33 research outputs found
Lower Paleozoic Rocks around Today´s Arctic Ocean: Two Ancestral Continents and Associated Plates; Alaskan Rotation Unnecessary and Unlikely
КОМПЛЕКС ДЛЯ НЕРАЗРУШАЮЩЕГО КОНТРОЛЯ СУБМИКРОННОЙ ТОПОЛОГИИ КРЕМНИЕВЫХ ПЛАСТИН ПРИ ПРОИЗВОДСТВЕ ИНТЕГРАЛЬНЫХ МИКРОСХЕМ
The advantages of using an atomic force microscopy in manufacturing of submicron integrated circuits are described. The possibilities of characterizing the surface morphology and the etching profile for silicon substrate and bus lines, estimation of the periodicity and size of bus lines, geometrical stability for elementary bus line are shown. Methods of optical and atomic force microcopies are combined in one diagnostic unit. Scanning probe microscope (SPM 200) is designed and produced. Complex SPM 200 realizes nondestructive control of microelectronics elements made on silicon wafers up to 200 mm in diameter and it is introduced by JSC «Integral» for the purpose of operational control, metrology and acceptance of the final product.Описаны преимущества использования атомно-силовой микроскопии для контроля технологических процессов при изготовлении интегральных микросхем субмикроэлектроники. Показана возможность визуализации морфологии поверхностей и профиля травления, оценки периодичности гребенок шин, определения стабильности размеров для одной шины. Выполнены работы по совмещению оптической и атомно-силовой микроскопии, разработан и изготовлен сканирующий зондовый микроскоп. Комплекс внедрен для промышленного неразрушающего контроля субмикроэлектроники, выполненной на кремниевых пластинах диаметром до 200 мм, с целью осуществления операционного контроля, метрологических измерений и приемки качества готовой продукции
Paleogene Foredeep Basin Deposits of North-Central Cuba: A Record of Arc-Continent Collision between the Caribbean and North American Plates
EQUIPMENT FOR NONDESTRUCTIVE TESTING OF SILICON WAFERS SUBMICRON TOPOLOGY DURING THE FABRICATION OF INTEGRATED CIRCUITS
The advantages of using an atomic force microscopy in manufacturing of submicron integrated circuits are described. The possibilities of characterizing the surface morphology and the etching profile for silicon substrate and bus lines, estimation of the periodicity and size of bus lines, geometrical stability for elementary bus line are shown. Methods of optical and atomic force microcopies are combined in one diagnostic unit. Scanning probe microscope (SPM 200) is designed and produced. Complex SPM 200 realizes nondestructive control of microelectronics elements made on silicon wafers up to 200 mm in diameter and it is introduced by JSC «Integral» for the purpose of operational control, metrology and acceptance of the final product
The dynamics of biochemical markers of enzymoemia and middle-weight molecules in the early post-traumatic period of brain injury
In the experimental model of brain injury (BI) markers of enzymoemia (aminotransferases ALT and AST,
alkaline and acid phosphatase (AlP and AcP), cathepsin D (CD)) and middle-weight molecules (MWM) were estimated.
3 hours after trauma there were increase of all enzymes that evidences about damage of cytoplasmic (ALT, AST, AlF)
and lysosomal membranes (AcP, CD). During period of observation different dynamics of enzymatic changes occurred:
plateau phase for ALT and CD and progressive increase of concentration with the maximum on the 5th day of the
experiment for AlP and AcP. Increase of the level of MWM displayed the development of endogenous intoxication in
the post-traumatic period. Relation between particular components of MWM was studied. It was shown that primary
accumulation of nucleotide fraction and aromatic peptides is adverse factor of the course of post-traumatic period,
development of endotoxicosis, and multiorgan failure
Effect of Rheological Properties of a Magnetosensitive Tool on the Friction and Wear of Polished Surface
Paleoproterozoic and Neoproterozoic Quartzites of the Kyrgyz North Tianshan: Age Determination according to the Results of Detrital Zircon Dating
Constraining Age of Deformation Stages in the South-Western Part of Verkhoyansk Fold-and-Thrust Belt by Apatite and Zircon Fission-Track Analysis
Detrital and igneous zircon ages for supracrustal rocks of the Kyrgyz Tianshan and palaeogeographic implications
Mesozoic to recent geological history of southern Crimea and the Eastern Black Sea region
<p>We provide a synthesis of stratigraphic data to unravel the history of the geological evolution of South Crimea in the Mesozoic
and Cenozoic. The South Crimea Orogen consists of three major mega-sequences: (1) the Triassic–Early Jurassic; (2) the Aalenian–Bathonian;
and (3) the Callovian–Eocene. The Late Triassic–Early Jurassic deposits formed in the environment of a forearc basin and a
remnant basin. The Aalenian–Bathonian deposits formed above subduction extension and a volcanic belt. Three main Callovian–Eocene
tectonic units can be identified in South Crimea: (1) the South Crimean Shelf Basin; (2) the Sudak Deepwater Trough; and (3)
the Alchak–Kaya Shelf Basin at the northern margin of the Shatsky Ridge. The Oligocene–Quaternary deposits are considered
to be syn-orogenic. A description of the anticipated stratigraphic units on the Shatsky Ridge is suggested for the Middle
Jurassic, Callovian–Late Jurassic, Neocomian, Aptian–Albian, Late Cretaceous–Paleocene, Eocene and Maykopian. We propose a
model for the geological history of the Eastern Black Sea Basin. Graben formed during the Late Barremian–Albian at the location
of the future Eastern Black Sea Basin and a phase of volcanism occurred in the Albian. The main phase of rifting and spreading
of oceanic crust took place during Cenomanian–Santonian time.
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