22,410 research outputs found

    MC/DC based estimation and detection of residual faults in PLC logic networks

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    A logic coverage measure related to MC/DC testing is used to estimate residual faults. The residual fault prediction method is evaluated on an industrial PLC logic example. A randomized form of MC/DC testing is used to maximize coverage growth and fault detection efficiency

    Worst Case Reliability Prediction Based on a Prior Estimate of Residual Defects

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    In this paper we extend an earlier worst case bound reliability theory to derive a worst case reliability function R(t), which gives the worst case probability of surviving a further time t given an estimate of residual defects in the software N and a prior test time T. The earlier theory and its extension are presented and the paper also considers the case where there is a low probability of any defect existing in the program. For the "fractional defect" case, there can be a high probability of surviving any subsequent time t. The implications of the theory are discussed and compared with alternative reliability models
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