Technology and layout-related testing of static random-access memories

Static random-access memories (SRAMs) exhibit faults that are electrical in nature. Functional and electrical testing are performed to diagnose faulty operation. These tests are usually designed from simple fault models that describe the chip interface behavior without a thorough analysis of the chip layout and technology. However, there are certain technology and layout-related defects that are internal to the chip and are mostly time-dependent in nature. The resulting failures may or may not seriously degrade the input/output interface behavior. They may show up as electrical faults (such as a slow access fault) and/or functional faults (such as a pattern sensitive fault). However, these faults cannot be described properly with the functional fault models because these models do not take timing into account. Also, electrical fault models that describe merely the input/output interface behavior are inadequate to characterize every possible defect in the basic SRAM cell. Examples of faults produced by these defects are: (a) static data loss, (b) abnormally high currents drawn from the power supply, etc. Generating tests for such faults often requires a thorough understanding and analysis of the circuit technology and layout. In this article, we shall examine ways to characterize and test such faults. We shall divide such faults into two categories depending on the types of SRAMs they effect—silicon SRAMs and GaAs SRAMs.Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/43015/1/10836_2004_Article_BF00972519.pd

March AB, March AB1: new March tests for unlinked dynamic memory faults

Among the different types of algorithms proposed to test static random access memories (SRAMs), March tests have proven to be faster, simpler and regularly structured. New memory production technologies introduce new classes of faults usually referred to as dynamic memory faults. A few March tests for dynamic fault, with different fault coverage, have been published. In this paper, we propose new March tests targeting unlinked dynamic faults with lower complexity than published ones. Comparison results show that the proposed March tests provide the same fault coverage of the known ones, but they reduce the test complexity, and therefore the test tim

An On-line BIST RAM Architecture with Self Repair Capabilities

The emerging field of self-repair computing is expected to have a major impact on deployable systems for space missions and defense applications, where high reliability, availability, and serviceability are needed. In this context, RAM (random access memories) are among the most critical components. This paper proposes a built-in self-repair (BISR) approach for RAM cores. The proposed design, introducing minimal and technology-dependent overheads, can detect and repair a wide range of memory faults including: stuck-at, coupling, and address faults. The test and repair capabilities are used on-line, and are completely transparent to the external user, who can use the memory without any change in the memory-access protocol. Using a fault-injection environment that can emulate the occurrence of faults inside the module, the effectiveness of the proposed architecture in terms of both fault detection and repairing capability was verified. Memories of various sizes have been considered to evaluate the area-overhead introduced by this proposed architectur

Online and Offline BIST in IP-Core Design

This article presents an online and offline built-in self-test architecture implemented as an SRAM intellectual-property core for telecommunication applications. The architecture combines fault-latency reduction, code-based fault detection, and architecture-based fault avoidance to meet reliability constraint

Automating defects simulation and fault modeling for SRAMs

The continues improvement in manufacturing process density for very deep sub micron technologies constantly leads to new classes of defects in memory devices. Exploring the effect of fabrication defects in future technologies, and identifying new classes of realistic functional fault models with their corresponding test sequences, is a time consuming task up to now mainly performed by hand. This paper proposes a new approach to automate this procedure. The proposed method exploits the capabilities of evolutionary algorithms to automatically identify faulty behaviors into defective memories and to define the corresponding fault models and relevant test sequences. Target defects are modeled at the electrical level in order to optimize the results to the specific technology and memory architecture

Design Solutions For Modular Satellite Architectures

The cost-effective access to space envisaged by ESA would open a wide range of new opportunities and markets, but is still many years ahead. There is still a lack of devices, circuits, systems which make possible to develop satellites, ground stations and related services at costs compatible with the budget of academic institutions and small and medium enterprises (SMEs). As soon as the development time and cost of small satellites will fall below a certain threshold (e.g. 100,000 to 500,000 €), appropriate business models will likely develop to ensure a cost-effective and pervasive access to space, and related infrastructures and services. These considerations spurred the activity described in this paper, which is aimed at: - proving the feasibility of low-cost satellites using COTS (Commercial Off The Shelf) devices. This is a new trend in the space industry, which is not yet fully exploited due to the belief that COTS devices are not reliable enough for this kind of applications; - developing a flight model of a flexible and reliable nano-satellite with less than 25,000€; - training students in the field of avionics space systems: the design here described is developed by a team including undergraduate students working towards their graduation work. The educational aspects include the development of specific new university courses; - developing expertise in the field of low-cost avionic systems, both internally (university staff) and externally (graduated students will bring their expertise in their future work activity); - gather and cluster expertise and resources available inside the university around a common high-tech project; - creating a working group composed of both University and SMEs devoted to the application of commercially available technology to space environment. The first step in this direction was the development of a small low cost nano-satellite, started in the year 2004: the name of this project was PiCPoT (Piccolo Cubo del Politecnico di Torino, Small Cube of Politecnico di Torino). The project was carried out by some departments of the Politecnico, in particular Electronics and Aerospace. The main goal of the project was to evaluate the feasibility of using COTS components in a space project in order to greatly reduce costs; the design exploited internal subsystems modularity to allow reuse and further cost reduction for future missions. Starting from the PiCPoT experience, in 2006 we began a new project called ARaMiS (Speretta et al., 2007) which is the Italian acronym for Modular Architecture for Satellites. This work describes how the architecture of the ARaMiS satellite has been obtained from the lesson learned from our former experience. Moreover we describe satellite operations, giving some details of the major subsystems. This work is composed of two parts. The first one describes the design methodology, solutions and techniques that we used to develop the PiCPoT satellite; it gives an overview of its operations, with some details of the major subsystems. Details on the specifications can also be found in (Del Corso et al., 2007; Passerone et al, 2008). The second part, indeed exploits the experience achieved during the PiCPoT development and describes a proposal for a low-cost modular architecture for satellite

March AB, a State-of-the-Art March Test for Realistic Static Linked Faults and Dynamic Faults in SRAMs

Memory testing commonly faces two issues: the characterisation of detailed and realistic fault models, and the definition of time-efficient test algorithms able to detect them. Among the different types of algorithms proposed for testing static random access memories (SRAMs), march tests have proven to be faster, simpler and regularly structured. The continuous evolution of the memory technology requires the constant introduction of new classes of faults, such as dynamic and linked faults. Presented here is March AB, a march test targeting realistic memory static linked faults and dynamic unlinked faults. Comparison results show that the proposed march test provides the same fault coverage of already published algorithms reducing the test complexity and therefore the test tim