The clinical study of XD-1 endometer

目的:对自行研制的XD-1根管测量仪进行临床比较研究,以探讨其临床应用准确性。方法:收集650例,共1380个根管与RootZX测量仪进行长度测量比较,然后按测量长度插入牙胶尖摄X线牙片,比较两者的准确率,准确范围限定在≤±1.0mm。结果:XD-1与X线测量的准确率为95.8%;RootZX与X线测量的准确率为97.6%;全部根管无1例超填,测量时病人无任何不适感觉。结论:XD-1测量仪的准确率与RootZX一致,是一种安全、可靠、准确率很高的新型根管长度测量仪。Objective:To investage the clinic value of XD-1 made by ourself.Method:To detect the length of 1380 root cannal in 650 cases using XD-1 and Root ZX respectively and to campare the precise rate with X-ray measuring result.Result:The precise rate of XD-1 is 95.8%,While Root ZX 97.6%.Non of these cane excess apical hole.Conclusion:XD-1 endometer is accurate and salf .厦门市科委基金课题(3502Z2001

THE PHONON SIDEBAND STRUCTURE ON N_X LUMINESCENCE IN GaAs_(1-x)P_x∶N ALLOYS

本文采用荧光窄化技术，对低组分的gAAS（1-X）PX∶n（X＝0.76，0.65）混晶材料中nX束缚激子的声子伴线进行了研究.在低温下，选择激发nX带时，我们得到了与gAP∶n低温发光谱中类似的声子伴线结构.根据实验结果，给出了混晶中各种声子的能量.另外，对组分为X＝0.76的gAAS（1-X）PX∶n混晶样品，我们还首次观察并分析了多声子重现光谱.luorescence line narrowing technology has been used to study the phonon sidebands of Nx-bound excitons in GaAs1-xPx: N in details.Under selective excitation into inhomogenously broadened Nx band at low temperature, the sharp phonon sidebands like those in low temperature PL spectrum For GaP: N are observed.According to the experimental results, we obtained the energy values of various phonons in GaAs1-xPx: N alloys with the composition x=0.76 and 0.65.The photoluminescence spectrum with periodically repeated phonon sideband structure For GaAs1-xPx: N (x=0.76) is observed and analyzed For the First time.国家和福建省自然科学基