6 research outputs found
Measurement of Inclusive Ds, D0, and J/ Rates and Determination of the B Production Fraction in b Events at the (5S) Resonance
Get PDFjournal articl
Bi-MOSFET Amplifier for Integration with Multimicroelectrode Array for Extracellular Neuronal Recording (Special Section on High-Performance MOS Analog Circuits)
Get PDFA high-gain, low-noise amplifier for microelectrode probe, which integrated multimicroelectrode array for extracellular recording of neural activities and solid state circuits for the amplification of induced signals from the electrodes onto one substrate, was fabricated. In the amplifier, low-noise MOSFETs are used in the first stage, an interstage high-pass filter is incorporated to avoid saturation of the amplifier due to the polarization voltage of the electrode. In the second stage, an operational amplifier incorporating Bi-MOSFETs for the realization of high input impedance and large gain-bandwidth product is used. The gain of the fabricated amplifier is 56 dB for the frequency range between 2 Hz to 10 kHz, the noise voltage is 20 μV_ these satisfied design specifications.copyright(c)1994
IEICE許諾番号：08RB0010
http://search.ieice.org/index.htmltextapplication/pdfjournal articl
痴呆性高齢者の生活における既存地域環境資源の活用に関する研究
Get PDFapplication/pdf科学研究費補助金研究成果報告書, 課題番号15560529, 2003年度～2005年度, 基盤研究(C)research repor
光誘起電流による半導体/金属界面の真実接触面の評価の基礎研究
Get PDFapplication/pdfReal contact area between semiconductor and metal is studied by measuring photo induced current (PIC), which is stimulated by laser at the semiconductor surface. Transmittance of PIC from semiconductor to metal interface is discussed. PIC increases proportionally with the increase of normal force between the solids, which implies adhesion like phenomena at the interface. Since PIC is strongly depended on the position of the incidence of light, PIC images, which were obtained with scanning of laser, express the distributions of the real contact area. PIC can be a new method to estimate the interface properties.journal articl
