Study on the Perturbation and its Application to the Cylindrical Cavity

本文分析圆柱 TE0 1 1 模端盖对称隙缝特性。在隙缝辐射较小的条件下 ,提出适于损耗小 ,厚度薄 (1 mm左右 )的片状材料腔外微扰的近似计算方法 ,测得聚四氟乙烯、聚氯乙烯、纯陶瓷片等复介电常数与准确值相当吻合的结果。测得相同厚度的片状半导体材料电阻率 (≥ 2 0 Ω·cm) ,与 1 /QL 有线性关系 ,与提出的近似方法所预期结果一致。理论分析和实验表明 ,应用圆柱TE0 1 1 模端盖对称隙缝可实现无接触、高精度、多功能测量片状材料的参数 ,且预期可用于二维测量The characteristics of symmetric slots on the t op-cover of TE 011 -mode cylindrical cavity are analyzed in this paper.The approximate calculating method is proposed for the low loss and thin flake mate rial perturbation outside of the cavity.The measured complex permittivities of t eflon,polyvinyl chloride (PVC) ,pure ceramic flake are in good agreements with t he standard data.The linear relation between 1/ Q L of the cavity and the co nductivity of the semiconductor slice material with the same thickness agrees to the anticipation of the approximate calculating method.The theoretical analysis and experimental results show that contactless,high precision,multifunction para meters measurement of flake material are realized by using the slots of port-co -ver.The two-dimensional measurements are also realized by this method.福建省自然科学基金资助项

ON SEVERAL TECHNICAL PROBLEMS FOR THE MEASUREMENT of ELECTRON SPIN-LATTICE RELAXATION TIME

本文讨论应用连续波方法测量电子自旋──晶格弛豫时间T＿1的实验技术问题。分析液氮翻滚使T＿1测量结果很不一致的原因，提出用吹冷气冷冻样品方法，可以解决液氮翻滚对测量T＿1所产生的影响.用改进的方法测量znS：Mn、Cu粉末样品的T＿1，获得重复性较好的实验结果。Several technieal problems For the measurement of eleetron spin-lattice relaxationT_1 by the saturation methods are discussed．When the relaxation time T_1 is deter-mined at liquid N_2 temperature，the liquid N_2 in quartz Dewer containing samplesusually bo ils，thereFore T_1 is diFFicult to determine.IF the cooling of samples isaccomplished by cooling N_2 gas Flow，then T_1 is determined．The results ofdetermining spin-lattiee relaxation time T_1 of ZnS：Mn，Cu are attained，and the T_1becomes shorter with the Formation of Mn-(2+) clusters

The Multi-Parameters measurement with Perturbation Method out of the TE_(011)-mode Cylindrical Cavity

本文分析圆柱腔TE0 11模端盖上的两个对称隙缝的特性 ,阐明用其测量片状材料的原理和条件。介绍了测量片状小损耗介质介电常数、半导体电导率及非平衡载流子寿命等参数的结果。实验表明 ,圆柱TE0 11模端盖的对称隙缝可用于高精度、多功能、宽量程测量片状材料参数 ,且测量是无接触的 ,无需对样品进行特殊的加工。The paper analyses the specificity of the symmetry slots of the port-cover of the TE 011 -mode cylindrical cavity,and presents its theory and condition for measurement of flake materials.The measurement results of complex dielectric constants of low loss and thin flake materials,conductivity and nonequilibrium charge carrier lifetime of semiconductor are introduced.From the experiment,we conclude that the symmetry slots on the portcover of TE 011 -mode cylindrical cavity can be used for high precision,multifunction,wide range measurement of flake materials' parameters,moreover the measurement is contactless,and the samples don't need special processing.福建省自然科学基金资助项

Determination of Humidity of Particulate Materials by the Method of Coaxial Cavity Perturbation

