On Timing Model Extraction and Hierarchical Statistical Timing Analysis

In this paper, we investigate the challenges to apply Statistical Static Timing Analysis (SSTA) in hierarchical design flow, where modules supplied by IP vendors are used to hide design details for IP protection and to reduce the complexity of design and verification. For the three basic circuit types, combinational, flip-flop-based and latch-controlled, we propose methods to extract timing models which contain interfacing as well as compressed internal constraints. Using these compact timing models the runtime of full-chip timing analysis can be reduced, while circuit details from IP vendors are not exposed. We also propose a method to reconstruct the correlation between modules during full-chip timing analysis. This correlation can not be incorporated into timing models because it depends on the layout of the corresponding modules in the chip. In addition, we investigate how to apply the extracted timing models with the reconstructed correlation to evaluate the performance of the complete design. Experiments demonstrate that using the extracted timing models and reconstructed correlation full-chip timing analysis can be several times faster than applying the flattened circuit directly, while the accuracy of statistical timing analysis is still well maintained

Inter-module Interfacing techniques for SoCs with multiple clock domains to address challenges in modern deep sub-micron technologies

Miniaturization of integrated circuits (ICs) due to the improvement in lithographic techniques in modem deep sub-micron (DSM) technologies allows several complex processing elements to coexist in one IC, which are called System-on-Chip. As a first contribution, this thesis quantitatively analyzes the severity of timing constraints associated with Clock Distribution Network (CDN) in modem DSM technologies and shows that different processing elements may work in different dock domains to alleviate these constraints. Such systems are known as Globally Asynchronous Locally Synchronous (GALS) systems. It is imperative that different processing elements of a GALS system need to communicate with each other through some interfacing technique, and these interfaces can be asynchronous or synchronous. Conventionally, the asynchronous interfaces are described at the Register Transfer Logic (RTL) or system level. Such designs are susceptible to certain design constraints that cannot be addressed at higher abstraction levels; crosstalk glitch is one such constraint. This thesis initially identifies, using an analytical model, the possibility of asynchronous interface malfunction due to crosstalk glitch propagation. Next, we characterize crosstalk glitch propagation under normal operating conditions for two different classes of asynchronous protocols, namely bundled data protocol based and delay insensitive asynchronous designs. Subsequently, we propose a logic abstraction level modeling technique, which provides a framework to the designer to verify the asynchronous protocols against crosstalk glitches. The utility of this modeling technique is demonstrated experimentally on a Xilinx Virtex-II Pro FPGA. Furthermore, a novel methodology is proposed to quench such crosstalk glitch propagation through gating the asynchronous interface from sending the signal during potential glitch vulnerable instances. This methodology is termed as crosstalk glitch gating. This technique is successfully applied to obtain crosstalk glitch quenching in the representative interfaces. This thesis also addresses the dock skew challenges faced by high-performance synchronous interfacing methodologies in modem DSM technologies. The proposed methodology allows communicating modules to run at a frequency that is independent of the dock skew. Leveraging a novel clock-scheduling algorithm, our technique permits a faster module to communicate safely with a slower module without slowing down. Safe data communications for mesochronous schemes and for the cases when communicating modules have dock frequency ratios of integer or coprime numbers are theoretically explained and experimentally demonstrated. A clock-scheduling technique to dynamically accommodate phase variations is also proposed. These methods are implemented to the Xilinx Virtex II Pro technology. Experiments prove that the proposed interfacing scheme allows modules to communicate data safely, for mesochronous schemes, at 350 MHz, which is the limit of the technology used, under a dock skew of more than twice the time period (i.e. a dock skew of 12 ns

TERPS: The Embedded Reliable Processing System

Electromagnetic Interference (EMI) can have an adverse effect on commercial electronics. As feature sizes of integrated circuits become smaller, their susceptibility to EMI increases. In light of this, integrated circuits will face substantial problems in the future either from electromagnetic disturbances or intentionally generated EMI from a malicious source. The Embedded Reliable Processing System (TERPS) is a fault tolerant system architecture which can significantly reduce the threat of EMI in computer systems. TERPS employs a checkpoint and rollback recovery mechanism tied with a multi-phase commit protocol and 3D IC technology. This enables it to recover from substantial EMI without having to shutdown or reboot. In the face of such EMI, only a loss in performance dictated by the strength and duration of the interference and the frequency of checkpointing will be seen. Various conditions in which chips can fail under the influence of EMI are described. The checkpoint and rollback recovery mechanism and the resulting TERPS architecture is stipulated. A thorough evaluation of the design correctness is provided. The technique is implemented in Verilog HDL using a 16-bit, 5-stage pipelined processor to show proof of concept. The performance overhead is calculated for different checkpointing intervals and is shown to be very reasonable (5-6% for checkpointing every 128 CPU cycles)

