A framework to explore low-power architecture and variability-aware timing estimation of FPGAs

Master'sMASTER OF ENGINEERIN

Delay Test Quality Evaluation Using Bounded Gate Delays

Abstract: Conventionally, path delay tests are derived in a delay-independent manner, which causes most faults to be robustly untestable. Many non-robust tests are invalidated by hazards caused primarily due to non-zero delays of off-path circuit elements. Thus, non-robust tests are of limited value when process variations change gate delays. We propose a bounded gate delay model for test quality evaluation and give a novel simulation algorithm that is less pessimistic than previous approaches. The key idea is that certain time-correlations among the multiple transitions at the inputs of a gate cannot cause hazard at its output. We maintain “ambiguity lists ” for gates. These are propagated with events, similar to fault lists in a traditional concurrent fault simulation. They are used to suppress erroneous unknown states. Experimental results for ISCAS benchmarks with gate delay variation of ±14 % show a miscorrelation of critical path delay as much as 20%.

Statistical timing for parametric yield prediction of digital integrated circuits

Uncertainty in circuit performance due to manufacturing and environmental variations is increasing with each new generation of technology. It is therefore important to predict the performance of a chip as a probabilistic quantity. This paper proposes three novel path-based algorithms for statistical timing analysis and parametric yield prediction of digital integrated circuits. The methods have been implemented in the context of the EinsTimer static timing analyzer. The three methods are complementary in that they are designed to target different process variation conditions that occur in practice. Numerical results are presented to study the strengths and weaknesses of these complementary approaches. Timing analysis results in the face of statistical temperature and Vdd variations are presented on an industrial ASIC part on which a bounded timing methodology leads to surprisingly wrong result

Fault simulation and test generation for small delay faults

Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they model only a subset of delay defect behaviors. To solve this problem, a more realistic delay fault model has been developed which models delay faults caused by the combination of spot defects and parametric process variation. According to the new model, a realistic delay fault coverage metric has been developed. Traditional path delay fault coverage metrics result in unrealistically low fault coverage, and the real test quality is not reflected. The new metric uses a statistical approach and the simulation based fault coverage is consistent with silicon data. Fast simulation algorithms are also included in this dissertation. The new metric suggests that testing the K longest paths per gate (KLPG) has high detection probability for small delay faults under process variation. In this dissertation, a novel automatic test pattern generation (ATPG) methodology to find the K longest testable paths through each gate for both combinational and sequential circuits is presented. Many techniques are used to reduce search space and CPU time significantly. Experimental results show that this methodology is efficient and able to handle circuits with an exponential number of paths, such as ISCAS85 benchmark circuit c6288. The ATPG methodology has been implemented on industrial designs. Speed binning has been done on many devices and silicon data has shown significant benefit of the KLPG test, compared to several traditional delay test approaches

Adaptive Integrated Circuit Design for Variation Resilience and Security

The past few decades witness the burgeoning development of integrated circuit in terms of process technology scaling. Along with the tremendous benefits coming from the scaling, challenges are also presented in various stages. During the design time, the complexity of developing a circuit with millions to billions of smaller size transistors is extended after the variations are taken into account. The difficulty of analyzing these nondeterministic properties makes the allocation scheme of redundant resource hardly work in a cost-efficient way. Besides fabrication variations, analog circuits are suffered from severe performance degradations owing to their physical attributes which are vulnerable to aging effects. As such, the post-silicon calibration approach gains increasing attentions to compensate the performance mismatch. For the user-end applications, additional system failures result from the pirated and counterfeited devices provided by the untrusted semiconductor supply chain. Again analog circuits show their weakness to this threat due to the shortage of piracy avoidance techniques. In this dissertation, we propose three adaptive integrated circuit designs to overcome these challenges respectively. The first one investigates the variability-aware gate implementation with the consideration of the overhead control of adaptivity assignment. This design improves the variation resilience typically for digital circuits while optimizing the power consumption and timing yield. The second design is implemented as a self-validation system for the calibration of diverse analog circuits. The system is completely integrated on chip to enhance the convenience without external assistance. In the last design, a classic analog component is further studied to establish the configurable locking mechanism for analog circuits. The use of Satisfiability Modulo Theories addresses the difficulty of searching the unique unlocking pattern of non-Boolean variables

Max Operation in Statistical Static Timing Analysis on the Non-Gaussian Variation Sources for VLSI Circuits

