Studies of irradiated AMS H35 CMOS detectors for the ATLAS tracker upgrade

Silicon detectors based on the HV-CMOS technology are being investigated as possible candidate for the outer layers of the ATLAS pixel detector for the High Luminosity LHC. In this framework the H35Demo ASIC has been produced in the 350 nm AMS technology (H35). The H35Demo chip has a large area ($18.49 \times 24.40 \, \mathrm{mm^2}$) and includes four different pixel matrices and three test structures. In this paper the radiation hardness properties, in particular the evolution of the depletion region with fluence is studied using edge-TCT on test structures. Measurements on the test structures from chips with different substrate resistivity are shown for non irradiated and irradiated devices up to a cumulative fluence of $2 \cdot 10^{15} \, \mathrm{1\,MeV\, n_{eq} / cm^{2}}$

Analog Performance Prediction Based on Archimedean Copulas Generation Algorithm

International audienceTesting analog circuits is a complex and very time consuming task. In contrary to digital circuits, testing analog circuits needs different configurations, each of them targets a certain set of output parameters which are the performances and the test measures. One of the solutions to simplify the test task and optimize test time is the reduction of the number of to-be-tested performances by eliminating redundant ones. However, the main problem with such a solution is the identification of redundant performances. Traditional methods based on calculation of the correlation between different performances or on the defect level are shown to be not sufficient. This paper presents a new method based on the Archimedean copula generation algorithm. It predicts the performance value from each output parameter value based on the dependence (copula) between the two values. Therefore, different performances can be represented by a single output parameter; as a result, less test configurations are required. To validate the proposed approach, a CMOS imager with two performances and one test measure is used. The simulation results show that the two performances can be replaced by a single test measure. Industrial results are also reported to prove the superiority of the proposed approach

Modeling, Analysis and Design of Reliable Digital Imaging System

Charge Coupled Device (CCD) is one of the most popular imaging sensors such as digital camera, digital camcorders, and digital x-ray diagnosis systems to mention a few. As the need for high resolution and high sensitive CCDs, high yield and solid reliability are becoming critical requirements for CCDs. In this context, soft-test/repair method must be developed to achieve high yield and reliability for CCDs. The purpose of this study was to propose soft-test and repair methods for defective pixels in CCD system, thereby realizing more reliable and cost-effective CCD Systems. Various test/repair algorithms are proposed and verified, and BIST/BISR architecture was proposed and the design was verified through verilog HDL simulation. Extensive parametric simulation results are also shown.Computer Science Departmen

Commissioning Perspectives for the ATLAS Pixel Detector

The ATLAS Pixel Detector, the innermost sub-detector of the ATLAS experiment at the Large Hadron Collider, CERN, is an 80 million channel silicon pixel tracking detector designed for high-precision charged particle tracking and secondary vertex reconstruction. It was installed in the ATLAS experiment and commissioning for the first proton-proton collision data taking in 2008 has begun. Due to the complex layout and limited accessibility, quality assurance measurements were continuously performed during production and assembly to ensure that no problematic components are integrated. The assembly of the detector at CERN and related quality assurance measurement results, including comparison to previous production measurements, will be presented. In order to verify that the integrated detector, its data acquisition readout chain, the ancillary services and cooling system as well as the detector control and data acquisition software perform together as expected approximately 8% of the detector system was progressively assembled as close to the final layout as possible. The so-called System Test laboratory setup was operated for several months under experiment-like environment conditions. The interplay between different detector components was studied with a focus on the performance and tunability of the optical data transmission system. Operation and optical tuning procedures were developed and qualified for the upcoming commission ing. The front-end electronics preamplifier threshold tuning and noise performance were studied and noise occupancy of the detector with low sensor bias voltages was investigated. Data taking with cosmic muons was performed to test the data acquisition and trigger system as well as the offline reconstruction and analysis software. The data quality was verified with an extended version of the pixel online monitoring package which was implemented for the ATLAS Combined Testbeam. The detector raw data of the Combined Testbeam and of the System Test cosmic run was converted for offline data analysis with the Pixel bytestream converter which was continuously extended and adapted according to the offline analysis software needs

