The Contribution of CALL to Advanced-Level Foreign/Second Language Instruction

This paper evaluates the contribution of instructional technology to advanced-level foreign/second language learning (AL2) over the past thirty years. It is shown that the most salient feature of AL2 practice and associated Computer-Assisted Language Learning (CALL) research are their rarity and restricted nature. Based on an analysis of four leading CALL journals (CALICO, CALL, LL&T, ReCALL), less than 3% of all CALL publications deal with AL2. Moreover, within this body of research, the range of languages involved is very restricted. Three languages, English, German and French, account for nearly 87% of the studies. Likewise, in nearly 81% of the cases, the learning focus is on the written language. Attention to oral-aural skills accounts for only 18% of all AL2 CALL projects. Whatever the targeted language or linguistic focus, the most striking aspect of advanced-level L2 CALL studies is the lack of information given regarding the competency level of students and the linguistic level of the activities undertaken. The determination of these critical parameters is thus of necessity very much a highly interpretive process. Based on the available evidence, it is estimated that half of the learners in these AL2 studies were in fact within the Common European Framework of Reference (CEFR) B1 range, i.e. below what would generally be considered as advanced-level competency. So, too, half of the assigned tasks were deemed to have been below the B2 level, with 40% of these below the B1 level. This study concludes that both quantitatively and qualitatively the contribution of instructional technology to advanced-level L2 acquisition has been very limited

Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers

Semi-insulating (SI) InP wafers of 2 and 3 in. diameters have been prepared by annealing undoped LEC InP at 930 degreesC for 80 h under pure phosphorus ambient (PP) and iron phosphide ambient (IP). The electrical uniformity of annealed undoped SI wafers, along with a Fe-doped as-grown SI LEC InP wafer, has been characterized by whole wafer PL mapping and radial Hall measurements. Defects in these wafers have been detected by photo-induced current transient spectroscopy (PICTS). The results indicated that the uniformity of IP wafer is much better than that of PP wafer and as-grown Fe-doped Si InP wafer. There are fewer traps in undoped SI InP IP wafer than in as grown Fe-doped and undoped SI InP PP wafer, as evidenced by PICTS. The good uniformity of the IP wafer is related to the nonexistence of high concentration of thermally induced defects. The mechanism for this phenomenon is discussed based on the results. (C) 2002 Elsevier Science B.V. All rights reserved

Identification of beauty and charm quark jets at LHCb

Identification of jets originating from beauty and charm quarks is important for measuring Standard Model processes and for searching for new physics. The performance of algorithms developed to select b- and c-quark jets is measured using data recorded by LHCb from proton-proton collisions at root s = 7TeV in 2011 and at root s = 8TeV in 2012. The efficiency for identifying a b (c) jet is about 65%(25%) with a probability for misidentifying a light-parton jet of 0.3% for jets with transverse momentum pT > 20GeV and pseudorapidity 2 : 2 < eta < 4.2. The dependence of the performance on the pT and eta of the jet is also measured

B flavour tagging using charm decays at the LHCb experiment

An algorithm is described for tagging the flavour content at production of neutral B mesons in the LHCb experiment. The algorithm exploits the correlation of the flavour of a B meson with the charge of a reconstructed secondary charm hadron from the decay of the other b hadron produced in the proton-proton collision. Charm hadron candidates are identified in a number of fully or partially reconstructed Cabibbo-favoured decay modes. The algorithm is calibrated on the self-tagged decay modes B+ -> J/psi K+ and B-0 -> J/psi K*(0) using 3.0fb(-1) of data collected by the LHCb experiment at pp centre-of-mass energies of 7TeV and 8TeV. Its tagging power on these samples of B -> J/psi X decays is (0.30 +/- 0.01 +/- 0.01) %