Indirect test of M-S circuits using multiple specification band guarding

Testing analog and mixed-signal circuits is a costly task due to the required test time targets and high end technical resources. Indirect testing methods partially address these issues providing an efficient solution using easy to measure CUT information that correlates with circuit performances. In this work, a multiple specification band guarding technique is proposed as a method to achieve a test target of misclassified circuits. The acceptance/rejection test regions are encoded using octrees in the measurement space, where the band guarding factors precisely tune the test decision boundary according to the required test yield targets. The generated octree data structure serves to cluster the forthcoming circuits in the production testing phase by solely relying on indirect measurements. The combined use of octree based encoding and multiple specification band guarding makes the testing procedure fast, efficient and highly tunable. The proposed band guarding methodology has been applied to test a band-pass Butterworth filter under parametric variations. Promising simulation results are reported showing remarkable improvements when the multiple specification band guarding criterion is used.Peer ReviewedPostprint (author's final draft

ART Neural Networks: Distributed Coding and ARTMAP Applications

ART (Adaptive Resonance Theory) neural networks for fast, stable learning and prediction have been applied in a variety of areas. Applications include airplane design and manufacturing, automatic target recognition, financial forecasting, machine tool monitoring, digital circuit design, chemical analysis, and robot vision. Supervised ART architectures, called ARTMAP systems, feature internal control mechanisms that create stable recognition categories of optimal size by maximizing code compression while minimizing predictive error in an on-line setting. Special-purpose requirements of various application domains have led to a number of ARTMAP variants, including fuzzy ARTMAP, ART-EMAP, Gaussian ARTMAP, and distributed ARTMAP. ARTMAP has been used for a variety of applications, including computer-assisted medical diagnosis. Medical databases present many of the challenges found in general information management settings where speed, efficiency, ease of use, and accuracy are at a premium. A direct goal of improved computer-assisted medicine is to help deliver quality emergency care in situations that may be less than ideal. Working with these problems has stimulated a number of ART architecture developments, including ARTMAP-IC [1]. This paper describes a recent collaborative effort, using a new cardiac care database for system development, has brought together medical statisticians and clinicians at the New England Medical Center with researchers developing expert systems and neural networks, in order to create a hybrid method for medical diagnosis. The paper also considers new neural network architectures, including distributed ART {dART), a real-time model of parallel distributed pattern learning that permits fast as well as slow adaptation, without catastrophic forgetting. Local synaptic computations in the dART model quantitatively match the paradoxical phenomenon of Markram-Tsodyks [2] redistribution of synaptic efficacy, as a consequence of global system hypotheses.Office of Naval Research (N00014-95-1-0409, N00014-95-1-0657

Design and development of a novel Invasive Blood Pressure simulator for patient's monitor testing

This paper presents a newly-designed and realized Invasive Blood Pressure (IBP) device for the simulation on patient’s monitors. This device shows improvements and presents extended features with respect to a first prototype presented by the authors and similar systems available in the state-of-the-art. A peculiarity of the presented device is that all implemented features can be customized from the developer and from the point of view of the end user. The realized device has been tested, and its performances in terms of accuracy and of the back-loop measurement of the output for the blood pressure regulation utilization have been described. In particular, an accuracy of ±1 mmHg at 25 °C, on a range from −30 to 300 mmHg, was evaluated under different test conditions. The designed device is an ideal tool for testing IBP modules, for zero setting, and for calibrations. The implemented extended features, like the generation of custom waveforms and the Universal Serial Bus (USB) connectivity, allow use of this device in a wide range of applications, from research to equipment maintenance in clinical environments to educational purposes. Moreover, the presented device represents an innovation, both in terms of technology and methodologies: It allows quick and efficient tests to verify the proper functioning of IBP module of patients’ monitors. With this innovative device, tests can be performed directly in the field and faster procedures can be implemented by the clinical maintenance personnel. This device is an open source project and all materials, hardware, and software are fully available for interested developers or researchers.Web of Science201art. no. 25

Feature selection and feature design for machine learning indirect test: a tutorial review