Radiation Hardness of Thin Low Gain Avalanche Detectors

Low Gain Avalanche Detectors (LGAD) are based on a n++-p+-p-p++ structure where an appropriate doping of the multiplication layer (p+) leads to high enough electric fields for impact ionization. Gain factors of few tens in charge significantly improve the resolution of timing measurements, particularly for thin detectors, where the timing performance was shown to be limited by Landau fluctuations. The main obstacle for their operation is the decrease of gain with irradiation, attributed to effective acceptor removal in the gain layer. Sets of thin sensors were produced by two different producers on different substrates, with different gain layer doping profiles and thicknesses (45, 50 and 80 um). Their performance in terms of gain/collected charge and leakage current was compared before and after irradiation with neutrons and pions up to the equivalent fluences of 5e15 cm-2. Transient Current Technique and charge collection measurements with LHC speed electronics were employed to characterize the detectors. The thin LGAD sensors were shown to perform much better than sensors of standard thickness (~300 um) and offer larger charge collection with respect to detectors without gain layer for fluences <2e15 cm-2. Larger initial gain prolongs the beneficial performance of LGADs. Pions were found to be more damaging than neutrons at the same equivalent fluence, while no significant difference was found between different producers. At very high fluences and bias voltages the gain appears due to deep acceptors in the bulk, hence also in thin standard detectors

MEMS Accelerometers

Micro-electro-mechanical system (MEMS) devices are widely used for inertia, pressure, and ultrasound sensing applications. Research on integrated MEMS technology has undergone extensive development driven by the requirements of a compact footprint, low cost, and increased functionality. Accelerometers are among the most widely used sensors implemented in MEMS technology. MEMS accelerometers are showing a growing presence in almost all industries ranging from automotive to medical. A traditional MEMS accelerometer employs a proof mass suspended to springs, which displaces in response to an external acceleration. A single proof mass can be used for one- or multi-axis sensing. A variety of transduction mechanisms have been used to detect the displacement. They include capacitive, piezoelectric, thermal, tunneling, and optical mechanisms. Capacitive accelerometers are widely used due to their DC measurement interface, thermal stability, reliability, and low cost. However, they are sensitive to electromagnetic field interferences and have poor performance for high-end applications (e.g., precise attitude control for the satellite). Over the past three decades, steady progress has been made in the area of optical accelerometers for high-performance and high-sensitivity applications but several challenges are still to be tackled by researchers and engineers to fully realize opto-mechanical accelerometers, such as chip-scale integration, scaling, low bandwidth, etc

VLSI Design

This book provides some recent advances in design nanometer VLSI chips. The selected topics try to present some open problems and challenges with important topics ranging from design tools, new post-silicon devices, GPU-based parallel computing, emerging 3D integration, and antenna design. The book consists of two parts, with chapters such as: VLSI design for multi-sensor smart systems on a chip, Three-dimensional integrated circuits design for thousand-core processors, Parallel symbolic analysis of large analog circuits on GPU platforms, Algorithms for CAD tools VLSI design, A multilevel memetic algorithm for large SAT-encoded problems, etc

Electronics for Sensors

The aim of this Special Issue is to explore new advanced solutions in electronic systems and interfaces to be employed in sensors, describing best practices, implementations, and applications. The selected papers in particular concern photomultiplier tubes (PMTs) and silicon photomultipliers (SiPMs) interfaces and applications, techniques for monitoring radiation levels, electronics for biomedical applications, design and applications of time-to-digital converters, interfaces for image sensors, and general-purpose theory and topologies for electronic interfaces

Dynamically Controllable Integrated Radiation and Self-Correcting Power Generation in mm-Wave Circuits and Systems

