribution of solar wind material from the bulk of the collectors. To aid in development and identification of the most appropriate cleaning procedures each sample has to be thoroughly inspected before and after each cleaning step. Laboratory based total reflection X-ray fluorescence (TXRF) spectrometry lends itself to this task as it is a non-destructive and surface sensitive analytical method permitting analysis of elements from aluminum onward present at and near the surface of a flat substrate [4]. The suitability of TXRF has been demonstrated for several Genesis solar wind samples before and after various cleaning methods including acid treatment, gas cluster ion beam, and CO2 snow jet [5 - 7]. The latter one is non-invasive and did show some promise on one sample [5]. To investigate the feasibility of CO2 snow jet cleaning further, several flown Genesis samples were selected to be characterized before and after CO2 snow application with sample 61052 being discussed below

Estimation of useful yield in surface analysis using single photon ionisation

Secondary ion mass spectrometry (SIMS), laser sputter neutral mass spectrometry (SNMS) and laser desorption photoionisation (LDPI) have been used to investigate the desorption of molecules from self-assembled monolayers of phenylsulphides. LDPI, using an F₂ excimer laser to single photon ionise gave the lowest fragmentation. A useful yield greater than 0.5% was found for analysis of diphenyldisulphide self-assembled monolayers. It is shown that using a free electron laser to postionise will lead, in the future, to analysis of many atoms and molecules with useful yields approaching 30%

RIMS analysis of Ca and Cr in Genesis solar wind collectors

RIMS depth profiles have been measured for Cr and Ca in Genesis solar wind collector made from Si and compared to such measurements for ion-implanted Si reference material. The presence of surface contamination has been shown to be a significant factor influencing the total Ca and Cr fluence measured in the Genesis collectors. A procedure to remove the contaminant signal from these depth profiles using the reference material implanted with a minor isotope demonstrated that 36% of the measured Ca fluence in our Genesis sample comes from terrestrial contamination