3,273 research outputs found

    Towards Structural Testing of Superconductor Electronics

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    Many of the semiconductor technologies are already\ud facing limitations while new-generation data and\ud telecommunication systems are implemented. Although in\ud its infancy, superconductor electronics (SCE) is capable of\ud handling some of these high-end tasks. We have started a\ud defect-oriented test methodology for SCE, so that reliable\ud systems can be implemented in this technology. In this\ud paper, the details of the study on the Rapid Single-Flux\ud Quantum (RSFQ) process are presented. We present\ud common defects in the SCE processes and corresponding\ud test methodologies to detect them. The (measurement)\ud results prove that we are able to detect possible random\ud defects for statistical purposes in yield analysis. This\ud paper also presents possible test methodologies for RSFQ\ud circuits based on defect oriented testing (DOT)

    Defect-based testing of LTS digital circuits

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    A Defect-Based Test (DBT) methodology for Superconductor Electronics (SCE) is presented in this thesis, so that commercial production and efficient testing of systems can be implemented in this technology in the future. In the first chapter, the features and prospects for SCE have been presented. The motivation for this research and the outline of the thesis were also described in Chapter 1. It has been shown that high-end applications such as Software-Defined Radio (SDR) and petaflop computers which are extremely difficult to implement in top-of-the-art semiconductor technologies can be realised using SCE. But, a systematic structural test methodology had yet to be developed for SCE and has been addressed in this thesis. A detailed introduction to Rapid Single-Flux Quantum (RSFQ) circuits was presented in Chapter 2. A Josephson Junction (JJ) was described with associated theory behind its operation. The JJ model used in the simulator used in this research work was also presented. RSFQ logic with logic protocols as well as the design and implementation of an example D-type flip-flop (DFF) was also introduced. Finally, advantages and disadvantages of RSFQ circuits have been discussed with focus on the latest developments in the field. Various techniques for testing RSFQ circuits were discussed in Chapter 3. A Process Defect Monitor (PDM) approach was presented for fabrication process analysis. The presented defect-monitor structures were used to gather measurement data, to find the probability of the occurrence of defects in the process which forms the first step for Inductive Fault Analysis (IFA). Results from measurements on these structures were used to create a database for defects. This information can be used as input for performing IFA. "Defect-sprinkling" over a fault-free circuit can be carried out according to the measured defect densities over various layers. After layout extraction and extensive fault simulation, the resulting information will indicate realistic faults. In addition, possible Design-for-Testability (DfT) schemes for monitoring Single-Flux Quantum (SFQ) pulses within an RSFQ circuit has also been discussed in Chapter 3. The requirement for a DfT scheme is inevitable for RSFQ circuits because of their very high frequency of operation and very low operating temperature. It was demonstrated how SFQ pulses can be monitored at an internal node of an SCE circuit, introducing observability using Test-Point Insertion (TPI). Various techniques were discussed for the introduction of DfT and to avoid the delay introduced by the DfT structure if it is required. The available features in the proposed design for customising the detector make it attractive for a detailed DBT of RSFQ circuits. The control of internal nodes has also been illustrated using TPI. The test structures that were designed and implemented to determine the occurrence of defects in the processes can also be used to locate the position for the insertion of the above mentioned DfT structures

    The Detection of Defects in a Niobium Tri-layer Process

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    Niobium (Nb) LTS processes are emerging as the technology for future ultra high-speed systems especially in the digital domain. As the number of Josephson Junctions (JJ) per chip has recently increased to around 90000, the quality of the process has to be assured so as to realize these complex circuits. Until now, very little or no information is available in the literature on how to achieve this. In this paper we present an approach and results of a study conducted on an RSFQ process. Measurements and SEM inspection were carried out on sample chips and a list of possible defects has been identified and described in detail. We have also developed test-structures for detection of the top-ranking defects, which will be used for yield analysis and the determination of the probability distribution of faults in the process. A test chip has been designed, based on the results of this study, and certain types of defects were introduced in the design to study the behavior of faulty junctions and interconnections

    Desperado​: Hyperlink Cinema as a Springboard for Societal Critique

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    To fully engage with the discourse surrounding the genre of hyperlink cinema, I intend to create my own original cinematic work to participate in this notion of creating detailed, transcendent character mosaics that explore the commonalities between different people. I have thus written Desperado, which will be my senior thesis project at Loyola Marymount University\u27s School of Film and Television. It will be a fifteen-minute short film set and shot on location in Los Angeles, California. Desperado is a story about the loss of innocence. It explores how growing up amidst crime and societal instability affects different people, whether they’re 10, 25 or 50 years old--and highlights the effects of chance, circumstance and coincidence on interpersonal relationships

    Binary operation based hard exudate detection and fuzzy based classification in diabetic retinal fundus images for real time diagnosis applications

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    Diabetic retinopathy (DR) is one of the most considerable reasons for visual impairment. The main objective of this paper is to automatically detect and recognize DR lesions like hard exudates, as it helps in diagnosing and screening of the disease. Here, binary operation based image processing for detecting lesions and fuzzy logic based extraction of hard exudates on diabetic retinal images are discused. In the initial stage, the binary operations are used to identify the exudates. Similarly, the RGB channel space of the DR image is used to create fuzzy sets and membership functions for extracting the exudates. The membership directives obtained from the fuzzy rule set are used to detect the grade of exudates. In order to evaluate the proposed approach, experiment tests are carriedout on various set of images and the results are verified. From the experiment results, the sensitivity obtained is 98.10%, specificity is 96.96% and accuracy is 98.2%.  These results suggest that the proposed method could be a diagnostic aid for ophthalmologists in the screening for DR

    Testability issues in superconductor electronics

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    An emerging technology for solutions in high-end applications in computing and telecommunication is superconductor electronics. A system-level study has been carried out to verify the feasibility of DfT in superconductor electronics. In this paper, we present how this can be realized to monitor so-called single-flux quantum pulses. As a part of our research, test structures have been developed to detect structural defects in this technology. We also show detailed test results of those structures. It proves that it is possible to detect possible random defects and provide defect statistics for the Niobium-based fabrication process

    Poster 5: Quaternary Structure

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    https://digitalcommons.imsa.edu/protein_folding/1004/thumbnail.jp

    Poster 8: Predicting Structure: Current Techniques and Challenges

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    https://digitalcommons.imsa.edu/protein_folding/1007/thumbnail.jp
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