Moving forward with combinatorial interaction testing

Combinatorial interaction testing (CIT) is an efficient and effective method of detecting failures that are caused by the interactions of various system input parameters. In this paper, we discuss CIT, point out some of the difficulties of applying it in practice, and highlight some recent advances that have improved CIT’s applicability to modern systems. We also provide a roadmap for future research and directions; one that we hope will lead to new CIT research and to higher quality testing of industrial systems

Fault-tolerant computer study

A set of building block circuits is described which can be used with commercially available microprocessors and memories to implement fault tolerant distributed computer systems. Each building block circuit is intended for VLSI implementation as a single chip. Several building blocks and associated processor and memory chips form a self checking computer module with self contained input output and interfaces to redundant communications buses. Fault tolerance is achieved by connecting self checking computer modules into a redundant network in which backup buses and computer modules are provided to circumvent failures. The requirements and design methodology which led to the definition of the building block circuits are discussed

The "MIND" Scalable PIM Architecture

MIND (Memory, Intelligence, and Network Device) is an advanced parallel computer architecture for high performance computing and scalable embedded processing. It is a Processor-in-Memory (PIM) architecture integrating both DRAM bit cells and CMOS logic devices on the same silicon die. MIND is multicore with multiple memory/processor nodes on each chip and supports global shared memory across systems of MIND components. MIND is distinguished from other PIM architectures in that it incorporates mechanisms for efficient support of a global parallel execution model based on the semantics of message-driven multithreaded split-transaction processing. MIND is designed to operate either in conjunction with other conventional microprocessors or in standalone arrays of like devices. It also incorporates mechanisms for fault tolerance, real time execution, and active power management. This paper describes the major elements and operational methods of the MIND architecture

High-Level Analysis of the Impact of Soft-Faults in Cyberphysical Systems

As digital systems grow in complexity and are used in a broader variety of safety-critical applications, there is an ever-increasing demand for assessing the dependability and safety of such systems, especially when subjected to hazardous environments. As a result, it is important to identify and correct any functional abnormalities and component faults as early as possible in order to minimize performance degradation and to avoid potential perilous situations. Existing techniques often lack the capacity to perform a comprehensive and exhaustive analysis on complex redundant architectures, leading to less than optimal risk evaluation. Hence, an early analysis of dependability of such safety-critical applications enables designers to develop systems that meets high dependability requirements. Existing techniques in the field often lack the capacity to perform full system analyses due to state-explosion limitations (such as transistor and gate-level analyses), or due to the time and monetary costs attached to them (such as simulation, emulation, and physical testing). In this work we develop a system-level methodology to model and analyze the effects of Single Event Upsets (SEUs) in cyberphysical system designs. The proposed methodology investigates the impacts of SEUs in the entire system model (fault tree level), including SEU propagation paths, logical masking of errors, vulnerability to specific events, and critical nodes. The methodology also provides insights on a system's weaknesses, such as the impact of each component to the system's vulnerability, as well as hidden sources of failure, such as latent faults. Moreover, the proposed methodology is able to identify and categorize the system's components in order of criticality, and to evaluate different approaches to the mitigation of such criticality (in the form of different configurations of TMR) in order to obtain the most efficient mitigation solution available. The proposed methodology is also able to model and analyze system components individually (system component level), in order to more accurately estimate the component's vulnerability to SEUs. In this case, a more refined analysis of the component is conducted, which enables us to identify the source of the component's criticality. Thereafter, a second mitigation mechanic (internal to the component) takes place, in order to evaluate the gains and costs of applying different configurations of TMR to the component internally. Finally, our approach will draw a comparison between the results obtained at both levels of analysis in order to evaluate the most efficient way of improving the targeted system design

Techniques for the realization of ultra- reliable spaceborne computer Final report

Bibliography and new techniques for use of error correction and redundancy to improve reliability of spaceborne computer

Reliability and fault tolerance modelling of multiprocessor systems

This thesis was submitted for the degree of Doctor of Philosophy and awarded by Brunel University.Reliability evaluation by analytic modelling constitute an important issue of designing a reliable multiprocessor system. In this thesis, a model for reliability and fault tolerance analysis of the interconnection network is presented, based on graph theory. Reliability and fault tolerance are considered as deterministic and probabilistic measures of connectivity. Exact techniques for reliability evaluation fail for large multiprocessor systems because of the enormous computational resources required. Therefore, approximation techniques have to be used. Three approaches are proposed, the first by simplifying the symbolic expression of reliability; the other two by applying a hierarchical decomposition to the system. All these methods give results close to those obtained by exact techniques.Consejo Nacional de Ciencia y Tecnologia" (National Council for Science and Technology of Mexico) and "Instituto de Investigaciones Electricas" (Institute for Electrical Research

