In situ compression tests on micron-sized silicon pillars by Raman microscopy—Stress measurements and deformation analysis

Mechanical properties of silicon are of high interest to the microelectromechanical systems community as it is the most frequently used structural material. Compression tests on 8 μm diameter silicon pillars were performed under a micro-Raman setup. The uniaxial stress in the micropillars was derived from a load cell mounted on a microindenter and from the Raman peak shift. Stress measurements from the load cell and from the micro-Raman spectrum are in excellent agreement. The average compressive failure strength measured in the middle of the micropillars is 5.1 GPa. Transmission electron microscopy investigation of compressed micropillars showed cracks at the pillar surface or in the core. A correlation between crack formation and dislocation activity was observed. The authors strongly believe that the combination of nanoindentation and micro-Raman spectroscopy allowed detection of cracks prior to failure of the micropillar, which also allowed an estimation of the in-plane stress in the vicinity of the crack ti

Diamond wire-sawn silicon wafers - from the lab to the cell production

Wafers for the PV industry are mainly sawn with a multi-wire slurry saw. This process is slow (it takes almost half a day to complete a cut) and generates a lot of waste: around half the silicon is sawn away and contaminating the slurry, and the wire is worn and has lost strength. After each cut, the slurry has to be cleaned from the silicon debris and the wire has to be exchanged. In contrast, sawing the wafers with a diamond-plated wire is faster, requires only a cooling liquid that is easy to filter from silicon debris and uses a wire that can be kept for several cut. But this new sawing technique only has a chance to develop if the solar cell production lines developed for slurry sawn wafers is capable of processing these diamond-plated wire sawn wafers efficiently. This study focused on the differences of surface properties of wafers cut via a slurry wire-saw and via a diamond-plated wire-saw. From these surface differences, it is possible to explain the differences in cell processing behaviour and to update the cell production line. Finally, it is shown that wafers sawn with a diamond-plated wire can give cells that are as efficient as the slurry sawn wafers, which validates this new diamond-plated wire wafering method for the production of solar cells

Effect of debris on the silicon wafering for solar cells

The wafers used by the photovoltaic industry are mostly produced by multi-wire slurry sawing. One of the key factors determining the wafer quality (presence of saw marks and chips, increased roughness, wafer thickness variations and wafer strength) is the abrasive slurry. For cost reduction, the slurry is regularly exchanged and the debris it contains is removed in a recycling operation. To optimise the slurry usage, it is of utmost importance to understand the effects of the silicon debris concentration in the slurry. This was studied by sawing several bricks one after the other with the same slurry. It was found that when the amount of debris is too high (more than 4% of the slurry volume), saw marks appear on the wafers and they become more fragile. Finally, a first qualitative model explaining the apparition of the saw marks and the reduction of wafer strength is proposed. (C) 2011 Elsevier B.V. All rights reserved