A synthesis of logic and bio-inspired techniques in the design of dependable systems

Much of the development of model-based design and dependability analysis in the design of dependable systems, including software intensive systems, can be attributed to the application of advances in formal logic and its application to fault forecasting and verification of systems. In parallel, work on bio-inspired technologies has shown potential for the evolutionary design of engineering systems via automated exploration of potentially large design spaces. We have not yet seen the emergence of a design paradigm that effectively combines these two techniques, schematically founded on the two pillars of formal logic and biology, from the early stages of, and throughout, the design lifecycle. Such a design paradigm would apply these techniques synergistically and systematically to enable optimal refinement of new designs which can be driven effectively by dependability requirements. The paper sketches such a model-centric paradigm for the design of dependable systems, presented in the scope of the HiP-HOPS tool and technique, that brings these technologies together to realise their combined potential benefits. The paper begins by identifying current challenges in model-based safety assessment and then overviews the use of meta-heuristics at various stages of the design lifecycle covering topics that span from allocation of dependability requirements, through dependability analysis, to multi-objective optimisation of system architectures and maintenance schedules

Testing microelectronic biofluidic systems

According to the 2005 International Technology Roadmap for Semiconductors, the integration of emerging nondigital CMOS technologies will require radically different test methods, posing a major challenge for designers and test engineers. One such technology is microelectronic fluidic (MEF) arrays, which have rapidly gained importance in many biological, pharmaceutical, and industrial applications. The advantages of these systems, such as operation speed, use of very small amounts of liquid, on-board droplet detection, signal conditioning, and vast digital signal processing, make them very promising. However, testable design of these devices in a mass-production environment is still in its infancy, hampering their low-cost introduction to the market. This article describes analog and digital MEF design and testing method

Development and evaluation of a fault-tolerant multiprocessor (FTMP) computer. Volume 4: FTMP executive summary

The FTMP architecture is a high reliability computer concept modeled after a homogeneous multiprocessor architecture. Elements of the FTMP are operated in tight synchronism with one another and hardware fault-detection and fault-masking is provided which is transparent to the software. Operating system design and user software design is thus greatly simplified. Performance of the FTMP is also comparable to that of a simplex equivalent due to the efficiency of fault handling hardware. The FTMP project constructed an engineering module of the FTMP, programmed the machine and extensively tested the architecture through fault injection and other stress testing. This testing confirmed the soundness of the FTMP concepts

Affordable techniques for dependable microprocessor design

As high computing power is available at an affordable cost, we rely on microprocessor-based systems for much greater variety of applications. This dependence indicates that a processor failure could have more diverse impacts on our daily lives. Therefore, dependability is becoming an increasingly important quality measure of microprocessors.;Temporary hardware malfunctions caused by unstable environmental conditions can lead the processor to an incorrect state. This is referred to as a transient error or soft error. Studies have shown that soft errors are the major source of system failures. This dissertation characterizes the soft error behavior on microprocessors and presents new microarchitectural approaches that can realize high dependability with low overhead.;Our fault injection studies using RISC processors have demonstrated that different functional blocks of the processor have distinct susceptibilities to soft errors. The error susceptibility information must be reflected in devising fault tolerance schemes for cost-sensitive applications. Considering the common use of on-chip caches in modern processors, we investigated area-efficient protection schemes for memory arrays. The idea of caching redundant information was exploited to optimize resource utilization for increased dependability. We also developed a mechanism to verify the integrity of data transfer from lower level memories to the primary caches. The results of this study show that by exploiting bus idle cycles and the information redundancy, an almost complete check for the initial memory data transfer is possible without incurring a performance penalty.;For protecting the processor\u27s control logic, which usually remains unprotected, we propose a low-cost reliability enhancement strategy. We classified control logic signals into static and dynamic control depending on their changeability, and applied various techniques including commit-time checking, signature caching, component-level duplication, and control flow monitoring. Our schemes can achieve more than 99% coverage with a very small hardware addition. Finally, a virtual duplex architecture for superscalar processors is presented. In this system-level approach, the processor pipeline is backed up by a partially replicated pipeline. The replication-based checker minimizes the design and verification overheads. For a large-scale superscalar processor, the proposed architecture can bring 61.4% reduction in die area while sustaining the maximum performance

Combined Time and Information Redundancy for SEU-Tolerance in Energy-Efficient Real-Time Systems

Recently the trade-off between energy consumption and fault-tolerance in real-time systems has been highlighted. These works have focused on dynamic voltage scaling (DVS) to reduce dynamic energy dissipation and on time redundancy to achieve transient-fault tolerance. While the time redundancy technique exploits the available slack time to increase the fault-tolerance by performing recovery executions, DVS exploits slack time to save energy. Therefore we believe there is a resource conflict between the time-redundancy technique and DVS. The first aim of this paper is to propose the usage of information redundancy to solve this problem. We demonstrate through analytical and experimental studies that it is possible to achieve both higher transient fault-tolerance (tolerance to single event upsets (SEU)) and less energy using a combination of information and time redundancy when compared with using time redundancy alone. The second aim of this paper is to analyze the interplay of transient-fault tolerance (SEU-tolerance) and adaptive body biasing (ABB) used to reduce static leakage energy, which has not been addressed in previous studies. We show that the same technique (i.e. the combination of time and information redundancy) is applicable to ABB-enabled systems and provides more advantages than time redundancy alone