导出开路端外导体加长的λ/4同轴腔受颗粒状介质微扰的频偏近似计算公式，并在实验上测出不同湿度不同颗粒大小黄豆的频偏值.理论计算及实验均表明，如用上述腔体的过极限圆波导段做容器，由于过极限圆波导中电磁场沿纵向按指数率衰减，当选择合适的衰减系数α，在通常的黄豆等粮食颗粒的线度变化范围内，填充一层颗粒状介质所产生的频偏值随颗粒半径r的变化不大.应用此种腔体测量颗粒状介质湿度，可以在一定范围内消除粒度大小和形状的影响.The approximate Formula For calculating Frequency shiFt by the perturbation method of coaxial cavity ,which has a extended outer conductor,is deduced ,and the experimental results For Frequency shiFt measurement of soybeans with diFFerent radii under with diFFerent levels of humidity are presented.IF the section of cut ofF circular waveguide above mentioned is used as a vessel,the electromagnetic Field in it would attenuate exponentially along the longitudinal direction.When the attenuation constant is selected suitably ,the Frequency shiFt caused by Filling a layer of particulate material in it has little to do with the measured object′s radius R iF soybeans,peanuts and so on were used as sample.For this reason,such a cavity can be used For measuring humidity of some particulate material ,which can eliminate the inFluence of its size and shape to some extent.福建省自然科学基

Applications of Microwave Cavity in Industrial Measurements

本文阐明微波腔体用于工业检测湿度、温度、厚度、速度、材料电磁参数等的基本原理.综述近年来在测量湿度、速度、材料电磁特性及半导体材料电阻率、非平衡载流子寿命等的应用.OThe basic principle of moisture, temperature, thickness, speed and material parameter measurements using the microwave cavity is explained in this paper.Moisture, speed, material electromagnetic property, semiconductor material resistivity measurements in recent industrial applications are also summarized

THE IMPROVEMENT of MICROCOMPUTER SYSTEM FRO A BRUKER ER-200D-SRC SPECTROMETER

详细叙述了德国brukEr分析仪器公司Er-200d-SrC型EPr谱仪与IbMPC/386微机联机的软硬件系统，该系统综合了仪器的自动磁场扫描控制，数据采集累加和数据分析处理及数据绘图、打印等各项功能。其硬件由IbMPC/386微机及二大接口模块组成。一块为商品化的12位A/d、d/A接口卡，另一块为自行设计的以InTEl-8255可编程通用接口电路为主体的数字量输入输出控制接口卡，可分别独立地插入PC机的扩展槽中，其软件采用C语言编写，具有菜单式、结构化、模块化、汉字工作提示、实验数据实时屏幕绘图、实验参数实时显示等特点，用户界面良好，该系统恢复并提高了原谱仪的整体性能，具有一定的推广价值。The software and hardware system was developed For use with the GermanBRUKER ANALYTISCHE MESSTECHNIK COMPANY'S EPR Spectrometer model ER-200D-SRC.The system was used to control spectrometer during magneticsweeping，collect data From spectral scans in single-scan and multiscan modes， dataanalysis and manipulation， output data to the spectrometer x-y recorder and printdata to printer，The hardware is based on IBM PC/386 computer and two interFacemodules， one of which is commercialized 12-bit A/D and D/A interFaced， and theother a designed digital I/O control card with a general programable interFace ICINTEL 8255 being it’s main body．The two cards can be inserted into PC's extensionsocket respectively.The software，written in C language， is characterized by chinesecharacter menu display,structured and modularized program and real-time working.It has good user’s interFace and easy operation， The system has recovered and im-proved the whole Funtion of the original spectrometer and has certain value Fordevelopment

Application of Microwave Method to Measurement of Nonequilibrium Carrier Lifetime