Study of Layout Techniques in Dynamic Logic Circuitry for Single Event Effect Mitigation

Dynamic logic circuits are highly suitable for high-speed applications, considering the fact that they have a smaller area and faster transition. However, their application in space or other radiation-rich environments has been significantly inhibited by their susceptibility to radiation effects. This work begins with the basic operations of dynamic logic circuits, elaborates upon the physics underlying their radiation vulnerability, and evaluates three techniques that harden dynamic logic from the layout: drain extension, pulse quenching, and a proposed method. The drain extension method adds an extra drain to the sensitive node in order to improve charge sharing, the pulse quenching scheme utilizes charge sharing by duplicating a component that offsets the transient pulse, and the proposed technique takes advantage of both. Domino buffers designed using these three techniques, along with a conventional design as reference, were modeled and simulated using a 3D TCAD tool. Simulation results confirm a significant reduction of soft error rate in the proposed technique and suggest a greater reduction with angled incidence. A 130 nm chip containing designed buffer and register chains was fabricated and tested with heavy ion irradiation. According to the experiment results, the proposed design achieved 30% soft error rate reduction, with 19%, 20%, and 10% overhead in speed, power, and area, respectively

Analysis of Single Event Upsets Propagation at Register Transfer Level in Combinational and Sequential Circuits Based on Satisfiability Modulo Theories

The progressive scaling of semiconductor technologies has led to significant performance improvements in digital designs. However, ultra-deep sub-micron technologies have increased the vulnerability of VLSI designs to soft errors. In order to allow a cost-effective reliability aware design process, it is critical to assess soft error reliability parameters in early design stages. This thesis proposes a new technique to model, analyze and estimate the propagation of Single Event Upsets (SEUs) in combinational and sequential designs described at the Register Transfer Level (RTL) using Satisfiability Modulo Theories (SMT). The propagation of SEUs through RTL bit-vector constructs is modeled as a Satisfiability problem using the SMT theory of bit-vectors. At first, for combinational designs, two different analysis techniques, concrete and abstract modeling, are used in order to investigate the efficiency and accuracy of a data type reduction technique for soft error analysis. To analyze the vulnerability of the combinational circuits, we compute the Soft Error Rate (SER), which is a summation of the propagation probabilities. Concrete modeling uses two versions of the design, one faulty and one fault-free, in order to analyze SEU propagation. Abstract modeling uses a data type reduction technique to evaluate the difference in performance and accuracy over the first method. Experimental results demonstrate that the loss in accuracy due to abstract modeling depends on the design behavior. However, abstract modeling allows to reduce processing time significantly. Following this first approach, the methodology is then extended to model and analyze SEU propagation in sequential circuits at RTL. In order to estimate the vulnerability of sequential circuits to soft errors, the methodology must be adapted to represent state transitions. To do so, we present an approach that uses circuit unrolling. This approach uses multiple unrolled copies of the design to represent the various state transitions. The fault propagation is then analyzed through a certain number of states. Useful information regarding the vulnerability to SEUs of the sequential circuit can then be generated. The propagation probabilities can be computed from the SEU injection cycle to multiple subsequent cycles. These results are then used to estimate the circuit Soft Error Rate (SER). Experimental results demonstrate the effectiveness and the applicability of the proposed approach. Finally, we present a new methodology to estimate digital circuit vulnerability to soft errors at Register Transfer Level (RTL). Single Event Upsets (SEUs) propagation through RTL bit-vector operations is modeled and analyzed using a different modeling approach based on Satisfiability Modulo Theories (SMTs). The objective of this new approach is to improve the efficiency of the analysis. For instance, the bit-vector reduction operators and arithmetic operators were modeled in SMT to include the fault propagation properties. This approach uses only one copy of the design to do the analysis. This means that the fault propagation properties are embedded within the SMT equivalent of the RTL constructs themselves, and therefore does not require two-copies of the design to analyze. In order to illustrate the practical utilization of our work, we have analyzed different RTL combinational circuits. Experimental results demonstrate that the proposed framework is faster than other comparable contemporary techniques. Moreover, it provides more accurate and detailed results of the circuit vulnerability allowing a more efficient applicability of fault tolerance techniques

