Overview of Hydra: a concurrent language for synchronous digital circuit design

Hydra is a computer hardware description language that integrates several kinds of software tool (simulation, netlist generation and timing analysis) within a single circuit specification. The design language is inherently concurrent, and it offers black box abstraction and general design patterns that simplify the design of circuits with regular structure. Hydra specifications are concise, allowing the complete design of a computer system as a digital circuit within a few pages. This paper discusses the motivations behind Hydra, and illustrates the system with a significant portion of the design of a basic RISC processor

LOT: Logic Optimization with Testability - new transformations for logic synthesis

A new approach to optimize multilevel logic circuits is introduced. Given a multilevel circuit, the synthesis method optimizes its area while simultaneously enhancing its random pattern testability. The method is based on structural transformations at the gate level. New transformations involving EX-OR gates as well as Reed–Muller expansions have been introduced in the synthesis of multilevel circuits. This method is augmented with transformations that specifically enhance random-pattern testability while reducing the area. Testability enhancement is an integral part of our synthesis methodology. Experimental results show that the proposed methodology not only can achieve lower area than other similar tools, but that it achieves better testability compared to available testability enhancement tools such as tstfx. Specifically for ISCAS-85 benchmark circuits, it was observed that EX-OR gate-based transformations successfully contributed toward generating smaller circuits compared to other state-of-the-art logic optimization tools

Boolean Satisfiability in Electronic Design Automation

Boolean Satisfiability (SAT) is often used as the underlying model for a significant and increasing number of applications in Electronic Design Automation (EDA) as well as in many other fields of Computer Science and Engineering. In recent years, new and efficient algorithms for SAT have been developed, allowing much larger problem instances to be solved. SAT “packages” are currently expected to have an impact on EDA applications similar to that of BDD packages since their introduction more than a decade ago. This tutorial paper is aimed at introducing the EDA professional to the Boolean satisfiability problem. Specifically, we highlight the use of SAT models to formulate a number of EDA problems in such diverse areas as test pattern generation, circuit delay computation, logic optimization, combinational equivalence checking, bounded model checking and functional test vector generation, among others. In addition, we provide an overview of the algorithmic techniques commonly used for solving SAT, including those that have seen widespread use in specific EDA applications. We categorize these algorithmic techniques, indicating which have been shown to be best suited for which tasks

Synchronous Digital Circuits as Functional Programs

Functional programming techniques have been used to describe synchronous digital circuits since the early 1980s and have proven successful at describing certain types of designs. Here we survey the systems and formal underpinnings that constitute this tradition. We situate these techniques with respect to other formal methods for hardware design and discuss the work yet to be done

Fault Testing for Reversible Circuits

Applications of reversible circuits can be found in the fields of low-power computation, cryptography, communications, digital signal processing, and the emerging field of quantum computation. Furthermore, prototype circuits for low-power applications are already being fabricated in CMOS. Regardless of the eventual technology adopted, testing is sure to be an important component in any robust implementation. We consider the test set generation problem. Reversibility affects the testing problem in fundamental ways, making it significantly simpler than for the irreversible case. For example, we show that any test set that detects all single stuck-at faults in a reversible circuit also detects all multiple stuck-at faults. We present efficient test set constructions for the standard stuck-at fault model as well as the usually intractable cell-fault model. We also give a practical test set generation algorithm, based on an integer linear programming formulation, that yields test sets approximately half the size of those produced by conventional ATPG.Comment: 30 pages, 8 figures. to appear in IEEE Trans. on CA

Verification of integer multipliers on the arithmetic bit level

One of the most severe short-comings of currently available equivalence checkers is their inability to verify integer multipliers. In this paper, we present a bit level reverse-engineering technique that can be integrated into standard equivalence checking flows. We propose a Boolean mapping algorithm that extracts a network of half adders from the gate netlist of an addition circuit. Once the arithmetic bit level representation of the circuit is obtained, equivalence checking can be performed using simple arithmetic operations. Experimental results show the promise of our approach

A Design Approach for Soft Errors Protection in Real-Time Systems

This paper proposes the use of metrics to refine system design for soft errors protection in system on chip architectures. Specifically this research shows the use of metrics in design space exploration that highlight where in the structure of the model and at what point in the behaviour, protection is needed against soft errors. As these metrics improve the ability of the system to provide functionality, they are referred to here as reliability metrics. Previous approaches to prevent soft errors focused on recovery after detection. Almost no research has been directed towards preventive measures. But in real-time systems, deadlines are performance requirements that absolutely must be met and a missed deadline constitutes an erroneous action and a possible system failure. This paper focuses on a preventive approach as a solution rather than recovery after detection. The intention of this research is to prevent serious loss of system functionality or system failure though it may not be able to eliminate the impact of soft errors completely

EFFICIENCY TEST OF AUTOMATIC TEST PATTERN GENERATION METHODS

Automatic Test Pattern Generation (ATPG) is unavoidable for large combinational circuits, However, since ATPG is a known NP-complet problem, this is a very CPU-time consuming process, Therefore choosing the optimal ATPG algorithm for an industrial test generation system can be an important question, However, this question cannot be easily answered because of the implementational and evaluation differences of the published algorithms, This paper presents a software frame, where any ATPG method and their heuristic can be easily implemented allowing a correct comparison between different methods, On the other hand the known ATPG methods cannot be ordered by quality, because their efficiency depends on the properties of the examined circuit. Therefore it seems to be reasonable to develop a hibrid strategy whose effectivity is independent of the circuit properties and near to the known strategies, The presented frame is an ideal environment for developing such a new method, Experimental results are also presented on some implemented algorithms and heuristics using a variety of MSI components and ISCAS'85 benchmark circuits

An embedded language framework for hardware compilation

Various languages have been proposed to describe synchronous hardware at an abstract, yet synthesisable level. We propose a uniform framework within which such languages can be developed, and combined together for simulation, synthesis, and verification. We do this by embedding the languages in Lava — a hardware description language (HDL), itself embedded in the functional programming language Haskell. The approach allows us to easily experiment with new formal languages and language features, and also provides easy access to formal verification tools aiding program verification.peer-reviewe