International audienc

Constraint-driven RF test stimulus generation and built-in test

With the explosive growth in wireless applications, the last decade witnessed an ever-increasing test challenge for radio frequency (RF) circuits. While the design community has pushed the envelope far into the future, by expanding CMOS process to be used with high-frequency wireless devices, test methodology has not advanced at the same pace. Consequently, testing such devices has become a major bottleneck in high-volume production, further driven by the growing need for tighter quality control. RF devices undergo testing during the prototype phase and during high-volume manufacturing (HVM). The benchtop test equipment used throughout prototyping is very precise yet specialized for a subset of functionalities. HVM calls for a different kind of test paradigm that emphasizes throughput and sufficiency, during which the projected performance parameters are measured one by one for each device by automated test equipment (ATE) and compared against defined limits called specifications. The set of tests required for each product differs greatly in terms of the equipment required and the time taken to test individual devices. Together with signal integrity, precision, and repeatability concerns, the initial cost of RF ATE is prohibitively high. As more functionality and protocols are integrated into a single RF device, the required number of specifications to be tested also increases, adding to the overall cost of testing, both in terms of the initial and recurring operating costs. In addition to the cost problem, RF testing proposes another challenge when these components are integrated into package-level system solutions. In systems-on-packages (SOP), the test problems resulting from signal integrity, input/output bandwidth (IO), and limited controllability and observability have initiated a paradigm shift in high-speed analog testing, favoring alternative approaches such as built-in tests (BIT) where the test functionality is brought into the package. This scheme can make use of a low-cost external tester connected through a low-bandwidth link in order to perform demanding response evaluations, as well as make use of the analog-to-digital converters and the digital signal processors available in the package to facilitate testing. Although research on analog built-in test has demonstrated hardware solutions for single specifications, the paradigm shift calls for a rather general approach in which a single methodology can be applied across different devices, and multiple specifications can be verified through a single test hardware unit, minimizing the area overhead. Specification-based alternate test methodology provides a suitable and flexible platform for handling the challenges addressed above. In this thesis, a framework that integrates ATE and system constraints into test stimulus generation and test response extraction is presented for the efficient production testing of high-performance RF devices using specification-based alternate tests. The main components of the presented framework are as follows: Constraint-driven RF alternate test stimulus generation: An automated test stimulus generation algorithm for RF devices that are evaluated by a specification-based alternate test solution is developed. The high-level models of the test signal path define constraints in the search space of the optimized test stimulus. These models are generated in enough detail such that they inherently define limitations of the low-cost ATE and the I/O restrictions of the device under test (DUT), yet they are simple enough that the non-linear optimization problem can be solved empirically in a reasonable amount of time. Feature extractors for BIT: A methodology for the built-in testing of RF devices integrated into SOPs is developed using additional hardware components. These hardware components correlate the high-bandwidth test response to low bandwidth signatures while extracting the test-critical features of the DUT. Supervised learning is used to map these extracted features, which otherwise are too complicated to decipher by plain mathematical analysis, into the specifications under test. Defect-based alternate testing of RF circuits: A methodology for the efficient testing of RF devices with low-cost defect-based alternate tests is developed. The signature of the DUT is probabilistically compared with a class of defect-free device signatures to explore possible corners under acceptable levels of process parameter variations. Such a defect filter applies discrimination rules generated by a supervised classifier and eliminates the need for a library of possible catastrophic defects.Ph.D.Committee Chair: Chatterjee, Abhijit; Committee Member: Durgin, Greg; Committee Member: Keezer, David; Committee Member: Milor, Linda; Committee Member: Sitaraman, Sures

Artificial neural networks and their applications to intelligent fault diagnosis of power transmission lines

Over the past thirty years, the idea of computing based on models inspired by human brains and biological neural networks emerged. Artificial neural networks play an important role in the field of machine learning and hold the key to the success of performing many intelligent tasks by machines. They are used in various applications such as pattern recognition, data classification, stock market prediction, aerospace, weather forecasting, control systems, intelligent automation, robotics, and healthcare. Their architectures generally consist of an input layer, multiple hidden layers, and one output layer. They can be implemented on software or hardware. Nowadays, various structures with various names exist for artificial neural networks, each of which has its own particular applications. Those used types in this study include feedforward neural networks, convolutional neural networks, and general regression neural networks. Increasing the number of layers in artificial neural networks as needed for large datasets, implies increased computational expenses. Therefore, besides these basic structures in deep learning, some advanced techniques are proposed to overcome the drawbacks of original structures in deep learning such as transfer learning, federated learning, and reinforcement learning. Furthermore, implementing artificial neural networks in hardware gives scientists and engineers the chance to perform high-dimensional and big data-related tasks because it removes the constraints of memory access time defined as the von Neuman bottleneck. Accordingly, analog and digital circuits are used for artificial neural network implementations without using general-purpose CPUs. In this study, the problem of fault detection, identification, and location estimation of transmission lines is studied and various deep learning approaches are implemented and designed as solutions. This research work focuses on the transmission lines’ datasets, their faults, and the importance of identification, detection, and location estimation of them. It also includes a comprehensive review of the previous studies to perform these three tasks. The application of various artificial neural networks such as feedforward neural networks, convolutional neural networks, and general regression neural networks for identification, detection, and location estimation of transmission line datasets are also discussed in this study. Some advanced methods based on artificial neural networks are taken into account in this thesis such as the transfer learning technique. These methodologies are designed and applied on transmission line datasets to enable the scientist and engineers with using fewer data points for the training purpose and wasting less time on the training step. This work also proposes a transfer learning-based technique for distinguishing faulty and non-faulty insulators in transmission line images. Besides, an effective design for an activation function of the artificial neural networks is proposed in this thesis. Using hyperbolic tangent as an activation function in artificial neural networks has several benefits including inclusiveness and high accuracy

AI/ML Algorithms and Applications in VLSI Design and Technology

An evident challenge ahead for the integrated circuit (IC) industry in the nanometer regime is the investigation and development of methods that can reduce the design complexity ensuing from growing process variations and curtail the turnaround time of chip manufacturing. Conventional methodologies employed for such tasks are largely manual; thus, time-consuming and resource-intensive. In contrast, the unique learning strategies of artificial intelligence (AI) provide numerous exciting automated approaches for handling complex and data-intensive tasks in very-large-scale integration (VLSI) design and testing. Employing AI and machine learning (ML) algorithms in VLSI design and manufacturing reduces the time and effort for understanding and processing the data within and across different abstraction levels via automated learning algorithms. It, in turn, improves the IC yield and reduces the manufacturing turnaround time. This paper thoroughly reviews the AI/ML automated approaches introduced in the past towards VLSI design and manufacturing. Moreover, we discuss the scope of AI/ML applications in the future at various abstraction levels to revolutionize the field of VLSI design, aiming for high-speed, highly intelligent, and efficient implementations