2,734 research outputs found

    Two-Layer Error Control Codes Combining Rectangular and Hamming Product Codes for Cache Error

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    We propose a novel two-layer error control code, combining error detection capability of rectangular codes and error correction capability of Hamming product codes in an efficient way, in order to increase cache error resilience for many core systems, while maintaining low power, area and latency overhead. Based on the fact of low latency and overhead of rectangular codes and high error control capability of Hamming product codes, two-layer error control codes employ simple rectangular codes for each cache line to detect cache errors, while loading the extra Hamming product code checks bits in the case of error detection; thus enabling reliable large-scale cache operations. Analysis and experiments are conducted to evaluate the cache fault-tolerant capability of various existing solutions and the proposed approach. The results show that the proposed approach can significantly increase Mean-Error-To-Failure (METF) and Mean-Time-To-failure (MTTF) up to 2.8×, reduce storage overhead by over 57%, and increase instruction per-cycle (IPC) up to 7%, compared to complex four-way 4EC5ED; and it increases METF and MTTF up to 133×, reduces storage overhead by over 11%, and achieves a similar IPC compared to simple eight-way single-error correcting double-error detecting (SECDED). The cost of the proposed approach is no more than 4% external memory access overhead

    Fault and Defect Tolerant Computer Architectures: Reliable Computing With Unreliable Devices

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    This research addresses design of a reliable computer from unreliable device technologies. A system architecture is developed for a fault and defect tolerant (FDT) computer. Trade-offs between different techniques are studied and yield and hardware cost models are developed. Fault and defect tolerant designs are created for the processor and the cache memory. Simulation results for the content-addressable memory (CAM)-based cache show 90% yield with device failure probabilities of 3 x 10(-6), three orders of magnitude better than non fault tolerant caches of the same size. The entire processor achieves 70% yield with device failure probabilities exceeding 10(-6). The required hardware redundancy is approximately 15 times that of a non-fault tolerant design. While larger than current FT designs, this architecture allows the use of devices much more likely to fail than silicon CMOS. As part of model development, an improved model is derived for NAND Multiplexing. The model is the first accurate model for small and medium amounts of redundancy. Previous models are extended to account for dependence between the inputs and produce more accurate results

    An Experimental Study of Reduced-Voltage Operation in Modern FPGAs for Neural Network Acceleration

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    We empirically evaluate an undervolting technique, i.e., underscaling the circuit supply voltage below the nominal level, to improve the power-efficiency of Convolutional Neural Network (CNN) accelerators mapped to Field Programmable Gate Arrays (FPGAs). Undervolting below a safe voltage level can lead to timing faults due to excessive circuit latency increase. We evaluate the reliability-power trade-off for such accelerators. Specifically, we experimentally study the reduced-voltage operation of multiple components of real FPGAs, characterize the corresponding reliability behavior of CNN accelerators, propose techniques to minimize the drawbacks of reduced-voltage operation, and combine undervolting with architectural CNN optimization techniques, i.e., quantization and pruning. We investigate the effect of environmental temperature on the reliability-power trade-off of such accelerators. We perform experiments on three identical samples of modern Xilinx ZCU102 FPGA platforms with five state-of-the-art image classification CNN benchmarks. This approach allows us to study the effects of our undervolting technique for both software and hardware variability. We achieve more than 3X power-efficiency (GOPs/W) gain via undervolting. 2.6X of this gain is the result of eliminating the voltage guardband region, i.e., the safe voltage region below the nominal level that is set by FPGA vendor to ensure correct functionality in worst-case environmental and circuit conditions. 43% of the power-efficiency gain is due to further undervolting below the guardband, which comes at the cost of accuracy loss in the CNN accelerator. We evaluate an effective frequency underscaling technique that prevents this accuracy loss, and find that it reduces the power-efficiency gain from 43% to 25%.Comment: To appear at the DSN 2020 conferenc

    Dependable Embedded Systems

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    This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems

    Deep Space Network information system architecture study

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    The purpose of this article is to describe an architecture for the Deep Space Network (DSN) information system in the years 2000-2010 and to provide guidelines for its evolution during the 1990s. The study scope is defined to be from the front-end areas at the antennas to the end users (spacecraft teams, principal investigators, archival storage systems, and non-NASA partners). The architectural vision provides guidance for major DSN implementation efforts during the next decade. A strong motivation for the study is an expected dramatic improvement in information-systems technologies, such as the following: computer processing, automation technology (including knowledge-based systems), networking and data transport, software and hardware engineering, and human-interface technology. The proposed Ground Information System has the following major features: unified architecture from the front-end area to the end user; open-systems standards to achieve interoperability; DSN production of level 0 data; delivery of level 0 data from the Deep Space Communications Complex, if desired; dedicated telemetry processors for each receiver; security against unauthorized access and errors; and highly automated monitor and control

    Compilation Optimizations to Enhance Resilience of Big Data Programs and Quantum Processors

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    Modern computers can experience a variety of transient errors due to the surrounding environment, known as soft faults. Although the frequency of these faults is low enough to not be noticeable on personal computers, they become a considerable concern during large-scale distributed computations or systems in more vulnerable environments like satellites. These faults occur as a bit flip of some value in a register, operation, or memory during execution. They surface as either program crashes, hangs, or silent data corruption (SDC), each of which can waste time, money, and resources. Hardware methods, such as shielding or error correcting memory (ECM), exist, though they can be difficult to implement, expensive, and may be limited to only protecting against errors in specific locations. Researchers have been exploring software detection and correction methods as an alternative, commonly trading either overhead in execution time or memory usage to protect against faults. Quantum computers, a relatively recent advancement in computing technology, experience similar errors on a much more severe scale. The errors are more frequent, costly, and difficult to detect and correct. Error correction algorithms like Shor’s code promise to completely remove errors, but they cannot be implemented on current noisy intermediate-scale quantum (NISQ) systems due to the low number of available qubits. Until the physical systems become large enough to support error correction, researchers instead have been studying other methods to reduce and compensate for errors. In this work, we present two methods for improving the resilience of classical processes, both single- and multi-threaded. We then introduce quantum computing and compare the nature of errors and correction methods to previous classical methods. We further discuss two designs for improving compilation of quantum circuits. One method, focused on quantum neural networks (QNNs), takes advantage of partial compilation to avoid recompiling the entire circuit each time. The other method is a new approach to compiling quantum circuits using graph neural networks (GNNs) to improve the resilience of quantum circuits and increase fidelity. By using GNNs with reinforcement learning, we can train a compiler to provide improved qubit allocation that improves the success rate of quantum circuits
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