介绍用有哑铃状孔-缝端盖的微波谐振腔测量片状半导体材料非平衡载流子寿命的一种方法.腔体用圆柱TE011模高Q腔，易于更换端盖，可以达到较高的测量精度.实验表明，对同一半导体材料测量得到的有效寿命不因端盖孔-缝的改变而变化，所以可以通过选用孔-缝尺寸不同的端盖，来测量不同电导率的材料，以提高信号幅度，从而提高精度.测量是无接触的，因此无需对样品进行加工.用小的孔-缝端盖还可以用来对半导体材料有效寿命的二维分布进行研究.A method for measurement of nonequilibrium charge carrier lifetime by the TE 011 mode cylindrical cavity with dumbbell shape slots is presented. The measurement is non contact and the sample processing is not required. Moreover, the quality factor Q of cylindrical cavity is high, and high measurement sensitivity can be achieved.For the same sample, the carrier lifetime is not changed with the variation of the coverplate of the cavity with different size of the slots. In order to get high measurement sensitivity, the appropriate size of the slots should be chosen to measure the samples of different conductivity. Meanwhile, the planar distribution of carrier lifetime in semiconductor can be analyzed by such method.福建省自然科学基

The Characteristics and Application of the TE 011 mode Cylindrical Cavity with Dumbbell shape Slots on Its Plate

介绍用微波谐振腔测量片状介质材料的电导率、介电常数和半导体非平衡载流子寿命的方法.对圆柱腔TE011模端盖上的哑铃状孔-缝的特性进行了研究，指出单个哑铃状孔-缝与TE011模耦合很弱，两个对称的哑铃状孔-缝与TE011模具有较强的耦合，后者可用于小损耗片状介质材料介电常数、半导体材料非平衡载流子寿命等参数的测量.因为测量是无接触的，所以无需对样品进行特殊加工.TE011模品质因数Q值高，因而测量具有较高的精度.A method For measurement of the relative permittivity, conductivity of the medium as well as unbalanced carrier liFetime of semiconductor by the TE 011 mode cylindrical cavity with dumbbell shape slot is proposed. We made a study of the characteristics of the TE 011 mode cylindrical cavity with dumbbell shape slots on its plate, pointed out that the coupling between single dumbbell shape slot with TE 011 mode was low, but it was high iF a couple of symmetry dumbbell shape slots were used, and that the latter can be used conveniently For measurement of the permittivity of low loss platelike sample and the unbalanced carrier liFetime τ of semiconductor.The measurement is non contact and the sample processing is not required. The quality Factor Q of TE 011 mode is highs, so that higher measurement sensitivity can be achieved.福建省自然科学基

热处理对煤焦反应性及微观结构的影响

用热天平和XRD考察了热处理对二种煤(河北蔚县褐煤、四川湔江烟煤)镜质组半焦微观结构和反应活性的影响。TGA结果表明，热处理温度增加，蔚县煤镜质组(YXV)与湔江煤镜质组(JJV)焦炭的反应性降低；YXV焦炭的反应性随着热处理时间的增加而急剧下降，但一定热处理时间(60min)后，其下降趋势变缓；热处理时间对JJV，焦炭的影响较小。XRD结果表明，在热处理温度为900℃，初焦热处理时间为60min时，YXV焦炭晶格结构发生明显改变，900℃以上，’YXV焦炭芳香堆垛高度Lc随着热处理时间的增加而增加；热处理时间对JJV焦炭的影响不如YXV显著，而只有在较高的热处理温度(1200℃)下，碳的微观结构才出现明显的有序化。热处理导致的焦炭微观碳结构趋于有序化是焦炭反应性下降的主要原因

金丝桃素的一种提取方法

本发明公开了一种金丝桃素的提取方法。该方法包括以下步骤：１．将贯叶连翘干燥、粉碎；２．贯叶连翘粉末与有机溶媒按体积比为１－２∶３混合，在４０－７０℃下提取２－４小时，收集提取液，过滤，收集过滤液；３．对过滤液减压浓缩，回收浓缩液；４．将浓缩液用树脂进行吸附，洗脱，收集洗脱液；５．对洗脱液减压浓缩，得到金丝桃素浸膏。该提取方法具有以下优点：１．操作简单，易于进行工业化应用；２．提取成本低廉；３．所用提取溶剂的毒性较小，提取周期短；４．提取物中金丝桃素含量高。基于上述优点，本发明将在金丝桃素的生物提取中发挥巨大作用