A unified approach for the synthesis of self-testable finite state machines

Conventionally self-test hardware is added after synthesis is completed. For highly sequential circuits like controllers this design method either leads to high hardware overheads or compromises fault coverage. In this paper we outline a unified approach for considering self-test hardware like pattern generators and signature registers during synthesis. Three novel target structures are presented, and a method for designing parallel self-testable circuits is discussed in more detail. For a collection of benchmark circuits we show that hardware overheads for self-testable circuits can be significantly reduced this way without sacrificing testability

New Logic Synthesis As Nanotechnology Enabler (invited paper)

Nanoelectronics comprises a variety of devices whose electrical properties are more complex as compared to CMOS, thus enabling new computational paradigms. The potentially large space for innovation has to be explored in the search for technologies that can support large-scale and high- performance circuit design. Within this space, we analyze a set of emerging technologies characterized by a similar computational abstraction at the design level, i.e., a binary comparator or a majority voter. We demonstrate that new logic synthesis techniques, natively supporting this abstraction, are the technology enablers. We describe models and data-structures for logic design using emerging technologies and we show results of applying new synthesis algorithms and tools. We conclude that new logic synthesis methods are required to both evaluate emerging technologies and to achieve the best results in terms of area, power and performance