Feature Selection via Binary Simultaneous Perturbation Stochastic Approximation

Feature selection (FS) has become an indispensable task in dealing with today's highly complex pattern recognition problems with massive number of features. In this study, we propose a new wrapper approach for FS based on binary simultaneous perturbation stochastic approximation (BSPSA). This pseudo-gradient descent stochastic algorithm starts with an initial feature vector and moves toward the optimal feature vector via successive iterations. In each iteration, the current feature vector's individual components are perturbed simultaneously by random offsets from a qualified probability distribution. We present computational experiments on datasets with numbers of features ranging from a few dozens to thousands using three widely-used classifiers as wrappers: nearest neighbor, decision tree, and linear support vector machine. We compare our methodology against the full set of features as well as a binary genetic algorithm and sequential FS methods using cross-validated classification error rate and AUC as the performance criteria. Our results indicate that features selected by BSPSA compare favorably to alternative methods in general and BSPSA can yield superior feature sets for datasets with tens of thousands of features by examining an extremely small fraction of the solution space. We are not aware of any other wrapper FS methods that are computationally feasible with good convergence properties for such large datasets.Comment: This is the Istanbul Sehir University Technical Report #SHR-ISE-2016.01. A short version of this report has been accepted for publication at Pattern Recognition Letter

Nearest prototype classification of noisy data

Nearest prototype approaches offer a common way to design classifiers. However, when data is noisy, the success of this sort of classifiers depends on some parameters that the designer needs to tune, as the number of prototypes. In this work, we have made a study of the ENPC technique, based on the nearest prototype approach, in noisy datasets. Previous experimentation of this algorithm had shown that it does not require any parameter tuning to obtain good solutions in problems where class limits are well defined, and data is not noisy. In this work, we show that the algorithm is able to obtain solutions with high classification success even when data is noisy. A comparison with optimal (hand made) solutions and other different classification algorithms demonstrates the good performance of the ENPC algorithm in accuracy and number of prototypes as the noise level increases. We have performed experiments in four different datasets, each of them with different characteristics.Publicad

A Survey on Metric Learning for Feature Vectors and Structured Data

The need for appropriate ways to measure the distance or similarity between data is ubiquitous in machine learning, pattern recognition and data mining, but handcrafting such good metrics for specific problems is generally difficult. This has led to the emergence of metric learning, which aims at automatically learning a metric from data and has attracted a lot of interest in machine learning and related fields for the past ten years. This survey paper proposes a systematic review of the metric learning literature, highlighting the pros and cons of each approach. We pay particular attention to Mahalanobis distance metric learning, a well-studied and successful framework, but additionally present a wide range of methods that have recently emerged as powerful alternatives, including nonlinear metric learning, similarity learning and local metric learning. Recent trends and extensions, such as semi-supervised metric learning, metric learning for histogram data and the derivation of generalization guarantees, are also covered. Finally, this survey addresses metric learning for structured data, in particular edit distance learning, and attempts to give an overview of the remaining challenges in metric learning for the years to come.Comment: Technical report, 59 pages. Changes in v2: fixed typos and improved presentation. Changes in v3: fixed typos. Changes in v4: fixed typos and new method

One-Class Classification: Taxonomy of Study and Review of Techniques

One-class classification (OCC) algorithms aim to build classification models when the negative class is either absent, poorly sampled or not well defined. This unique situation constrains the learning of efficient classifiers by defining class boundary just with the knowledge of positive class. The OCC problem has been considered and applied under many research themes, such as outlier/novelty detection and concept learning. In this paper we present a unified view of the general problem of OCC by presenting a taxonomy of study for OCC problems, which is based on the availability of training data, algorithms used and the application domains applied. We further delve into each of the categories of the proposed taxonomy and present a comprehensive literature review of the OCC algorithms, techniques and methodologies with a focus on their significance, limitations and applications. We conclude our paper by discussing some open research problems in the field of OCC and present our vision for future research.Comment: 24 pages + 11 pages of references, 8 figure