As CMOS technology continues to scale down, process variation introduces significant uncertainty in power and performance to VLSI circuits and significantly affects their reliability. If this uncertainty is not properly handled, it may become the bottleneck of CMOS technology improvement. As a result, deterministic analysis is no longer conservative and may result in either overestimation or underestimation of the circuit delay. As we know that Static-Timing Analysis (STA) is a deterministic way of computing the delay imposed by the circuits design and layout. It is based on a predetermined set of possible events of process variations, also called corners of the circuit. Although it is an excellent tool, current trends in process scaling have imposed significant difficulties to STA. Therefore, there is a need for another tool, which can resolve the aforementioned problems, and Statistical Static Timing Analysis (SSTA) has become the frontier research topic in recent years in combating such variation effects. There are two types of SSTA methods, path-based SSTA and block-based SSTA. The goal of SSTA is to parameterize timing characteristics of the timing graph as a function of the underlying sources of process parameters that are modeled as random variables. By performing SSTA, designers can obtain the timing distribution (yield) and its sensitivity to various process parameters. Such information is of tremendous value for both timing sign-off and design optimization for robustness and high profit margins. The block-based SSTA is the most efficient SSTA method in recent years. In block-based SSTA, there are two major atomic operations max and add. The add operation is simple; however, the max operation is much more complex. There are two main challenges in SSTA. The Topological Correlation that emerges from reconvergent paths, these are the ones that originate from a common node and then converge again at another node (reconvergent node). Such correlation complicates the maximum operation. The second challenge is the Spatial Correlation. It arises due to device proximity on the die and gives rise to the problems of modeling delay and arrival time. This dissertation presents statistical Nonlinear and Nonnormals canonical form of timing delay model considering process variation. This dissertation is focusing on four aspects: (1) Statistical timing modeling and analysis; (2) High level circuit synthesis with system level statistical static timing analysis; (3) Architectural implementations of the atomic operations (max and add); and (4) Design methodology. To perform statistical timing modeling and analysis, we first present an efficient and accurate statistical static timing analysis (SSTA) flow for non-linear cell delay model with non-Gaussian variation sources. To achieve system level SSTA we apply statistical timing analysis to high-level synthesis flow, and develop yield driven synthesis framework so that the impact of process variations is taken into account during high-level synthesis. To accomplish architectural implementation, we present the vector thread architecture for max operator to minimize delay and variation. Finally, we present comparison analysis with ISCAS benchmark circuits suites. In the last part of this dissertation, a SSTA design methodology is presented

A SIMD architecture for hard real-time systems

Emerging safety-critical systems require high-performance data-parallel architectures and, problematically, ones that can guarantee tight and safe worst-case execution times. Given the complexity of existing architectures like GPUs, it is unlikely that sufficiently accurate models and algorithms for timing analysis will emerge in the foreseeable future. This motivates a clean-slate approach to designing a real-time data-parallel architecture. In this work I present Sim-D: a wide-SIMD architecture for hard real-time systems. Similar to GPUs, Sim-D performs hardware strip-mining to schedule the work for a compute kernel in entities called work-groups. Sim-D schedules the work for each work-group as a sequence of uninterruptible access- and execute program phases, interleaving the phases of two work-groups. By providing performance isolation between the memory- and compute resources, the execution time of each phase can be tightly bound through static analysis. I present a predictable closed-page DRAM controller that processes requests for large 1D- and 2D blocks of data, as well as indirect indexed transfers. These large transfers coalesce the data requests of a whole work-group. For a linear 4KiB transfer over a 64-bit data bus, the utilisation provably exceeds 78% for DDR4-3200AA DRAM. For 2D blocks, a well-chosen tiling configuration can achieve near-similar efficiency. I show that bounds on the execution time of indexed transfers are pessimistic by nature, but propose a novel snoopy indexed transfer mechanism that permits more reasonable bounds when the buffer size is limited. Finally, I present a worst-case execution time calculation algorithm for Sim-D. This algorithm is paired with two hardware work-group scheduling policies that deterministically reduce run-time variance. The worst-case execution time analysis algorithm combines static control flow analysis with a simulation-based cost model for execution and DRAM transfers. Its key novelty is the addition of a stage that considers work-group scheduling effects. I show that the work-group scheduling policies degrade performance on average by 8.9%, but permit the calculation of worst-case execution time bounds that are tight within 14.3% on average for benchmarks that avoid inefficient indexed transfers

The Second Annual International Space University Alumni Conference

The papers presented at the conference reflect the multidisciplinary nature of the International Space University (ISU) and its alumni. The first papers presented hold special relevance to the design projects, and cover such topics as lunar-based astronomical instrumentation, solar lunar power generation, habitation on the moon, and the legal issues governing multinational astronauts conducting research in space. The next set of papers cover various technical issues such as project success assessment, satellite networks and space station dynamics, thus reflecting the diverse backgrounds of the ISU alumni

Magnetoencephalographic studies of neural systems associated with higher order processes in humans

This thesis has been concerned with the neuromagnetic fields associated with the processing of faces and sentences in humans. In four, largely independent sub-projects, results were obtained using novel methods of analysis to extract neurophysiologically relevant information from magnetoencephalographic MEG readings. Using the MEG facility of the Helsinki University of Technology, Finland, the research has led to four main suggestions: a) there are early latency face-specific neural systems in humans that are predominantly in right inferior occipito-temporal cortex, b) MEG recordings are useful in the study of autism, in that autistic subjects exhibit different responses to normal subjects following face presentation, c) phase-locked y-band activity has a specific role in semantic processing of sentences in normal subjects, and d) the late components of responses to face images are modified by endogenous priming, which is detectable before stimulus arrival in normal subjects. In order to pursue these neuroscience objectives, new methods for treating MEG data were developed, implemented and used. These comprise: a) an improved parameterisation of signal power over regions of interest, b) the use of re-sampling strategies to achieve statistical assessment of spectral coefficients within subjects, and c) a prestimulus method for the study of face processing using a tailored state-space representation approach