Autonomous flight and remote site landing guidance research for helicopters

Automated low-altitude flight and landing in remote areas within a civilian environment are investigated, where initial cost, ongoing maintenance costs, and system productivity are important considerations. An approach has been taken which has: (1) utilized those technologies developed for military applications which are directly transferable to a civilian mission; (2) exploited and developed technology areas where new methods or concepts are required; and (3) undertaken research with the potential to lead to innovative methods or concepts required to achieve a manual and fully automatic remote area low-altitude and landing capability. The project has resulted in a definition of system operational concept that includes a sensor subsystem, a sensor fusion/feature extraction capability, and a guidance and control law concept. These subsystem concepts have been developed to sufficient depth to enable further exploration within the NASA simulation environment, and to support programs leading to the flight test

Geologic and mineral and water resources investigations in western Colorado, using Skylab EREP data

The author has identified the following significant results. Skylab photographs are superior to ERTS images for photogeologic interpretation, primarily because of improved resolution. Lithologic contacts can be detected consistently better on Skylab S190A photos than on ERTS images. Color photos are best; red and green band photos are somewhat better than color-infrared photos; infrared band photos are worst. All major geologic structures can be recognized on Skylab imagery. Large folds, even those with very gentle flexures, can be mapped accurately and with confidence. Bedding attitudes of only a few degrees are recognized; vertical exaggeration factor is about 2.5X. Mineral deposits in central Colorado may be indicated on Skylab photos by lineaments and color anomalies, but positive identification of these features is not possible. S190A stereo color photography is adequate for defining drainage divides that in turn define the boundaries and distribution of ground water recharge and discharge areas within a basin

Cross layer reliability estimation for digital systems

Forthcoming manufacturing technologies hold the promise to increase multifuctional computing systems performance and functionality thanks to a remarkable growth of the device integration density. Despite the benefits introduced by this technology improvements, reliability is becoming a key challenge for the semiconductor industry. With transistor size reaching the atomic dimensions, vulnerability to unavoidable fluctuations in the manufacturing process and environmental stress rise dramatically. Failing to meet a reliability requirement may add excessive re-design cost to recover and may have severe consequences on the success of a product. %Worst-case design with large margins to guarantee reliable operation has been employed for long time. However, it is reaching a limit that makes it economically unsustainable due to its performance, area, and power cost. One of the open challenges for future technologies is building ``dependable'' systems on top of unreliable components, which will degrade and even fail during normal lifetime of the chip. Conventional design techniques are highly inefficient. They expend significant amount of energy to tolerate the device unpredictability by adding safety margins to a circuit's operating voltage, clock frequency or charge stored per bit. Unfortunately, the additional cost introduced to compensate unreliability are rapidly becoming unacceptable in today's environment where power consumption is often the limiting factor for integrated circuit performance, and energy efficiency is a top concern. Attention should be payed to tailor techniques to improve the reliability of a system on the basis of its requirements, ending up with cost-effective solutions favoring the success of the product on the market. Cross-layer reliability is one of the most promising approaches to achieve this goal. Cross-layer reliability techniques take into account the interactions between the layers composing a complex system (i.e., technology, hardware and software layers) to implement efficient cross-layer fault mitigation mechanisms. Fault tolerance mechanism are carefully implemented at different layers starting from the technology up to the software layer to carefully optimize the system by exploiting the inner capability of each layer to mask lower level faults. For this purpose, cross-layer reliability design techniques need to be complemented with cross-layer reliability evaluation tools, able to precisely assess the reliability level of a selected design early in the design cycle. Accurate and early reliability estimates would enable the exploration of the system design space and the optimization of multiple constraints such as performance, power consumption, cost and reliability. This Ph.D. thesis is devoted to the development of new methodologies and tools to evaluate and optimize the reliability of complex digital systems during the early design stages. More specifically, techniques addressing hardware accelerators (i.e., FPGAs and GPUs), microprocessors and full systems are discussed. All developed methodologies are presented in conjunction with their application to real-world use cases belonging to different computational domains