This thesis presents novel design methodologies for integrated radiators and power generation at mm-wave frequencies that are enabled by the continued integration of various electronic and electromagnetic (EM) structures onto the same substrate. Beginning with the observation that transistors and their connections to EM radiating structures on an integrated substrate are essentially free, the concept of multi-port driven (MPD) radiators is introduced, which opens a vast design space that has been generally ignored due to the cost structure associated with discrete components that favors fewer transistors connected to antennas through a single port. From Maxwell's equations, a new antenna architecture, the radial MPD antennas based on the concept of MPD radiators, is analyzed to gain intuition as to the important design parameters that explain the wide-band nature of the antenna itself. The radiator is then designed and implemented at 160 GHz in a 0.13 um SiGe BiCMOS process, and the single element design has a measured effective isotropic radiated power (EIRP) of +4.6 dBm with a total radiated power of 0.63 mW. Next, the radial MPD radiator is adapted to enable dynamic polarization control (DPC). A DPC antenna is capable of controlling its radiated polarization dynamically, and entirely electronically, with no mechanical reconfiguration required. This can be done by having multiple antennas with different polarizations, or within a single antenna that has multiple drive points, as in the case of the MPD radiator with DPC. This radiator changes its polarization by adjusting the relative phase and amplitude of its multiple ports to produce polarizations with any polarization angle, and a wide range of axial ratios. A 2x1 MPD radiator array with DPC at 105 GHz is presented whose measurements show control of the polarization angle throughout the entire 0 degree through 180 degree range while in the linear polarization mode and maintaining axial ratios above 10 dB in all cases. Control of the axial ratio is also demonstrated with a measured range from 2.4 dB through 14 dB, while maintaining a fixed polarization angle. The radiator itself has a measured maximum EIRP of +7.8 dBm, with a total radiated power of 0.9 mW, and is capable of beam steering. MPD radiators were also applied in the domain of integrated silicon photonics. For these designs, the driver transistor circuitry was replaced with silicon optical waveguides and photodiodes to produce a 350 GHz signal. Three of these optical MPD radiator designs have been implemented as 2x2 arrays at 350 GHz. The first is a beam forming array that has a simulated gain of 12.1 dBi with a simulated EIRP of -2 dBm. The second has the same simulated performance, but includes optical phase modulators that enable two-dimensional beam steering. Finally, a third design incorporates multi-antenna DPC by combining the outputs of both left and right handed circularly polarized MPD antennas to produce a linear polarization with controllable polarization angle, and has a simulated gain of 11.9 dBi and EIRP of -3 dBm. In simulation, it can tune the polarization from 0 degrees through 180 degrees while maintaining a radiated power that has a 0.35 dB maximum deviation from the mean. The reliability of mm-wave radiators and power amplifiers was also investigated, and two self-healing systems have been proposed. Self-healing is a global feedback method where integrated sensors detect the performance of the circuit after fabrication and report that data to a digital control algorithm. The algorithm then is capable of setting actuators that can control the performance of the mm-wave circuit and counteract any performance degradation that is observed by the sensors. The first system is for a MPD radiator array with a partially integrated self-healing system. The self-healing MPD radiator senses substrate modes through substrate mode pickup sensors and infers the far-field radiated pattern from those sensors. DC current sensors are also included to determine the DC power consumption of the system. Actuators are implemented in the form of phase and amplitude control of the multiple drive points. The second self-healing system is a fully integrated self-healing power amplifier (PA) at 28 GHz. This system measures the output power, gain and efficiency of the PA using radio frequency (RF) power sensors, DC current sensors and junction temperature sensors. The digital block is synthesized from VHDL code on-chip and it can actuate the output power combining matching network using tunable transmission line stubs, as well as the DC operating point of the amplifying transistors through bias control. Measurements of 20 chips confirm self-healing for two different algorithms for process variation and transistor mismatch, while measurements from 10 chips show healing for load impedance mismatch, and linearity healing. Laser induced partial and total transistor failure show the benefit of self-healing in the case of catastrophic failure, with improvements of up to 3.9 dB over the default case. An exemplary yield specification shows self-healing improving the yield from 0% up through 80%.</p