Complex VLSI Feature Comparison for Commercial Microelectronics Verification

Shortcomings in IC verification make for glaring vulnerabilities in the form of hardware backdoors, or extraneous operation modes that allow unauthorized, undetected access. The DARPA TRUST program addressed the need for verification of untrusted circuits using industry-standard and custom software. The process developed under TRUST and implemented at the AFRL Mixed Signal Design Center has not been tested using real-world circuits outside of the designated TRUST test cases. This research demonstrates the potential of applying software designed for TRUST test articles on microchips from questionable sources. A specific process is developed for both transistor-level library cell verification and gate-level circuit verification. The relative effectiveness and scalability of the process are assessed

The Rolf of Test Chips in Coordinating Logic and Circuit Design and Layout Aids for VLSI

This paper emphasizes the need for multipurpose test chips and comprehensive procedures for use in supplying accurate input data to both logic and circuit simulators and chip layout aids. It is shown that the location of test structures within test chips is critical in obtaining representative data, because geometrical distortions introduced during the photomasking process can lead to significant intrachip parameter variations. In order to transfer test chip designs quickly, accurately, and economically, a commonly accepted portable chip layout notation and commonly accepted parametric tester language are needed. In order to measure test chips more accurately and more rapidly, parametric testers with improved architecture need to be developed in conjunction with innovative test structures with on-chip signal conditioning

A survey of carbon nanotube interconnects for energy efficient integrated circuits

This article is a review of the state-of-art carbon nanotube interconnects for Silicon application with respect to the recent literature. Amongst all the research on carbon nanotube interconnects, those discussed here cover 1) challenges with current copper interconnects, 2) process & growth of carbon nanotube interconnects compatible with back-end-of-line integration, and 3) modeling and simulation for circuit-level benchmarking and performance prediction. The focus is on the evolution of carbon nanotube interconnects from the process, theoretical modeling, and experimental characterization to on-chip interconnect applications. We provide an overview of the current advancements on carbon nanotube interconnects and also regarding the prospects for designing energy efficient integrated circuits. Each selected category is presented in an accessible manner aiming to serve as a survey and informative cornerstone on carbon nanotube interconnects relevant to students and scientists belonging to a range of fields from physics, processing to circuit design

Quantum Computing in the NISQ era and beyond

Noisy Intermediate-Scale Quantum (NISQ) technology will be available in the near future. Quantum computers with 50-100 qubits may be able to perform tasks which surpass the capabilities of today's classical digital computers, but noise in quantum gates will limit the size of quantum circuits that can be executed reliably. NISQ devices will be useful tools for exploring many-body quantum physics, and may have other useful applications, but the 100-qubit quantum computer will not change the world right away --- we should regard it as a significant step toward the more powerful quantum technologies of the future. Quantum technologists should continue to strive for more accurate quantum gates and, eventually, fully fault-tolerant quantum computing.Comment: 20 pages. Based on a Keynote Address at Quantum Computing for Business, 5 December 2017. (v3) Formatted for publication in Quantum, minor revision

Side-channel based intrusion detection for industrial control systems

Industrial Control Systems are under increased scrutiny. Their security is historically sub-par, and although measures are being taken by the manufacturers to remedy this, the large installed base of legacy systems cannot easily be updated with state-of-the-art security measures. We propose a system that uses electromagnetic side-channel measurements to detect behavioural changes of the software running on industrial control systems. To demonstrate the feasibility of this method, we show it is possible to profile and distinguish between even small changes in programs on Siemens S7-317 PLCs, using methods from cryptographic side-channel analysis.Comment: 12 pages, 7 figures. For associated code, see https://polvanaubel.com/research/em-ics/code