11 research outputs found

    The Weak Charge of the Proton and New Physics

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    We address the physics implications of a precision determination of the weak charge of the proton, QWP, from a parity violating elastic electron proton scattering experiment to be performed at the Jefferson Laboratory. We present the Standard Model (SM) expression for QWP including one-loop radiative corrections, and discuss in detail the theoretical uncertainties and missing higher order QCD corrections. Owing to a fortuitous cancellation, the value of QWP is suppressed in the SM, making it a unique place to look for physics beyond the SM. Examples include extra neutral gauge bosons, supersymmetry, and leptoquarks. We argue that a QWP measurement will provide an important complement to both high energy collider experiments and other low energy electroweak measurements. The anticipated experimental precision requires the knowledge of the order alpha_s corrections to the pure electroweak box contributions. We compute these contributions for QWP, as well as for the weak charges of heavy elements as determined from atomic parity violation.Comment: 22 pages of LaTeX, 5 figure

    Spin asymmetry A_1^d and the spin-dependent structure function g_1^d of the deuteron at low values of x and Q^2

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    We present a precise measurement of the deuteron longitudinal spin asymmetry A_1^d and of the deuteron spin-dependent structure function g_1^d at Q^2 < 1 GeV^2 and 4*10^-5 < x < 2.5*10^-2 based on the data collected by the COMPASS experiment at CERN during the years 2002 and 2003. The statistical precision is tenfold better than that of the previous measurement in this region. The measured A_1^d and g_1^d are found to be consistent with zero in the whole range of x.Comment: 17 pages, 10 figure

    Atomic force microscopy for surface imaging and characterization of supported nanostructures

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    This chapter presents an overview of Atomic Force Microscopy (AFM) principles followed by details on AFM instrumentation. In particular, the frequency modulation method of the non-contact AFM (NC-AFM) used in ultra-high vacuum conditions is explained in detail. Then, applications of NC-AFM for an atomic-scale range characterization of semiconductor and isolator surfaces as well as supported nanostructures are introduced
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