44,187 research outputs found

    A design for testability study on a high performance automatic gain control circuit.

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    A comprehensive testability study on a commercial automatic gain control circuit is presented which aims to identify design for testability (DfT) modifications to both reduce production test cost and improve test quality. A fault simulation strategy based on layout extracted faults has been used to support the study. The paper proposes a number of DfT modifications at the layout, schematic and system levels together with testability. Guidelines that may well have generic applicability. Proposals for using the modifications to achieve partial self test are made and estimates of achieved fault coverage and quality levels presente

    MISSED: an environment for mixed-signal microsystem testing and diagnosis

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    A tight link between design and test data is proposed for speeding up test-pattern generation and diagnosis during mixed-signal prototype verification. Test requirements are already incorporated at the behavioral level and specified with increased detail at lower hierarchical levels. A strict distinction between generic routines and implementation data makes reuse of software possible. A testability-analysis tool and test and DFT libraries support the designer to guarantee testability. Hierarchical backtrace procedures in combination with an expert system and fault libraries assist the designer during mixed-signal chip debuggin

    Dependable Digitally-Assisted Mixed-Signal IPs Based on Integrated Self-Test & Self-Calibration

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    Heterogeneous SoC devices, including sensors, analogue and mixed-signal front-end circuits and the availability of massive digital processing capability, are being increasingly used in safety-critical applications like in the automotive, medical, and the security arena. Already a significant amount of attention has been paid in literature with respect to the dependability of the digital parts in heterogeneous SoCs. This is in contrast to especially the sensors and front-end mixed-signal electronics; these are however particular sensitive to external influences over time and hence determining their dependability. This paper provides an integrated SoC/IP approach to enhance the dependability. It will give an example of a digitally-assisted mixed-signal front-end IP which is being evaluated under its mission profile of an automotive tyre pressure monitoring system. It will be shown how internal monitoring and digitally-controlled adaptation by using embedded processors can help in terms of improving the dependability of this mixed-signal part under harsh conditions for a long time

    A VHDL-AMS Simulation Environment for an UWB Impulse Radio Transceiver

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    Ultra-Wide-Band (UWB) communication based on the impulse radio paradigm is becoming increasingly popular. According to the IEEE 802.15 WPAN Low Rate Alternative PHY Task Group 4a, UWB will play a major role in localization applications, due to the high time resolution of UWB signals which allow accurate indirect measurements of distance between transceivers. Key for the successful implementation of UWB transceivers is the level of integration that will be reached, for which a simulation environment that helps take appropriate design decisions is crucial. Owing to this motivation, in this paper we propose a multiresolution UWB simulation environment based on the VHDL-AMS hardware description language, along with a proper methodology which helps tackle the complexity of designing a mixed-signal UWB System-on-Chip. We applied the methodology and used the simulation environment for the specification and design of an UWB transceiver based on the energy detection principle. As a by-product, simulation results show the effectiveness of UWB in the so-called ranging application, that is the accurate evaluation of the distance between a couple of transceivers using the two-way-ranging metho

    Development of generic testing strategies for mixed-signal integrated circuits

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    Describes work at the Polytechnic of Huddersfield SERC/DTI research project IED 2/1/2121 conducted in collaboration with GEC-Plessey Semiconductors, Wolfson Microelectronics, and UMIST. The aim of the work is to develop generic testing strategies for mixed-signal (mixed analogue and digital) integrated circuits. The paper proposes a test structure for mixed-signal ICs, and details the development of a test technique and fault model for the analogue circuit cells encountered in these devices. Results obtained during the evaluation of this technique in simulation are presented, and the ECAD facilities that have contributed to this and other such projects are described

    A mixed-signal integrated circuit for FM-DCSK modulation

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    This paper presents a mixed-signal application-specific integrated circuit (ASIC) for a frequency-modulated differential chaos shift keying (FM-DCSK) communication system. The chip is conceived to serve as an experimental platform for the evaluation of the FM-DCSK modulation scheme, and includes several programming features toward this goal. The operation of the ASIC is herein illustrated for a data rate of 500 kb/s and a transmission bandwidth in the range of 17 MHz. Using signals acquired from the test platform, bit error rate (BER) estimations of the overall FM-DCSK communication link have been obtained assuming wireless transmission at the 2.4-GHz ISM band. Under all tested propagation conditions, including multipath effects, the system obtains a BER = 10-3 for Eb/No lower than 28 dB.Ministerio de Ciencia y Tecnología TIC2003-0235

    Dependable reconfigurable multi-sensor poles for security

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    Wireless sensor network poles for security monitoring under harsh environments require a very high dependability as they are safety-critical [1]. An example of a multi-sensor pole is shown. Crucial attribute in these systems for security, especially in harsh environment, is a high robustness and guaranteed availability during lifetime. This environment could include molest. In this paper, two approaches are used which are applied simultaneously but are developed in different projects. \u

    Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level

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    In recent technology nodes, reliability is considered a part of the standard design ¿ow at all levels of embedded system design. While techniques that use only low-level models at gate- and register transfer-level offer high accuracy, they are too inefficient to consider the overall application of the embedded system. Multi-level models with high abstraction are essential to efficiently evaluate the impact of physical defects on the system. This paper provides a methodology that leverages state-of-the-art techniques for efficient fault simulation of structural faults together with transaction-level modeling. This way it is possible to accurately evaluate the impact of the faults on the entire hardware/software system. A case study of a system consisting of hardware and software for image compression and data encryption is presented and the method is compared to a standard gate/RT mixed-level approac
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