FMR and magnetization study of NiFe/Ag/CoNi trilayer film

The polycrystalline FeNi/Ag/CoNi asymmetric trilayer films were prepared by the UHV magnetron sputtering on silicon. In plane magnetization measurements showed double-step hysteresis loops. Magnetoresistancc (MR) measurements revealed giant magnetoresistance effect with magnitudes in 0. 15-0. 29% range at room temperature. The saturation magnetizations and the interaction between layers were studied by ferromagnetic resonance and revealed an undistinguishably weak interlayer coupling from out-of-plane geometry of measurements. The MR data are interpreted based on the incomplete domain alignment model for polycrystalline magnetic films. © 1998 IEEE

A magnetization and GMR study on multilayered Fe/Ag/Co thin film

Single layer Fe(20Å) and Co(20Å) and multilayered Ag(20Å)/[Fe(20Å)/Ag(40Å) /Co(20Å)/Ag (40Å)]x3 /Ag(20Å) films were prepared in UHV by magnetron sputtering technique onto the silicon substates. Films were determined to have polycrystalline nature through SEM examination. Magnetization measurements were made on single and multilayer films. Due to the polycrystalline structure of the films, rounded magnetization curves were obtained. The GMR effect showed a rounded behaviour which also is an indication of the polycrystallinity of the films. The GMR effect, measured in Fe/Ag/Co multilayer structure, was analyzed with the help of magnetization behaviour of the multilayer structure and magnetization behaviour of the single layer films Fe(20Å)and Co(20Å)

All-normal-dispersion fiber lasers for frequency metrology

Development of an all-normal-dispersion Yb-doped fiber laser-based frequency comb is reported. Repetition-frequency stabilization to the cesium standard, amplitude and phase noise measurements indicate low-noise performance. © 2011 OSA

FMR and magnetization study of NiFe/Ag/CoNi trilayer film

The polycrystalline FeNi/Ag/CoNi asymmetric trilayer films were prepared by the UHV magnetron sputtering on silicon. In plane magnetization measurements showed double-step hysteresis loops. Magnetoresistancc (MR) measurements revealed giant magnetoresistance effect with magnitudes in 0. 15-0. 29% range at room temperature. The saturation magnetizations and the interaction between layers were studied by ferromagnetic resonance and revealed an undistinguishably weak interlayer coupling from out-of-plane geometry of measurements. The MR data are interpreted based on the incomplete domain alignment model for polycrystalline magnetic films. © 1998 IEEE

FMR and magnetization study of NiFe/Ag/CoNi trilayer film

The polycrystalline FeNi/Ag/CoNi asymmetric trilayer films were prepared by the UHV magnetron sputtering on silicon. In plane magnetization measurements showed double-step hysteresis loops. Magnetoresistancc (MR) measurements revealed giant magnetoresistance effect with magnitudes in 0. 15-0. 29% range at room temperature. The saturation magnetizations and the interaction between layers were studied by ferromagnetic resonance and revealed an undistinguishably weak interlayer coupling from out-of-plane geometry of measurements. The MR data are interpreted based on the incomplete domain alignment model for polycrystalline magnetic films. © 1998 IEEE

FMR and magnetization study of NiFe/Ag/CoNi trilayer film

The polycrystalline FeNi/Ag/CoNi asymmetric trilayer films were prepared by the UHV magnetron sputtering on silicon. In plane magnetization measurements showed double-step hysteresis loops. Magnetoresistancc (MR) measurements revealed giant magnetoresistance effect with magnitudes in 0. 15-0. 29% range at room temperature. The saturation magnetizations and the interaction between layers were studied by ferromagnetic resonance and revealed an undistinguishably weak interlayer coupling from out-of-plane geometry of measurements. The MR data are interpreted based on the incomplete domain alignment model for polycrystalline magnetic films. © 1998 IEEE

Comparison of the performance of the next generation of optical interferometers

Six European National Measurement Institutes (NMIs) have joined forces within the European Metrology Research Programme funded project NANOTRACE to develop the next generation of optical interferometers having a target uncertainty of 10 pm. These are needed for NMIs to provide improved traceable dimensional metrology that can be disseminated to the wider nanotechnology community, thereby supporting the growth in nanotechnology. Several approaches were followed in order to develop the interferometers. This paper briefly describes the different interferometers developed by the various partners and presents the results of a comparison of performance of the optical interferometers using an x-ray interferometer to generate traceable reference displacements