Uneven illumination surface defects inspection based on convolutional neural network

Surface defect inspection based on machine vision is often affected by uneven illumination. In order to improve the inspection rate of surface defects inspection under uneven illumination condition, this paper proposes a method for detecting surface image defects based on convolutional neural network, which is based on the adjustment of convolutional neural networks, training parameters, changing the structure of the network, to achieve the purpose of accurately identifying various defects. Experimental on defect inspection of copper strip and steel images shows that the convolutional neural network can automatically learn features without preprocessing the image, and correct identification of various types of image defects affected by uneven illumination, thus overcoming the drawbacks of traditional machine vision inspection methods under uneven illumination

Surface Defect Classification for Hot-Rolled Steel Strips by Selectively Dominant Local Binary Patterns

Developments in defect descriptors and computer vision-based algorithms for automatic optical inspection (AOI) allows for further development in image-based measurements. Defect classification is a vital part of an optical-imaging-based surface quality measuring instrument. The high-speed production rhythm of hot continuous rolling requires an ultra-rapid response to every component as well as algorithms in AOI instrument. In this paper, a simple, fast, yet robust texture descriptor, namely selectively dominant local binary patterns (SDLBPs), is proposed for defect classification. First, an intelligent searching algorithm with a quantitative thresholding mechanism is built to excavate the dominant non-uniform patterns (DNUPs). Second, two convertible schemes of pattern code mapping are developed for binary encoding of all uniform patterns and DNUPs. Third, feature extraction is carried out under SDLBP framework. Finally, an adaptive region weighting method is built for further strengthening the original nearest neighbor classifier in the feature matching stage. The extensive experiments carried out on an open texture database (Outex) and an actual surface defect database (Dragon) indicates that our proposed SDLBP yields promising performance on both classification accuracy and time efficiencyPeer reviewe

Inspection System And Method For Bond Detection And Validation Of Surface Mount Devices Using Sensor Fusion And Active Perception

A hybrid surface mount component inspection system which includes both vision and infrared inspection techniques to determine the presence of surface mount components on a printed wiring board, and the quality of solder joints of surface mount components on printed wiring boards by using data level sensor fusion to combine data from two infrared sensors to obtain emissivity independent thermal signatures of solder joints, and using feature level sensor fusion with active perception to assemble and process inspection information from any number of sensors to determine characteristic feature sets of different defect classes to classify solder defects.Georgia Tech Research Corporatio

Depth estimation of inner wall defects by means of infrared thermography

There two common methods dealing with interpreting data from infrared thermography: qualitatively and quantitatively. On a certain condition, the first method would be sufficient, but for an accurate interpretation, one should undergo the second one. This report proposes a method to estimate the defect depth quantitatively at an inner wall of petrochemical furnace wall. Finite element method (FEM) is used to model multilayer walls and to simulate temperature distribution due to the existence of the defect. Five informative parameters are proposed for depth estimation purpose. These parameters are the maximum temperature over the defect area (Tmax-def), the average temperature at the right edge of the defect (Tavg-right), the average temperature at the left edge of the defect (Tavg-left), the average temperature at the top edge of the defect (Tavg-top), and the average temperature over the sound area (Tavg-so). Artificial Neural Network (ANN) was trained with these parameters for estimating the defect depth. Two ANN architectures, Multi Layer Perceptron (MLP) and Radial Basis Function (RBF) network were trained for various defect depths. ANNs were used to estimate the controlled and testing data. The result shows that 100% accuracy of depth estimation was achieved for the controlled data. For the testing data, the accuracy was above 90% for the MLP network and above 80% for the RBF network. The results showed that the proposed informative parameters are useful for the estimation of defect depth and it is also clear that ANN can be used for quantitative interpretation of thermography data

Integrated process of images and acceleration measurements for damage detection

The use of mobile robots and UAV to catch unthinkable images together with on-site global automated acceleration measurements easy achievable by wireless sensors, able of remote data transfer, have strongly enhanced the capability of defect and damage evaluation in bridges. A sequential procedure is, here, proposed for damage monitoring and bridge condition assessment based on both: digital image processing for survey and defect evaluation and structural identification based on acceleration measurements. A steel bridge has been simultaneously inspected by UAV to acquire images using visible light, or infrared radiation, and monitored through a wireless sensor network (WSN) measuring structural vibrations. First, image processing has been used to construct a geometrical model and to quantify corrosion extension. Then, the consistent structural model has been updated based on the modal quantities identified using the acceleration measurements acquired by the deployed WSN. © 2017 The Authors. Published by Elsevier Ltd

Internal visual workmanship standard for microelectronic devices /NASA STD XX-2/ and training manual, volume 2

Internal visual workmanship standards for monolithic microelectronic devices - training manua