Rapid SoC Design: On Architectures, Methodologies and Frameworks

Modern applications like machine learning, autonomous vehicles, and 5G networking require an order of magnitude boost in processing capability. For several decades, chip designers have relied on Moore’s Law - the doubling of transistor count every two years to deliver improved performance, higher energy efficiency, and an increase in transistor density. With the end of Dennard’s scaling and a slowdown in Moore’s Law, system architects have developed several techniques to deliver on the traditional performance and power improvements we have come to expect. More recently, chip designers have turned towards heterogeneous systems comprised of more specialized processing units to buttress the traditional processing units. These specialized units improve the overall performance, power, and area (PPA) metrics across a wide variety of workloads and applications. While the GPU serves as a classical example, accelerators for machine learning, approximate computing, graph processing, and database applications have become commonplace. This has led to an exponential growth in the variety (and count) of these compute units found in modern embedded and high-performance computing platforms. The various techniques adopted to combat the slowing of Moore’s Law directly translates to an increase in complexity for modern system-on-chips (SoCs). This increase in complexity in turn leads to an increase in design effort and validation time for hardware and the accompanying software stacks. This is further aggravated by fabrication challenges (photo-lithography, tooling, and yield) faced at advanced technology nodes (below 28nm). The inherent complexity in modern SoCs translates into increased costs and time-to-market delays. This holds true across the spectrum, from mobile/handheld processors to high-performance data-center appliances. This dissertation presents several techniques to address the challenges of rapidly birthing complex SoCs. The first part of this dissertation focuses on foundations and architectures that aid in rapid SoC design. It presents a variety of architectural techniques that were developed and leveraged to rapidly construct complex SoCs at advanced process nodes. The next part of the dissertation focuses on the gap between a completed design model (in RTL form) and its physical manifestation (a GDS file that will be sent to the foundry for fabrication). It presents methodologies and a workflow for rapidly walking a design through to completion at arbitrary technology nodes. It also presents progress on creating tools and a flow that is entirely dependent on open-source tools. The last part presents a framework that not only speeds up the integration of a hardware accelerator into an SoC ecosystem, but emphasizes software adoption and usability.PHDElectrical and Computer EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/168119/1/ajayi_1.pd

Resilience of an embedded architecture using hardware redundancy

In the last decade the dominance of the general computing systems market has being replaced by embedded systems with billions of units manufactured every year. Embedded systems appear in contexts where continuous operation is of utmost importance and failure can be profound. Nowadays, radiation poses a serious threat to the reliable operation of safety-critical systems. Fault avoidance techniques, such as radiation hardening, have been commonly used in space applications. However, these components are expensive, lag behind commercial components with regards to performance and do not provide 100% fault elimination. Without fault tolerant mechanisms, many of these faults can become errors at the application or system level, which in turn, can result in catastrophic failures. In this work we study the concepts of fault tolerance and dependability and extend these concepts providing our own definition of resilience. We analyse the physics of radiation-induced faults, the damage mechanisms of particles and the process that leads to computing failures. We provide extensive taxonomies of 1) existing fault tolerant techniques and of 2) the effects of radiation in state-of-the-art electronics, analysing and comparing their characteristics. We propose a detailed model of faults and provide a classification of the different types of faults at various levels. We introduce an algorithm of fault tolerance and define the system states and actions necessary to implement it. We introduce novel hardware and system software techniques that provide a more efficient combination of reliability, performance and power consumption than existing techniques. We propose a new element of the system called syndrome that is the core of a resilient architecture whose software and hardware can adapt to reliable and unreliable environments. We implement a software simulator and disassembler and introduce a testing framework in combination with ERA’s assembler and commercial hardware simulators

NASA SERC 1990 Symposium on VLSI Design

This document contains papers presented at the first annual NASA Symposium on VLSI Design. NASA's involvement in this event demonstrates a need for research and development in high performance computing. High performance computing addresses problems faced by the scientific and industrial communities. High performance computing is needed in: (1) real-time manipulation of large data sets; (2) advanced systems control of spacecraft; (3) digital data transmission, error correction, and image compression; and (4) expert system control of spacecraft. Clearly, a valuable technology in meeting these needs is Very Large Scale Integration (VLSI). This conference addresses the following issues in VLSI design: (1) system architectures; (2) electronics; (3) algorithms; and (4) CAD tools